Browsing by Author "De Blauwe, Jan"
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Publication A flash memory technology with quasi-virtual ground array for low-cost embedded applications
Journal article2001, IEEE Journal of Solid-State Circuits, (36) 6, p.969-978Publication A low voltage, high performance 0.35 μm embedded flash EEPROM cell technology
Proceedings paper1998, 16th Nonvolatile Semiconductor Memory Workshop, 2/08/1998, p.106-108Publication A new polarity dependence of the reduced trap generation during high-field degradation of nitrided oxides
Proceedings paper1996, International Electron Devices Meeting. Technical Digest - IEDM, 8/12/1996, p.327-330Publication A new quantitative model to predict SILC-related disturb characteristics in Flash E2PROM devices
Proceedings paper1996, International Electron Devices Meeting - IEDM, 8/12/1996, p.343-346Publication Assessment of oxide reliability and hot carrier degradation in CMOS technology
Journal article1998, Microelectronic Engineering, 40, p.147-166Publication Degradation and nitridation dependence of steady-state stress induced leakage current (SILC)
Oral presentation1996, 27th IEEE Semiconductor Interface Specialists Conference (SISC); December 5-7, 1996; San Diego, Calif., USA.Publication High-temperature reliability behavior of SSI-flash EEPROM devices
; ; ; ; Proceedings paper1997, International Electron Devices Meeting. Technical digest - IEDM, 7/12/1997, p.93-96Publication Impact of tunnel-oxide nitridation on endurance and read-disturb characteristics of flash E2PROM devices
Journal article1997, Microelectronic Engineering, 36, p.301-304Publication On the breakdown statistics and mechanisms in ultra-thin oxides and nitrided oxides
Proceedings paper1997, Silicon Nitride and Silicon Dioxide Thin Insulating Films, 4/05/1997, p.3-19Publication Read-disturb and endurance of SSI-flash E2PROM devices at high operating temperatures
; ; ; ; Journal article1998, IEEE Trans. Electron Devices, (45) 12, p.2466-2474Publication Reliability of ultra-thin dielectrics for giga scale silicon technologies
Proceedings paper1999, 1998 Conference on Optoelectronic and Microelectronic Materials Devices; COMMAD 98., p.7-14Publication Reliability of ultra-thin dielectrics for giga scale silicon technologies
Oral presentation1998, COMMAD 98; 14-16 December 1998; Perth, Australia.Publication Reliable 5.9nm tunnel oxide flash EEPROM device
; ; ; ; Maes, HermanOral presentation1997, 15th IEEE Non -Volatile Semiconductor Workshop (NVSM) ; February 1997; Monterey, Calif., USA.Publication SILC-related effects in flash E2PROM's - Part I: A quantitative model for steady-state SILC
Journal article1998, IEEE Trans. Electron Devices, (45) 8, p.1745-1750Publication SILC-related effects in flash E2PROM's - Part II: Prediction of steady-state SILC-related disturb characteristics
Journal article1998, IEEE Trans. Electron Devices, (45) 8, p.1751-1760Publication Stress induced leakage current in thin oxides and its impact on flash memory reliability
De Blauwe, JanPHD thesis1998-05Publication Study of DC stress induced leakage current (SILC) and its dependence on oxide nitridation
Proceedings paper1996, Proceedings of the 26th European Solid-State Device Research Conference - ESSDERC, 9/09/1996, p.361-364Publication Subthreshold source-side injection (S3I): a promising programming mechanism for scaled-down, low-power Flash memories
; ; ; ; Proceedings paper1996, Proceedings of the 26th European Solid-State Device Research Conference - ESSDERC, 9/09/1996, p.131-134