Browsing by Author "Hayama, K."

Anomalous threshold voltage change by 2 MeV electron irradiation at 100°C in deep submicron metal-oxide-semiconductor field-effect transistors

Body potential analysis of ultra thin gate oxide FD-SOI MOSFETs in accumulation mode operation

Carrier lifetime analysis in thin gate oxide FD-SOI n-MOSFETs by gate-induced drain current tranients

Damage coefficient in high-temperature particle- and gamma-irradiated silicon p-i-n diodes

Degradation of drain current hysteresis in electron-irradiated FD-SOI MOSFETs in accumulation mode operation

Degradation of electrical performance and floating body effect in ultra thin gate oxide FD-SOI n-MOSFETs by 7.5-MeV proton irradiation

Degradation of high resistivity silicon float zone and magnetic Czochralski n-type silicon detectors subjected to 2-MeV electron irradiation

Degradation of high-resistivity float zone and magnetic Czochralski n-type silicon detectors subjected to 2-MeV electron irradiation

Degradation of the electrical performance and floating body effects in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation

Degradation of the electrical performance and floating body efffects in ultra thin gate oxide FD-SOI nMOSFETs by 2-MeV electron irradiation

Device performance of 90nm nMOSFETs at liquid nitrogen temperature

Difference of 2-MeV electron-irradiation-induced performance degradation in FD-SOI MOSFETs fabricated on ELTRAN and UNIBOND wafers

Dose rate dependence of radiation-induced lattice defects and performance degradation in npn Si bipolar transistors by 2-MeV electron irradiation

Dose rate dependence of the back gate degradation in thin gate oxide PD-SOI MOSFETs by 2-MeV electron irradiation

Effect of high-temperature electron irradiation in deep submicron MOSFETs

Effect of high-temperature electron irradiation in deep submicron MOSFETs

Effect of high-temperature electron irradiation in thin gate oxide FD-SOI n-MOSFETs

Effect of irradiation temperature on radiation damage in electron-irradiated MOS FETs

Effects of high-temperature electron irradiation on submicron MOSFETs

Effects of irradiation temperature on radiation damage in electron-irradiated MOSFETs