Browsing by Author "Crupi, Felice"

A defect-centric analysis of the temperature dependence of the channel hot carrier degradation in nMOSFETs

A defect-centric perspective on channel hot carrier variability in nMOSFETs

A new physically-based model for temperature acceleration of time-to-breakdown

A novel methodology for sensing the breakdown location and its application to the reliability study of ultra-thin Hf-silicate gate dielectrics

An inelastic quantum tunnelling model for current conduction after soft-breakdown

Analysis of Signal Processing Methods to Reject the DC Offset Contribution of Static Reflectors in FMCW Radar-Based Vital Signs Monitoring

Automatic radar-based 2-D localization exploiting vital signs signatures

Border traps in InGaAs nMOSFETs assessed by low-frequency noise

BTI reliability of ultra-thin EOT MOSFETs for sub-threshold logic

Buried silicon-germanium pMOSFETs: experimental analysis in VLSI logic circuits under aggressive voltage scaling

Characteristics and correlated fluctuations of the gate and substrate current after soft oxide breakdown

Characterization of soft breakdown in thin oxide NMOSFETs based on the analysis of the substrate current

Correlation between stress-induced leakage current (SILC) and the HfO2 bulk trap density in a SiO2/HfO2 stack

Defect-centric distribution of channel hot carrier degradation in nano-MOSFETs

Early assessment of emerging technologies for VLSI logic circuits from experimental measurements

Experimental analysis of buried SiGe pMOSFETs from the perspective of aggressive voltage scaling

Experimental evidence of the quantum point contact theory in the conduction mechanism of bipolar HfO2-based resistive random access memories

Fermi-level pinning at polycrystalline silicon-HfO2 interface as a source of drain and gate current 1/f noise

Gate voltage and geometry dependence of the series resistance and of the carrier mobility in FinFET devices

High-mobility 0.85nm-EOT Si0.45Ge0.55 pFETs: delivering high performance at scaled VDD