Browsing by Author "Jourdain, Anne"
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Publication 0-Level packaging techniques for flip-chip mounted MMICs
Proceedings paper2001, GAAS - European Gallium Arsenide and other Semiconductors Application Symposium, 24/09/2001, p.239-242Publication 300mm wafer thinning and backside passivation compatibility with temporary wafer bonding for 3D stacked IC applications
Meeting abstract2010-11, IEEE International 3D System Integration Conference - 3DIC, 16/11/2010Publication 3D backside integration of FinFETs: Is there an impact on LF noise?
Journal article2023, SOLID-STATE ELECTRONICS, (207) September, p.Art. 108724Publication 3D chip package interaction thermo-mechanical challenges: proximity effects of through silicon vias and μ-bumps
Proceedings paper2012, IEEE International Conference on IC Design and technology - ICICDT, 30/05/2012Publication 3D integration challenges for fine pitch back side micro-bumping on ZoneBOND™ wafers
Proceedings paper2012, 4th Electronics System Integration Technologies Conference - ESTC, 17/09/2012Publication 3D interconnects for quantum computing
Proceedings paper2024, IEEE 74th Electronic Components and Technology Conference (ECTC), MAY 28-31, 2024, p.821-828Publication 3D stacked IC demonstration using a through silicon via first approach
Proceedings paper2008, Technical Digest International Electron Devices Meeting - IEDM, 15/12/2008, p.603-606Publication 3D stacked IC demonstrator using hybrid collective die-to-wafer bonding with copper through silicon vias (TSV)
; ;Coenen, Jens; ; ; Proceedings paper2009, IEEE 3D-IC, 28/09/2009Publication 3D stacked ICs using Cu TSVs and die to wafer hybrid collective bonding
Proceedings paper2009, IEEE International Electron Devices Meeting - IEDM, 7/12/2009, p.357-360Publication 3D stacking using bump-less process for sub 10μm pitches
Proceedings paper2016, IEEE 66th Electronic Components and Technology Conference - ECTC, 31/05/2016, p.128-133Publication 3D stacking using Cu-Cu direct bonding
Proceedings paper2012-02, IEEE International 3D System Integration Conference - 3DIC, 31/01/2012, p.1-MarPublication A 60GHz silicon micromachined cavity resonator with integrated tuning MEMS array
Proceedings paper2009, MEMSWAVE Symposium, 6/07/2009, p.27-30Publication A method to evaluate internal cavity pressure of sealed MEMS devices
Proceedings paper2005, Proceedings 15th European Microelectronics and Packaging Conference - EPMC, 12/06/2005, p.599-603Publication Advances in thin wafer debonding and ultra thin 28nm FinFET substrate transfer
Meeting abstract2017, IEEE 67th Electronic Components and Technology Conference - ECTC, 30/05/2017, p.740-745Publication Anomalous C-V inversion in TSV's: The problem and its cure
; ; ; ; ; Journal article2018, IEEE Transactions on Electron Devices, (65) 4, p.1473-1479Publication Assessment of the feasibility of 'multiple chips-to-wafer' thermo-compression bonding using FEM
Proceedings paper2008, EuroSimE: Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 20/04/2008Publication Backside power delivery as a scaling knob for future systems
Meeting abstract2019, Design-Process-Technology Co-optimization for Manufacturability XIII, 25/02/2019, p.1096205Publication Backside Power Delivery With Relaxed Overlay for Backside Patterning Using Extreme Wafer Thinning and Molybdenum-Filled Slit Nano Through Silicon Vias
Journal article2024, IEEE TRANSACTIONS ON ELECTRON DEVICES, (71) 12, p.7963-7969Publication BCB collective bonding for 3D stacking
Meeting abstract2007-12, International Workshop on Wafer Bonding for MEMS Technologies and Wafer Level Integration, 9/12/2007Publication Block level and package level thermal assessment for back side power delivery network.
Proceedings paper2024, IEEE 74th Electronic Components and Technology Conference (ECTC), MAY 28-31, 2024, p.1036-1043