Browsing by Author "Alian, Alireza"
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Publication Charge Trapping and Emission during Bias Temperature Stressing of Schottky Gate GaN-on-Silicon HEMT Structures Targeting RF/mm Wave Power Amplifiers
; ; ;Alian, Alireza; ; Journal article2024, MICROMACHINES, (15) 8, p.Art. 951Publication CMOS compatible GaN-on-Si HEMT technology for RF applications: analysis of substrate losses and non-linearities
Proceedings paper2021, International Conference on IC Design and Technology (ICICDT), SEP 15-17, 2021Publication Impact of channel thickness scaling on the performance of GaN-on-Si RF HEMTs on highly C-doped GaN buffer
Proceedings paper2022, 52nd IEEE European Solid-State Device Research Conference (ESSDERC), SEP 19-22, 2022, p.384-387Publication Leakage mechanism in ion implantation isolated AlGaN/GaN heterostructures
Journal article2022-12-28, JOURNAL OF APPLIED PHYSICS, (131) 3, p.035701Publication Metal-Organic Chemical Vapor Deposition Regrowth of Highly Doped n+(In)GaN Source/Drain Layers for Radio Frequency Transistors
Journal article2024, PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, (221) 21, p.Art. 2400069Publication On the impact of Gate field-plate length and barrier layer thickness on TDDB lifetime of GaN-on-Si MISHEMT devices for RF/5G/mm-Wave applications
Proceedings paper2020, IEEE International Integrated Reliability Workshop (IIRW), OCT 04-NOV 01, 2020, p.24-30Publication Parasitic side channel formation due to ion implantation isolation of GaN HEMT
Journal article2022-12-21, MRS ADVANCES, (7) 36, p.1274-1278Publication Reverse Gate Leakage Induced Buffer Charging and Threshold Voltage Shift of GaN HEMTs
; ; ; ; ; ;Alian, AlirezaWu, Tian-LIJournal article2024, IEEE TRANSACTIONS ON ELECTRON DEVICES, (71) 12, p.7308-7313Publication Thermal budget increased alloy disorder scattering of 2DEG in III-N heterostructures
Journal article2022-05-16, APPLIED PHYSICS LETTERS, (120) 21, p.213504