Browsing by Author "Afanas'ev, V. V."

Band alignment at the interfaces of Al2O3 and ZrO2-based insulators with metals and Si

Band alignments in metal-oxide-silicon structures with atomic-layer deposited Al2O3 and ZrO2

Deep electron traps in HfO2-based ferroelectrics: (Al/Si-doped) HfO2 versus HfZrO4

Defect generation in Si/Sio2/Zro2/Tin structures: the possible role of hydrogen

Defect generation in ultra-thin SiO2 gate layers and SiO2/ZrO2 gate stacks and the dispersive transport model

Electrical and physical characterization of high-k dielectric layers

Electron energy barriers between (100)Si and ultrathin stacks of SiO2, Al2O3 , and ZrO2 insulators

Electron spin resonance analysis of interfacial Si dangling bond type defects in stack of ultrathin SiO2, Al2O3, and ZrO2 layers on (100)Si

Electron spin resonance observation of Si dangling bond type defects at the interface (100)Si and ultrathin stacks of SiO2, Al2O3, and ZrO2

Electron trapping in ferroelectric HfZrO4 and Al- and Si-doped layers

Electronic structure of NiO layers grown on Al2O3 and SiO2 using metallo-organic chemical vapour deposition

Energy barriers between (100)Si and Al2O3 and ZrO2-based dielectric stacks: internal electron photoemission measurements

Internal photoemission of electrons from 2D semiconductor/3D metal barrier structures

Investigation of Paramagnetic Defects in SiCN and SiCO-based Wafer Bonding

Optical transitions in monolayer WS2 observed through transient photoconductivity in MIS structures

Polarity dependence of defect generation in ultrathin SiO2/ZrO2 gate dielectric stacks

Processing Stability of Monolayer WS2 on SiO2

Shallow electron traps in high-k insulating oxides

Transitivity of band offsets between semiconductor heterojunctions and oxide insulators

Variation in the fixed charge density of SiOx/ZrO2 gate dielectric stacks during postdeposition oxidation