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Browsing by Author "Doise, Jan"

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    A progress report on DSA of high-chi silicon containing block co-polymers

    Willson, C. Grant
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    Janes, Dustin
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    Ito, Natsuko
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    Blachut, Gregory
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    Sirard, Stephen
    Proceedings paper
    2018, Advances in Patterning Materials and Processes XXXV, 25/02/2018, p.105860O
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    Contact hole multiplication using grapho-epitaxy directed self-assembly: process choices, template optimization, and placement accuracy

    Bekaert, Joost  
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    Doise, Jan  
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    MKuppuswamy, Vijaya Kumar
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    Chan, BT  
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    Gronheid, Roel  
    Oral presentation
    2014, FujiFilm Electronic Materials Wrokshop
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    Contact hole multiplication using grapho-epitaxy directed self-assembly: process choices, template optimization, and placement accuracy

    Bekaert, Joost  
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    Doise, Jan  
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    MKuppuswamy, Vijaya Kumar
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    Gronheid, Roel  
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    Chan, BT  
    Proceedings paper
    2014, 30th European Mask and Lithography Conference - EMLC, 24/06/2014, p.92310R
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    Contact hole multiplication using grapho-epitaxy directed self-assembly: process choices, template optimization, and placement accuracy

    Bekaert, Joost  
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    Gronheid, Roel  
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    MKuppuswamy, Vijaya Kumar
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    Doise, Jan  
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    Chan, BT  
    Oral presentation
    2014, Photomask Technology (BACUS 2014)
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    Continued Optimization of Point-Of-Use Filtration for Metal Oxide Photoresists to Reduce Defect Density

    Kohyama, T.
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    Chang, Shu-Hao
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    Doise, Jan
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    Kocsis, Michael
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    De Schepper, Peter
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    Foubert, Philippe  
    Proceedings paper
    2023, Conference on Advances in Patterning Materials and Processes XL, FEB 27-MAR 01, 2023, p.Art. 124980A
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    Controlling placement error and dimensional variability in templated DSA

    Boeckx, Carolien
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    Doise, Jan  
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    Bekaert, Joost  
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    Chan, BT  
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    Gronheid, Roel  
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    De Gendt, Stefan  
    Meeting abstract
    2016, Chemical Research in Flanders, 24/10/2016
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    Defect mitigation in sub-20 nm patterning with high-chi, silicon containing block copolymers

    Doise, Jan  
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    Mannaert, Geert  
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    Suh, Hyo Seon  
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    Rincon Delgadillo, Paulina  
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    Vandenberghe, Geert  
    Proceedings paper
    2018, 4th International Symposium on DSA, 11/11/2018
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    Design strategy for layout of Sub-Resolution Directed Self-Assembly Assist Features (SDRAFs)

    Tung, C. Maryann
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    Doise, Jan  
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    Karageorgos, Ioannis
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    Ryckaert, Julien  
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    Wong, H.-S. Philip
    Proceedings paper
    2016, Electron, Ion, and Photon Beam Technology and Nanofrabrication - EIPBN, 31/05/2016, p.5C4
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    Development of high-chi directed self-assembly process based on key learning from PS-b-PMMA system

    Suh, Hyo Seon  
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    Mannaert, Geert  
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    Vandenbroeck, Nadia  
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    Doise, Jan  
    Proceedings paper
    2021, Advances in Patterning Materials and Processes XXXVIII, 21/02/2021, p.116120P
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    DSA graphoepitaxy calibrations for contact hole multiplication

    Graves, Trey
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    Vaglio Pret, Alessandro  
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    Robertson, Stuart
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    Smith, Mark
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    Doise, Jan  
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    Bekaert, Joost  
    Proceedings paper
    2015, Advances in Patterning Materials and Processes XXXII, 22/02/2015, p.94250Y
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    Dual brush process for selective surface modification in graphoepitaxy directed self-assembly

    Doise, Jan  
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    Chan, BT  
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    Hori, Masafumi
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    Gronheid, Roel  
    Journal article
    2017, Journal of Micro/Nanolithography MEMS and MOEMS, (16) 3, p.33503
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    Dual brush process for selective surface modification in graphoepitaxy directed self-assembly

    Doise, Jan  
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    Chan, BT  
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    Hori, Masafumi
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    Gronheid, Roel  
    Proceedings paper
    2017, Advances in Patterning Materials and Processes XXXIV, 26/02/2017, p.101460R
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    Enabling 0.33NA EUV lithography patterning towards MP16 SADP semi-damascene metallization, setting the benchmark for High-NA EUV

    Hermans, Yannick  
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    Decoster, Stefan  
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    Wu, Chen  
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    Doise, Jan
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    Renaud, Vincent  
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    Van den Heuvel, Dieter
    Proceedings paper
    2024, 2024 International Conference on Extreme Ultraviolet Lithography, SEP 30-OCT 03, 2024
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    EUV patterned templates with grapho-epitaxy DSA at the N5/N7 logic nodes

    Gronheid, Roel  
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    Boeckx, Carolien
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    Doise, Jan  
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    Bekaert, Joost  
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    Karageorgos, Ioannis
    Proceedings paper
    2016, Extreme Ultraviolet (EUV) Lithography VII, 21/02/2016, p.97761W
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    Impact of annealing temperature on DSA process: toward faster assembly kinetics

    Suh, Hyo Seon  
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    Nair, Vineet Vijayakrishnan  
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    Rincon Delgadillo, Paulina  
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    Doise, Jan  
    Proceedings paper
    2018, Advances in Patterning Materials and Processes XXXV, 24/02/2018, p.105860T
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    Impact of DSA process variability on circuit performance

    Karageorgos, Ioannis
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    Doise, Jan  
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    Rincon Delgadillo, Paulina  
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    Stucchi, Michele  
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    Baert, Rogier  
    Proceedings paper
    2016-10, International Symposium on DSA, 11/10/2016
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    Impact of template shape on CDU and pattern placement for grapho-epitaxy DSA

    Boeckx, Carolien
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    Doise, Jan  
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    Chan, BT  
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    Gronheid, Roel  
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    De Gendt, Stefan  
    Proceedings paper
    2016, DSA Symposium, 11/10/2016
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    Impact of template shape on pattern placement and CDU for grapho-epitaxy DSA

    Boeckx, Carolien
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    Doise, Jan  
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    Bekaert, Joost  
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    Gronheid, Roel  
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    De Gendt, Stefan  
    Proceedings paper
    2016, DSA Symposium, 11/10/2016
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    Implementation of Block Copolymer Based Directed Self-assembly for Advanced Lithography

    Doise, Jan  
    PHD thesis
    2017-11
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    Implementation of DSA for electrical test vehicles at the 7 nm node

    Gronheid, Roel  
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    Doise, Jan  
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    Bekaert, Joost  
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    Chan, BT  
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    Rincon Delgadillo, Paulina  
    Proceedings paper
    2015, E-MRS Spring Meeting, 11/05/2015
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