Browsing by Author "Fiegna, C."

Analysis of RTN Induced by Forward Gate Stress in GaN HEMTs with a Schottky p-GaN Gate

Failure mode for p-GaN gates under forward gate stress with varying Mg concentration

Gate Reliability of p-GaN Power HEMTs Under Pulsed Stress Condition

High-Temperature Time-Dependent Gate Breakdown of p-GaN HEMTs

P-GaN Gate HEMTs: A Solution to Improve the High-Temperature Gate Lifetime

Reduced self-heating by strained silicon substrate engineering

Reduced self-heating by strained silicon substrate engineering

Reduced self-heating by strained silicon substrate engineering

Reliability of Au-free AlGaN/GaN-on-silicon Schottky barrier diodes under ON-state stress

Role of the GaN-on-Si Epi-Stack on ?R-ON Caused by Back-Gating Stress

TCAD Modeling of the Dynamic VTH Hysteresis Under Fast Sweeping Characterization in p-GaN Gate HEMTs

The Role of Frequency and Duty Cycle on the Gate Reliability of p-GaN HEMTs