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Browsing by Author "Alian, Alireza"

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    Charge Trapping and Emission during Bias Temperature Stressing of Schottky Gate GaN-on-Silicon HEMT Structures Targeting RF/mm Wave Power Amplifiers

    O'Sullivan, Barry  
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    Rathi, Aarti  
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    Alian, Alireza
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    Yadav, Sachin  
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    Yu, Hao  
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    Sibaja-Hernandez, Arturo  
    Journal article
    2024, MICROMACHINES, (15) 8, p.Art. 951
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    CMOS compatible GaN-on-Si HEMT technology for RF applications: analysis of substrate losses and non-linearities

    Yadav, Sachin  
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    Cardinael, Pieter
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    Zhao, Ming  
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    Vondkar Kodandarama, Komal  
    Proceedings paper
    2021, International Conference on IC Design and Technology (ICICDT), SEP 15-17, 2021
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    Impact of channel thickness scaling on the performance of GaN-on-Si RF HEMTs on highly C-doped GaN buffer

    Alian, Alireza
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    Rodriguez, Raul  
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    Yadav, Sachin  
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    Peralagu, Uthayasankaran  
    Proceedings paper
    2022, 52nd IEEE European Solid-State Device Research Conference (ESSDERC), SEP 19-22, 2022, p.384-387
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    Leakage mechanism in ion implantation isolated AlGaN/GaN heterostructures

    Yu, Hao  
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    Putcha, Vamsi  
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    Peralagu, Uthayasankaran  
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    Zhao, Ming  
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    Yadav, Sachin  
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    Alian, Alireza
    Journal article
    2022-12-28, JOURNAL OF APPLIED PHYSICS, (131) 3, p.035701
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    Metal-Organic Chemical Vapor Deposition Regrowth of Highly Doped n+(In)GaN Source/Drain Layers for Radio Frequency Transistors

    Banerjee, Sourish  
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    Peralagu, Uthayasankaran  
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    Alian, Alireza
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    Zhao, Ming  
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    Hahn, Herwig
    Journal article
    2024, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, (221) 21, p.Art. 2400069
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    On the impact of Gate field-plate length and barrier layer thickness on TDDB lifetime of GaN-on-Si MISHEMT devices for RF/5G/mm-Wave applications

    Lin, Chien-Yu
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    Putcha, Vamsi  
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    Alian, Alireza
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    Waldron, Niamh  
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    Linten, Dimitri  
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    Collaert, Nadine  
    Proceedings paper
    2020, IEEE International Integrated Reliability Workshop (IIRW), OCT 04-NOV 01, 2020, p.24-30
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    Parasitic side channel formation due to ion implantation isolation of GaN HEMT

    Yu, Hao  
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    Peralagu, Uthayasankaran  
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    Alian, Alireza
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    Zhao, Ming  
    ;
    Parvais, Bertrand  
    Journal article
    2022-12-21, MRS ADVANCES, (7) 36, p.1274-1278
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    Reverse Gate Leakage Induced Buffer Charging and Threshold Voltage Shift of GaN HEMTs

    Yu, Hao  
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    Yadav, Sachin  
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    O'Sullivan, Barry  
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    Lin, Tzu-Heng  
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    Rathi, Aarti  
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    Alian, Alireza
    ;
    Wu, Tian-LI
    Journal article
    2024, IEEE TRANSACTIONS ON ELECTRON DEVICES, (71) 12, p.7308-7313
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    Thermal budget increased alloy disorder scattering of 2DEG in III-N heterostructures

    Yu, Hao  
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    Parvais, Bertrand  
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    Zhao, Ming  
    ;
    Rodriguez, Raul  
    ;
    Peralagu, Uthayasankaran  
    Journal article
    2022-05-16, APPLIED PHYSICS LETTERS, (120) 21, p.213504

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