Browsing by Author "Clarysse, Trudo"

2D profiling with atomic force microscopy

A detailed study of SCM on cross-sectional and beveled junctions

Accurate carrier profiling of n-type GaAs junctions

Accurate electrical activation characterization of CMOS ultra-shallow profiles

Accurate prediction of device performance : Reconstructing 2D-active dopant profiles from 2D-carrier profiles in the presence of extensive mobile carrier diffusion

Accurate prediction of device performance based on 2-D carrier profiles in the presence of extensive mobile carrier diffusion

Active dopant characterization methodology for Germanium

Advanced 2D/3D simulations for laser annealed device using an atomic kinetic monte carlo approach and scanning spreading resistance microscopy (SRRM)

Advanced carrier depth profiling on Si and Ge with M4PP

Advanced carrier depth profiling on Si and Ge with micro four-point probe

Advanced characterization of carrier profiles in germanium using micro-machined contact probes

Advanced use of therma-probe for ultra-shallow junction monitoring

Advances in optical carrier profiling through high-frequency modulated optical reflectance

Advances in optical carrier profiling through high-frequency modulated optical reflectance

Aluminium implantation in germanium: uphill diffusion, electrical activation and trapping

Analysis and modeling of the high vacuum scanning spreading resistance microscopy nanocontact on silicon

Analysis and modeling of the HV-SSRM nanocontact on silicon

Assessing the performance of two-dimensional dopant profiling techniques

Assessing the performance of two-dimensional dopant profiling techniques

Assessment of Ge1-xSnx alloys for strained Ge CMOS devices