Browsing Articles by title

X-band brick wall antenna fed by CPW

Soliman, Ezzeldin; Brebels, Steven; Vandenbosch, G.; Beyne, Eric (1998)

X-ray absorption in pillar shaped transmission electron microscopy specimens

Bender, Hugo; Seidel, Felix; Favia, Paola; Richard, Olivier; Vandervorst, Wilfried (2017)

X-ray absorption near edge structure and extended X-ray absorption fine structure of P-doped(111) diamond

Shikata, Shinichi; Yamaguchi, Koji; Fujiwara, Akihiko; Tamenori, Yusuke; Tsuruta, Kazuki; Yamada, Takatoshi; Nicley, Shannon; Haenen, Ken; Koizumi, Satoshi (2020)

X-Ray and proton radiation effects on 40 nm CMOS physically unclonable function devices

Wang, Pengfei; Zhang, Enxia; Chuang, Kent; Liao, Wenjun; Gong, Huiqi; Wang, Pan; Arutt, Charles N; Ni, Kai; McCurdy, Mike; Verbauwhede, Ingrid; Bury, Erik; Linten, Dimitri; Fleetwood, Daniel; Schrimpf, Ron; Reed, Robert (2018)

X-ray detector-on-plastic with high sensitivity using low cost, solution-processed organic photodiodes

Gelinck, Gerwin; Kumar, Abhishek; Moet, Date; van der Steen, Jan-Laurens; Van Breemen, Albert; Shanmugam, Santosh; Langen, Arjan; Gilot, Jan; Groen, Pim; Andriessen, Ronn; Simon, Matthias; Ruetten, Walter; Douglas, Alexander; Raaijmakers, Rob; Malinowski, Pawel; Myny, Kris (2016)

X-ray imager using solution processed organic transistor arrays and bulk heterojunction photodiodes on thin, flexible plastic substrate

Gelinck, Gerwin; Kumar, Abhishek; Moet, Date; van der Steen, Jan-Laurens; Shafique, Umar; Malinowski, Pawel; Myny, Kris; Rand, Barry; Simon, Matthias; Ruetten, Walter; Douglas, Alexander; Jorritsma, Jorrit; Heremans, Paul; Andriessen, Ronn (2013)

X-ray induced fragmentation of fulminic acid, HCNO

Gerlach, Marius; Schaffner, Dorothee; Preitschopf, Tobias; Karaev, Emil; Bozek, John; Holzmeier, Fabian; Fischer, Ingo (2023)

X-ray irradiation effect on the reliability of ultra-thin gate oxides and oxynitrides

Houssa, Michel; De Gendt, Stefan; de Bokx, P.; Mertens, Paul; Heyns, Marc (1999)

X-ray phase contrast simulation for grating-based interferometry using GATE

Sanctorum, Jonathan; De Beenhouwer, Jan; Sijbers, Jan (2020)

X-ray photoelectron diffraction study of thin Al2O3 films grown on Si(111) by molecular beam epitaxy

El-Kazzi, Mario; Grenet, Genevieve; Merckling, Clement; Saint-Girons, Guillaume; Botella, Claude; Marty, Olivier; Hollinger, Guy (2009)

X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry study of the role of Ti and TiN caps on the cobalt/SiO2 interface

Conard, Thierry; Kondoh, Eiichi; De Witte, Hilde; Maex, Karen; Vandervorst, Wilfried (1999)

X-ray photoelectron spectroscopy characterisation of high-k dielectric Al2O3 and HfO2 layers deposited on SiO2/Si surface

Vitchev, R.G.; Pireaux, J.J.; Conard, Thierry; Bender, Hugo; Wolstenholme, J.; Defranoux, C. (2004)

X-ray studies of group III-nitride quantum wells with high quality interfaces

Jacobs, Koen; Moerman, Ingrid (2000)

X-ray tomographic micro-particle velocimetry in porous media

Bultreys, T.; Van Offenwert, S.; Goethals, W.; Boone, M. N.; Cnudde, V.; Aelterman, Jan (2022)

X-valley influence on hot free electron absorption and optical nonlinearities at 10.6μm in highly doped n-GaAs

Shkerdin, G.; Stiens, J.; Vounckx, Roger (2002)

XPS Al K-a and high energy x-ray photoelectron spectroscopy (HAXPES) Cr K-a measurement of bulk boron

Zborowski, Charlotte; Vanleenhove, Anja; Hoflijk, Ilse; Vaesen, Inge; Artyushkova, K.; Conard, Thierry (2023)

XPS and TOFSIMS studies of shallow Si/Si1-xGex/Si layers

Conard, Thierry; De Witte, Hilde; Loo, Roger; Verheyden, P.; Vandervorst, Wilfried; Caymax, Matty; Gijbels, Renaat (1999)

XPS fast depth profile of the native oxide layers on AISI 304, 316 and 430 commercial stainless steels and their evolution with time

Detriche, S.; Vivegnis, Sabastien; Vanhumbeeck, J.-F.; Felten, A.; Louette, P.; Renner, Frank; Delhalle, J.; Mekhalif, Z. (2020)

XRD investigation of the crystalline quality of Sn-doped β-Ga2O3 films deposited by the RF magnetron sputtering method

Kudou, Jyun; Funasaki, Suguru; Takahara, Motoki; Takakura, Kenichiro; Ohyama, Hidenori; Nakashima, Toshiyuki; Shibuya, Mutsuo; Murakami, Katsuya; Simoen, Eddy; Claeys, Cor (2012)

Y function method applied to saturation regime: apaprent saturation mobility and saturation velocity extraction

Diouf, C.; Cros, A.; Monfray, S.; Mitard, Jerome; Rosa, S.; Gloria, D.; Ghibaudo, G. (2013)