Browsing Articles by imec author "fd3930f7eb72d06dd561a45f72c18b5e5b997c0c"
Now showing items 1-20 of 150
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A 2-D analytical threshold voltage model for fully-depleted SOI MOSFETs with halos or pockets
van Meer, Hans; De Meyer, Kristin (2001) -
A fast and accurate method to study the impact of interface traps on germanium MOS performance
Hellings, Geert; Eneman, Geert; Mitard, Jerome; Martens, Koen; Wang, Wei-E; Hoffmann, Thomas Y.; Meuris, Marc; De Meyer, Kristin (2011) -
A functional 41-stage ring oscillator using scaled FinFET devices with 25nm gate lengths and 10nm Fin widths applicable for the 45nm CMOS node
Collaert, Nadine; Dixit, Abhisek; Goodwin, Michael; Kottantharayil, Anil; Rooyackers, Rita; Degroote, Bart; Leunissen, Peter; Veloso, Anabela; Jonckheere, Rik; De Meyer, Kristin; Jurczak, Gosia; Biesemans, Serge (2004-08) -
A model determining optimal doping concentration and material's band gap of tunnel field-effect transistors
Vandenberghe, William; Verhulst, Anne; Kao, Frank; De Meyer, Kristin; Soree, Bart; Magnus, Wim; Groeseneken, Guido (2012) -
A model for tunneling current in multi-layer tunnel dielectrics
Govoreanu, Bogdan; Blomme, Pieter; Rosmeulen, Maarten; Van Houdt, Jan; De Meyer, Kristin (2003) -
A new finite-element discretization technique for the hydrodynamic formulation of energy balance equations
Vankemmel, Rudi; Schoenmaker, Wim; De Meyer, Kristin (1994) -
A new quality metric for III-V/high-k MOS gate stacks based on the frequency dispersion of accumulation capacitance and the CET
Vais, Abhitosh; Franco, Jacopo; Martens, Koen; Lin, Dennis; Sioncke, Sonja; Putcha, Vamsi; Nyns, Laura; Maes, Jan; Xie, Qi; Givens, Michael; Tang, Fu; Jiang, Xiaoqiang; Mocuta, Anda; Collaert, Nadine; Thean, Aaron; De Meyer, Kristin (2017) -
A novel trapping/detrapping model for defect profiling in high-k materials using the two-pulse capacitance-voltage technique
Ruiz Aguado, Daniel; Govoreanu, Bogdan; Zhang, W.D.; Jurczak, Gosia; De Meyer, Kristin; Van Houdt, Jan (2010) -
A reliable metric for mobility extraction of short channel MOSFETs
Severi, Simone; Pantisano, Luigi; Augendre, Emmanuel; San Andres Serrano, Enrique; Eyben, Pierre; De Meyer, Kristin (2007) -
A simplified method for (circular) transmission line model simulation and ultralow contact resistivity extraction
Yu, Hao; Schaekers, Marc; Schram, Tom; Collaert, Nadine; De Meyer, Kristin; Horiguchi, Naoto; Thean, Aaron; Barla, Kathy (2014) -
A snapshot review on metal-semiconductor contact exploration for 7-nm CMOS technology and beyond
Yu, Hao; Schaekers, Marc; Everaert, Jean-Luc; Horiguchi, Naoto; De Meyer, Kristin; Collaert, Nadine (2022-11-21) -
A successful selective epitaxial Si1-xGex deposition process for HBT-BiCMOS and high-mobility heterojunction pMOS applications
Loo, Roger; Caymax, Matty; Peytier, Ivan; Decoutere, Stefaan; Collaert, Nadine; Verheyen, Peter; Vandervorst, Wilfried; De Meyer, Kristin (2004) -
Ammonium sulfide vapor passivation of In0.53Ga0.47As and InP surfaces
Alian, AliReza; Brammertz, Guy; Merckling, Clement; Firrincieli, Andrea; Wang, Wei-E; Lin, Dennis; Caymax, Matty; Meuris, Marc; De Meyer, Kristin; Heyns, Marc (2011) -
Amorphous-crystalline phase transitions in chalcogenide materials for memory applications
Gille, Thomas; De Meyer, Kristin; Wouters, Dirk (2008) -
An analytical model of MOS admittance for border trap density extraction in high-k dielectrics of III-V MOS devices
Vais, Abhitosh; Martens, Koen; Lin, Dennis; Mocuta, Anda; Collaert, Nadine; Thean, Aaron; De Meyer, Kristin (2016) -
An effective model for analysing tunneling gate leakage currents through ultrathin oxides and high-k gate stacks from Si inversion layers
Govoreanu, Bogdan; Blomme, Pieter; Henson, Kirklen; Van Houdt, Jan; De Meyer, Kristin (2004) -
Analysis of leakage currents and impact on off-state power consumption for CMOS technology in the 100-nm regime
Henson, Kirklen; Yang, N.; Kubicek, Stefan; Vogel, E. M.; Wortman, J.; De Meyer, Kristin; Naem, Abdalla (2000) -
Analysis of the parasitic S/D resistance in multiple-gate FETs
Dixit, Abhisek; Kottantharayil, Anil; Collaert, Nadine; Goodwin, Michael; Jurczak, Gosia; De Meyer, Kristin (2005) -
Analytical calculation of subthreshold slope increase in short-channel MOSFET's by taking drift component into account
Biesemans, Serge; De Meyer, Kristin (1995) -
Arsenic junction thermal stability and high-dose boron-pocket activation during SPER in nMOS transistors
Severi, Simone; Pawlak, Bartek; Duffy, Ray; Augendre, Emmanuel; Henson, Kirklen; Lindsay, Richard; De Meyer, Kristin (2007)