Browsing by Author "Houssiau, L."

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Houssiau, L.

Proceedings paper

2004-05, Proceedings of the 14th Int. Conference on Secondary Ion Mass Spectrometry and Related Topics - SIMS XIV, 14/09/2003, p.749-753

Publication

Cesium/xenon dual beam depth profiling with TOF-SIMS: measurement and modeling of M+, MCs+, and MCS2)-C-2 (+) yields

Brison, J.

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Houssiau, L.

Journal article

2004, Applied Surface Science, 231-232, p.749-753

Publication

Characterization of ultrathin high-k HfO2 layers grown on silicon: influence of the deposition parameters and interfacial layer

Houssiau, L.

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Vitchev, R.G.

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Pireaux, J.-J.

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Oral presentation

2004, 16th International Vacuum Congress - IVC-16

Publication

High resolution depth profiling of future gate dielectric materials

Bergmaier, A.

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Dollinger, G.

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Görgens, L.

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Neumaier, P.

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Brijs, Bert

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Oral presentation

2003, E-MRS Spring Meeting Symposium I: Functional Metal-Oxides-Semiconductor Structures

Publication

Interfacial chemistry at high-k oxide layers on pretreated silicon wafers: XPS and TOF-SIMS study

Vitchev, R.

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Houssiau, L.

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Pireaux, J.J.

Oral presentation

2004, 31st Conference on the Physics and Chemistry of Semiconductor Interfaces

Publication

Multitechnique characterisation of Al203 thin layers deposited on SiO2/Si surface by atomic layer chemical vapour deposition

Houssiau, L.

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Vitchev, R.G.

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Pireaux, J.J.

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Richard, Olivier

Proceedings paper

2003, AVS 4th International Conference on Microelectronics and Interfaces - ICMI, 3/03/2003, p.36-38

Publication

Physical characterization of mixed HfAlOx layers by complementary analysis techniques

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Richard, Olivier

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Brijs, Bert

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Petry, Jasmine

Journal article

2004, Materials Science and Engineering B, 109, p.60-63

Publication

Physical characterization of thin HfO2 layers by the combined analysis with complementary techniques

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Richard, Olivier

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Brijs, Bert

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Petry, Jasmine

Proceedings paper

2003, Analytical Techniques for Semiconductor Materials and Processes, 27/04/2003, p.223-232

Publication

Purity of epitaxial cubic BoronNitride films on (001) Diamond - A prerequisite for their doping

Yin, H.

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Boyen, H.G.

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Ziemann, P.

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Dohuard, B.

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Houssiau, L.

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Renaux, F.

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Hecq, M.

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Bittencourt, C.

Journal article

2008, Diamond and Related Materials, (17) 3, p.276-282

Publication

Tof-SIMS depth profiling of Hf and Al composition variations in ultrathin mixed HfO2/Al2O3 oxides

Houssiau, L.

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Vitchev, R.G.

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Oral presentation

2003, International Conference on Secondary Ion Mass Spectrometry - SIMS XIV

Publication

ToF-SIMS depth profiling of Hf and Al composition variations in ultrathin mixed HfO2/Al2O3 oxides

Houssiau, L.

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Vitchev, R.G.

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