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Browsing by Author "Deutsch, Sergej"

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    3D design-for-test architecture

    Marinissen, Erik Jan  
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    Konijnenburg, Mario  
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    Verbree, Jouke
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    Chi, Chun-Chuan
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    Deutsch, Sergej
    Book chapter
    2019-03
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    A 3D-DfT demonstrator

    Marinissen, Erik Jan  
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    De Wachter, Bart  
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    O'Loughlin, Stephen
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    Deutsch, Sergej
    Proceedings paper
    2014-06, Design Automation Conference - DAC, 1/06/2014
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    A 3D-DfT demonstrator

    Marinissen, Erik Jan  
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    De Wachter, Bart  
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    O'Loughlin, Stephen
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    Deutsch, Sergej
    Proceedings paper
    2014-05, IEEE North-Atlantic Test Workshop, 14/05/2014
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    Automated design-for-test for 2.5D and 3D SICs

    Marinissen, Erik Jan  
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    Konijnenburg, Mario  
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    Deutsch, Sergej
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    Keller, Brion
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    Chickermane, Vivek
    Journal article
    2011-09, Chip Scale Review, (?) 5, p.18-22
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    Automation of 3D DfT insertion and interconnect test generation

    Deutsch, Sergej
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    Chickermane, Vivek
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    Keller, Brion
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    Konijnenburg, Mario  
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    Marinissen, Erik Jan  
    Oral presentation
    2011, IEEE International Test Conference - ITC
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    Automation of 3D-DfT insertion

    Deutsch, Sergej
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    Chickermane, Vivek
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    Keller, Brion
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    Mukherjee, Subhasish
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    Konijnenburg, Mario  
    Proceedings paper
    2011-11, IEEE Asian Test Symposium - ATS, 21/11/2011
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    Automation of 3D-DfT insertion

    Deutsch, Sergej
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    Chickermane, Vivek
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    Keller, Brion
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    Mukherjee, Subhasish
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    Konijnenburg, Mario  
    Proceedings paper
    2011-09, IEEE International Workshop on Testing Three-Dimensional Stacked ICs- 3D-TEST, 22/09/2011
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    Automation of DfT for 3-D stacked die

    Beyne, Eric  
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    Konijnenburg, Mario  
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    Marinissen, Erik Jan  
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    Jensen, Lisa
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    Deutsch, Sergej
    Proceedings paper
    2011, 3-D Architectures for Semiconductor Integration and Packaging, 3-D ASIP, 12/12/2011
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    Automation of DfT insertion and interconnect test generation for 3D stacked ICs

    Deutsch, Sergej
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    Chickermane, Vivek
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    Keller, Brion
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    Konijnenburg, Mario  
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    Marinissen, Erik Jan  
    Proceedings paper
    2011-05, IEEE North-Atlantic Test Workshop - NATW, 11/05/2011
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    Design, test generation, processing, and pre- and post-bond measurement results of a 3D-DfT demonstrator chip stack

    Marinissen, Erik Jan  
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    De Wachter, Bart  
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    O'Loughlin, Stephen
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    Deutsch, Sergej
    Oral presentation
    2014, Design, Automation, and Test in Europe - DATE': Friday Workshop on 3D Integration
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    Design, test generation, processing, and pre- and post-bond measurement results of a 3D-DfT demonstrator chip stack

    Marinissen, Erik Jan  
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    De Wachter, Bart  
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    O'Loughlin, Stephen
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    Deutsch, Sergej
    Proceedings paper
    2014-05, CDN Live! EMEA, 19/05/2014
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    DfT architecture and ATPG for interconnect tests of JEDEC wide-IO DRAM memory-on-Logic 2.5D/3D-stacks

    Deutsch, Sergej
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    Chickermane, Vivek
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    Keller, Brion
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    Mukherjee, Subhasish
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    Sood, Navdeep
    Proceedings paper
    2012-05, Cadence CDNLive! EMEA, 14/05/2012
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    DfT architecture and ATPG for interconnect tests of JEDEC wide-IO memory-on-logic die stacks

    Deutsch, Sergej
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    Keller, Brion
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    Chickermane, Vivek
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    Mukherjee, Subhasish
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    Sood, Navdeep
    Proceedings paper
    2012-11, IEEE International Test Conference - ITC, 6/11/2012, p.1-10
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    DfT insertion and interconnect test generation for 3D stacks with JEDEC wide-IO DRAM

    Deutsch, Sergej
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    Keller, Brion
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    Chickermane, Vivek
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    Goel, Sandeep K.
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    Marinissen, Erik Jan  
    Proceedings paper
    2012-05, IEEE North-Atlantic Test Workshop - NATW, 9/05/2012
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    Imec's 3D-DfT architecture: basics, extensions, and demonstrator results

    Marinissen, Erik Jan  
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    De Wachter, Bart  
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    O'Loughlin, Stephen
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    Deutsch, Sergej
    Proceedings paper
    2014-06, Workshop on Design for 3D Silicon Integration - D43D, 23/06/2014
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    Implementation aspects of a 3D DfT architecture

    Deutsch, Sergej
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    Chickermane, Vivek
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    Keller, Brion
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    Mukherjee, Subhasish
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    Konijnenburg, Mario  
    Oral presentation
    2011, CDNLive! EMEA (Cadence Design Systems)
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    Interconnect test for wide-IO memory-on-logic stacks

    Marinissen, Erik Jan  
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    Deutsch, Sergej
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    Keller, Brion
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    Chickermane, Vivek
    Journal article
    2012-07, Future Fab International, 42, p.112-117
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    Optimization of test-access architecture and test scheduling for 3D ICs

    Deutsch, Sergej
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    Noia, Brandon
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    Chakrabarty, Krishnendu
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    Marinissen, Erik Jan  
    Book chapter
    2019-03
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    Robust optimization of test-access architectures under realistic scenarios

    Deutsch, Sergej
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    Chakrabarty, Krishnendu
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    Marinissen, Erik Jan  
    Journal article
    2015-11, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems (TCAD), (34) 11, p.1873-1884
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    Uncertainty-aware robust optimization of test-access architectures for 3D stacked ICs

    Deutsch, Sergej
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    Chakrabarty, Krishnendu
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    Marinissen, Erik Jan  
    Proceedings paper
    2013-09, IEEE International Test Conference - ITC, 10/09/2013, p.7.1
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