Browsing by Author "De Schepper, Luc"
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Publication A comparison between state-of-the-art
gilch' andsulphinyl' synthesised MDMO-PPV/PCBM bulk hetero-junction solar cellsJournal article2002, Thin Solid Films, 403-404, p.247-251Publication A high resolution method for measuring hot carrier degradation in matched transistor pairs
Journal article1997, Microelectronics and Reliability, (37) 10_11, p.1533-1536Publication A high resolution method for measuring hot carrier degradation in matched transistor pairs
Proceedings paper1997, Proceedings of 8th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis - ESREF 97; October 1997., p.1533-1536Publication A new degradation model and lifetime extrapolation technique for lightly doped drain NMOSFETs under hot-carrier degradation
Journal article2001, Microelectronics Reliability, (41) 3, p.437-443Publication A new lifetime extrapolation technique for LDD NMOSFETS under hot-carrier degradation
Proceedings paper1999, ESSDERC'99 - Proceedings of the 29th European Solid-State Device Research Conference; 13-15 September 1999; Leuven, Belgium., p.584-587Publication A new method for the analysis of high-resolution SILC data
Journal article2003, Microelectronics Reliability, (43) 9_11, p.1483-1488Publication Absorption phenomena in organic thin films for solar cell applications by photothermal deflection spectroscopy
Oral presentation2004, International Conference on the Physics, Chemistry and Engineering of Solar CellsPublication Absorption phenomena in organic thin films for solar cell applications investigated by photothermal deflection spectroscopy
Journal article2005, Journal of Materials Science, (40) 6, p.1413-1418Publication Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics
Journal article1994, Quality and Reliability Engineering International, (10) 1, p.15-26Publication Analytical bounds for the MLE of the Weibull shape parameter
Proceedings paper2002, Communications of the 3rd International Conference on Mathematical Methods in Reliability - MMR, 17/06/2002, p.31-34Publication Application of general finite mixture models to reliability data using likelihood estimation
Publication Characterisation of homoepitaxial and polycrystalline CVD diamond pn-junctions
; ; ; Publication Disclosure of the nanostructure of MDMO-PPV: PCBM bulk hetero-junction organic solar cells by a combination of SPM and TEM
Journal article2003, Synthetic Metals, (138) 1_2, p.243-247Publication Disclosure of the nanostructure of MDMO-PPV:PCBM bulk hetero-junction organic solar cells by a combination of SMP and TEM
; Goris, LudwigOral presentation2002, E-MRS Spring Meeting Symposium F: Organic Materials for Device ApplicationsPublication Dynamics of electromigration induced void-hillock growth and precipitation/dissolution of addition elements studied by in-situ electron microscopy resistance measurements
Journal article1999, Microelectronics and Reliability, (39) 11, p.1617-1630Publication Electrical characterisation and reliability studies of thick film gas sensor structures
Publication Electrical field induced ageing of polymer light-emitting diodes in an oxygen-rich atmosphere studied by emission microscopy, scanning electron microscopy and secondary ion mass spectroscopy
; ; ; Journal article1998, Synthetic Metals, (96) 2, p.87-96Publication Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology
Journal article2002, Microelectronics Reliability, (42) 9_11, p.1359-1363Publication High-resolution SILC measurements of thin SiO2 at ultra low voltages
Journal article2002, Microelectronics Reliability, (42) 9_11, p.1485-1489Publication Homoepitaxial and polycrystalline CVD diamnond pn-junctions
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