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Browsing by Author "Jourdain, Anne"

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    0-Level packaging techniques for flip-chip mounted MMICs

    De Raedt, Walter  
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    Brebels, Steven  
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    Monfraix, P.
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    Carchon, Geert
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    Jourdain, Anne  
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    Tilmans, Harrie  
    Proceedings paper
    2001, GAAS - European Gallium Arsenide and other Semiconductors Application Symposium, 24/09/2001, p.239-242
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    300mm wafer thinning and backside passivation compatibility with temporary wafer bonding for 3D stacked IC applications

    Jourdain, Anne  
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    Buisson, Thibault
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    Phommahaxay, Alain  
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    Privett, Marc
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    Wallace, Daniel
    Meeting abstract
    2010-11, IEEE International 3D System Integration Conference - 3DIC, 16/11/2010
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    3D backside integration of FinFETs: Is there an impact on LF noise?

    Simoen, Eddy
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    Jourdain, Anne  
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    Claeys, Cor
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    Veloso, Anabela  
    Journal article
    2023, SOLID-STATE ELECTRONICS, (207) September, p.Art. 108724
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    3D chip package interaction thermo-mechanical challenges: proximity effects of through silicon vias and μ-bumps

    Guo, Wei  
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    Van der Plas, Geert  
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    Ivankovic, Andrej
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    Eneman, Geert  
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    Cherman, Vladimir  
    Proceedings paper
    2012, IEEE International Conference on IC Design and technology - ICICDT, 30/05/2012
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    3D integration challenges for fine pitch back side micro-bumping on ZoneBOND™ wafers

    Buisson, Thibault
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    De Preter, Inge  
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    Suhard, Samuel  
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    Vandersmissen, Kevin  
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    Jaenen, Patrick  
    Proceedings paper
    2012, 4th Electronics System Integration Technologies Conference - ESTC, 17/09/2012
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    3D interconnects for quantum computing

    Derakhshandeh, Jaber  
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    Dangol, Anish  
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    Hussain, Tassawar  
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    Stegmann, Heiko
    Proceedings paper
    2024, IEEE 74th Electronic Components and Technology Conference (ECTC), MAY 28-31, 2024, p.821-828
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    3D stacked IC demonstration using a through silicon via first approach

    Van Olmen, Jan  
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    Mercha, Abdelkarim  
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    Katti, Guruprasad
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    Huyghebaert, Cedric  
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    Van Aelst, Joke  
    Proceedings paper
    2008, Technical Digest International Electron Devices Meeting - IEDM, 15/12/2008, p.603-606
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    3D stacked IC demonstrator using hybrid collective die-to-wafer bonding with copper through silicon vias (TSV)

    Van Olmen, Jan  
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    Coenen, Jens
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    Dehaene, Wim  
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    De Meyer, Kristin  
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    Huyghebaert, Cedric  
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    Jourdain, Anne  
    Proceedings paper
    2009, IEEE 3D-IC, 28/09/2009
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    3D stacked ICs using Cu TSVs and die to wafer hybrid collective bonding

    Katti, Guruprasad
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    Mercha, Abdelkarim  
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    Van Olmen, Jan  
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    Huyghebaert, Cedric  
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    Jourdain, Anne  
    Proceedings paper
    2009, IEEE International Electron Devices Meeting - IEDM, 7/12/2009, p.357-360
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    3D stacking using bump-less process for sub 10μm pitches

    Derakhshandeh, Jaber  
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    De Preter, Inge  
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    Gerets, Carine  
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    Hou, Lin  
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    Heylen, Nancy  
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    Beyne, Eric  
    Proceedings paper
    2016, IEEE 66th Electronic Components and Technology Conference - ECTC, 31/05/2016, p.128-133
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    3D stacking using Cu-Cu direct bonding

    Hu, Yu-Hsiang
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    Liu, C.S.
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    Lii, M.J.
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    Rebibis, Kenneth June  
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    Jourdain, Anne  
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    La Manna, Antonio  
    Proceedings paper
    2012-02, IEEE International 3D System Integration Conference - 3DIC, 31/01/2012, p.1-Mar
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    A 60GHz silicon micromachined cavity resonator with integrated tuning MEMS array

    Dancila, Dragos
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    Ekkels, Phillip
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    Simon, Pascal
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    Jourdain, Anne  
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    Phommahaxay, Alain  
    Proceedings paper
    2009, MEMSWAVE Symposium, 6/07/2009, p.27-30
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    A method to evaluate internal cavity pressure of sealed MEMS devices

    De Coster, Jeroen  
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    Jourdain, Anne  
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    Puers, Bob  
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    Tilmans, Harrie  
    Proceedings paper
    2005, Proceedings 15th European Microelectronics and Packaging Conference - EPMC, 12/06/2005, p.599-603
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    Advances in thin wafer debonding and ultra thin 28nm FinFET substrate transfer

    Phommahaxay, Alain  
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    Guerrero, Alice  
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    Jourdain, Anne  
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    Potoms, Goedele  
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    Verbinnen, Greet  
    Meeting abstract
    2017, IEEE 67th Electronic Components and Technology Conference - ECTC, 30/05/2017, p.740-745
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    Anomalous C-V inversion in TSV's: The problem and its cure

    Stucchi, Michele  
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    De Vos, Joeri  
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    Jourdain, Anne  
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    Li, Yunlong  
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    Van der Plas, Geert  
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    Croes, Kristof  
    Journal article
    2018, IEEE Transactions on Electron Devices, (65) 4, p.1473-1479
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    Assessment of the feasibility of 'multiple chips-to-wafer' thermo-compression bonding using FEM

    Okoro, Chukwudi
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    Jourdain, Anne  
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    Vandevelde, Bart  
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    Swinnen, Bart  
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    Vandepitte, Dirk
    Proceedings paper
    2008, EuroSimE: Thermal, Mechanical and Multiphysics Simulation and Experiments in Micro-Electronics and Micro-Systems, 20/04/2008
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    Backside power delivery as a scaling knob for future systems

    Chava, Bharani
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    Shaik, Khaja Ahmad
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    Jourdain, Anne  
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    Guissi, Sofiane  
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    Weckx, Pieter  
    Meeting abstract
    2019, Design-Process-Technology Co-optimization for Manufacturability XIII, 25/02/2019, p.1096205
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    Backside Power Delivery With Relaxed Overlay for Backside Patterning Using Extreme Wafer Thinning and Molybdenum-Filled Slit Nano Through Silicon Vias

    Zhao, Peng  
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    Witters, Liesbeth  
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    Jourdain, Anne  
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    Stucchi, Michele  
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    Jourdan, Nicolas  
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    Maes, J. W.
    Journal article
    2024, IEEE TRANSACTIONS ON ELECTRON DEVICES, (71) 12, p.7963-7969
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    BCB collective bonding for 3D stacking

    Jourdain, Anne  
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    De Moor, Piet  
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    Pargfrieder, Stefan
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    Baert, Kris
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    Swinnen, Bart  
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    Beyne, Eric  
    Meeting abstract
    2007-12, International Workshop on Wafer Bonding for MEMS Technologies and Wafer Level Integration, 9/12/2007
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    Block level and package level thermal assessment for back side power delivery network.

    Lofrano, Melina  
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    Oprins, Herman  
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    Cherman, Vladimir  
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    Witters, Liesbeth  
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    Jourdain, Anne  
    Proceedings paper
    2024, IEEE 74th Electronic Components and Technology Conference (ECTC), MAY 28-31, 2024, p.1036-1043
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