Browsing by Author "De Blauwe, Jan"
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Publication A flash memory technology with quasi-virtual ground array for low-cost embedded applications
Journal article2001, IEEE Journal of Solid-State Circuits, (36) 6, p.969-978Publication A low voltage, high performance 0.35 μm embedded flash EEPROM cell technology
Proceedings paper1998, 16th Nonvolatile Semiconductor Memory Workshop, 2/08/1998, p.106-108Publication A new polarity dependence of the reduced trap generation during high-field degradation of nitrided oxides
Proceedings paper1996, International Electron Devices Meeting. Technical Digest - IEDM, 8/12/1996, p.327-330Publication A new quantitative model to predict SILC-related disturb characteristics in Flash E2PROM devices
Proceedings paper1996, International Electron Devices Meeting - IEDM, 8/12/1996, p.343-346Publication Assessment of oxide reliability and hot carrier degradation in CMOS technology
Journal article1998, Microelectronic Engineering, 40, p.147-166Publication Degradation and nitridation dependence of steady-state stress induced leakage current (SILC)
Oral presentation1996, 27th IEEE Semiconductor Interface Specialists Conference (SISC); December 5-7, 1996; San Diego, Calif., USA.Publication High-temperature reliability behavior of SSI-flash EEPROM devices
; ; ; ; Proceedings paper1997, International Electron Devices Meeting. Technical digest - IEDM, 7/12/1997, p.93-96Publication Impact of tunnel-oxide nitridation on endurance and read-disturb characteristics of flash E2PROM devices
Journal article1997, Microelectronic Engineering, 36, p.301-304Publication On the breakdown statistics and mechanisms in ultra-thin oxides and nitrided oxides
Proceedings paper1997, Silicon Nitride and Silicon Dioxide Thin Insulating Films, 4/05/1997, p.3-19Publication Read-disturb and endurance of SSI-flash E2PROM devices at high operating temperatures
; ; ; ; Journal article1998, IEEE Trans. Electron Devices, (45) 12, p.2466-2474Publication Reliability of ultra-thin dielectrics for giga scale silicon technologies
Oral presentation1998, COMMAD 98; 14-16 December 1998; Perth, Australia.Publication Reliability of ultra-thin dielectrics for giga scale silicon technologies
Proceedings paper1999, 1998 Conference on Optoelectronic and Microelectronic Materials Devices; COMMAD 98., p.7-14Publication Reliable 5.9nm tunnel oxide flash EEPROM device
; ; ; ; Maes, HermanOral presentation1997, 15th IEEE Non -Volatile Semiconductor Workshop (NVSM) ; February 1997; Monterey, Calif., USA.Publication SILC-related effects in flash E2PROM's - Part I: A quantitative model for steady-state SILC
Journal article1998, IEEE Trans. Electron Devices, (45) 8, p.1745-1750Publication SILC-related effects in flash E2PROM's - Part II: Prediction of steady-state SILC-related disturb characteristics
Journal article1998, IEEE Trans. Electron Devices, (45) 8, p.1751-1760Publication Stress induced leakage current in thin oxides and its impact on flash memory reliability
De Blauwe, JanPHD thesis1998Publication Study of DC stress induced leakage current (SILC) and its dependence on oxide nitridation
Proceedings paper1996, Proceedings of the 26th European Solid-State Device Research Conference - ESSDERC, 9/09/1996, p.361-364Publication Subthreshold source-side injection (S3I): a promising programming mechanism for scaled-down, low-power Flash memories
; ; ; ; Proceedings paper1996, Proceedings of the 26th European Solid-State Device Research Conference - ESSDERC, 9/09/1996, p.131-134