Browsing Articles by imec author "13dcefe5013b4ca8662463b7feca3642af9ed6c9"
Now showing items 1-20 of 56
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A comprehensive model for the electrical nanocontact on germanium for scanning spreading resistance microscopy applications
Schulze, Andreas; Verhulst, Anne; Nazir, Aftab; Hantschel, Thomas; Eyben, Pierre; Vandervorst, Wilfried (2013) -
A reliable metric for mobility extraction of short channel MOSFETs
Severi, Simone; Pantisano, Luigi; Augendre, Emmanuel; San Andres Serrano, Enrique; Eyben, Pierre; De Meyer, Kristin (2007) -
Accurate carrier profiling of n-type GaAs junctions
Clarysse, Trudo; Brammertz, Guy; Vanhaeren, Danielle; Eyben, Pierre; Goossens, Jozefien; Clemente, Francesca; Meuris, Marc; Vandervorst, Wilfried; Srnanek, Rudolf; Kinder, Rudolf; Sciana, B.; Radziewicz, D.; Li, Zhiqiang (2008) -
Accurate prediction of device performance based on 2-D carrier profiles in the presence of extensive mobile carrier diffusion
Nazir, Aftab; Spessot, Alessio; Eyben, Pierre; Clarysse, Trudo; Ritzenthaler, Romain; Schram, Tom; Vandervorst, Wilfried (2014) -
Advanced carrier depth profiling on Si and Ge with micro four-point probe
Clarysse, Trudo; Eyben, Pierre; Parmentier, Brigitte; Van Daele, Benny; Satta, Alessandra; Vandervorst, Wilfried; Lin, Rong; Petersen, Dirch H.; Folmer Nielsen, Peter (2008) -
Analysis and modeling of the high vacuum scanning spreading resistance microscopy nanocontact on silicon
Eyben, Pierre; Clemente, Francesca; Vanstreels, Kris; Pourtois, Geoffrey; Sankaran, Kiroubanand; Clarysse, Trudo; Mody, Jay; Duriau, Edouard; Hantschel, Thomas; Vandervorst, Wilfried; Mylvaganam, Kausala; Zhang, Liangchi (2010) -
Analysis of the two-dimensional-dopant profile in a 90 nm complementary metal-oxide-semiconductor technology using scanning spreading resistance microscopy
Eyben, Pierre; Alvarez, David; Jurczak, Gosia; Rooyackers, Rita; De Keersgieter, An; Augendre, Emmanuel; Vandervorst, Wilfried (2004-01) -
Assessing the performance of two-dimensional dopant profiling techniques
Duhayon, Natasja; Eyben, Pierre; Fouchier, Marc; Clarysse, Trudo; Vandervorst, Wilfried; Álvarez, D.; Schoemann, S.; Ciappa, M.; Stangoni, M.; Fichtner, W.; Formanek, P.; Kittler, M.; Raineri, V.; Giannazzo, F.; Goghero, D.; Rosenwaks, Y.; Shikler, R.; Saraf, S.; Sadewasser, S.; Barreau, N.; Glatzel, T.; Verheijen, M.; Mentink, S.A.M.; von Sprekelsen, M.; Maltezopoulos, T.; Wiesendanger, R.; Hellemans, L. (2004) -
Bias-induced junction displacements in scanning spreading resistance microscopy and scanning capacitance microscopy
Eyben, Pierre; Duhayon, Natasja; Clarysse, Trudo; Vandervorst, Wilfried (2003) -
Carrier spilling revisited: on-bevel junction behavior of different electrical depth profiling techniques
Clarysse, Trudo; Eyben, Pierre; Duhayon, Natasja; Xu, Mingwei; Vandervorst, Wilfried (2003) -
Conductive diamond tips with sub-nanometer electrical resolution for characterization of nanoelectronics device structures
Hantschel, Thomas; Demeulemeester, Cindy; Eyben, Pierre; Schulz, Volker; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried (2009) -
Detailed study of scanning capacitance microscopy on cross- sectional and beveled junctions
Duhayon, Natasja; Clarysse, Trudo; Eyben, Pierre; Vandervorst, Wilfried; Hellemans, L. (2002) -
Development and optimization of scanning spreading resistance microscopy for measuring the two-dimensional carrier profile in solar cell structures
Eyben, Pierre; Seidel, Felix; Hantschel, Thomas; Schulze, Andreas; Lorenz, Anne; Uruena De Castro, Angel; Van Gestel, Dries; John, Joachim; Horzel, Jörg; Vandervorst, Wilfried (2011) -
Diameter-dependent boron diffusion in silicon nanowire-based transistors
Schulze, Andreas; Florakis, Antonios; Hantschel, Thomas; Eyben, Pierre; Verhulst, Anne; Rooyackers, Rita; Vandooren, Anne; Vandervorst, Wilfried (2013) -
Diamond tips for automated electrical probing inside a scanning electron microscopy system
Hantschel, Thomas; Arstila, Kai; Olantera, Lauri; Schulze, Andreas; Werner, Thilo; Eyben, Pierre; Clarysse, Trudo; Vandervorst, Wilfried (2011) -
Dopant/carrier profiling for 3D-structures
Vandervorst, Wilfried; Schulze, Andreas; Kambham, Ajay Kumar; Mody, Jay; Gilbert, Matthieu; Eyben, Pierre (2014) -
Electrical properties of amino SAM layers studied with conductive AFM
Chintala, Ravi Chandra; Eyben, Pierre; Armini, Silvia; Maestre Caro, Arantxa; Loyo Prado, Jana; Sun, Yiting; Vandervorst, Wilfried (2013) -
Electrical tomography using atomic force microscopy and its application towards carbon nanotube-based interconnects
Schulze, Andreas; Hantschel, Thomas; Dathe, Andre; Eyben, Pierre; Ke, Xiaoxing; Vandervorst, Wilfried (2012-07) -
Evaluation of the junction delineation accuracy and reproducibility with the SSRM technique
Eyben, Pierre; Vanhaeren, Danielle; Janssens, Tom; Hantschel, Thomas; Vandervorst, Wilfried; Adachi, Kanna; Ishimaru, Kazunari (2007) -
Evolution of metastable phases in silicon during nanoindentation: mechanism analysis and experimental verification
Mylvaganam, Kausala; Zhang, Liangchi; Eyben, Pierre; Mody, Jay; Vandervorst, Wilfried (2009)