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Browsing by Author "Kar, Gouri Sankar"

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    10x10nm2 Hf/HfOx crossbar resistive RAM with excellent performance, reliability and low-energy operation

    Govoreanu, Bogdan  
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    Kar, Gouri Sankar  
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    Chen, Yangyin  
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    Paraschiv, Vasile  
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    Kubicek, Stefan  
    Proceedings paper
    2011, IEEE International Electron Devices Meeting - IEDM, 5/12/2011, p.729-732
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    3D-DRAM Si/SiGe superlattices: inspection strategies and evaluation

    Beggiato, Matteo  
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    Loo, Roger  
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    Wei, S.
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    Moussa, Alain  
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    Bast, G.
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    Fukaya, K.
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    Cerbu, Dorin  
    Proceedings paper
    2025, 2025 Conference on Metrology Inspection and Process Control-Annual, 2025-02-24, p.1342612-1
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    A Co/Ni-based perpendicular magnetic tunnel junction (p-MTJ) stack with improved reference layer for BEOL compatibility

    Tomczak, Yoann  
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    Lin, Tsann
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    Swerts, Johan  
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    Couet, Sebastien  
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    Mertens, Sofie  
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    Liu, Enlong
    Meeting abstract
    2016, MMM Intermag, 11/01/2016
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    A combinatorial study of SiGeAsTe thin films for application as an Ovonic threshold switch selector

    Devulder, Wouter  
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    Garbin, Daniele  
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    Clima, Sergiu  
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    Donadio, Gabriele Luca  
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    Fantini, Andrea  
    Journal article
    2022-07-01, THIN SOLID FILMS, (753) /, p.139278
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    A comparative analysis on the impact of bank contention in STT-MRAM and SRAM based LLCs

    Evenblij, Timon  
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    Perumkunnil, Manu  
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    Catthoor, Francky  
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    Sakhare, Sushil
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    Debacker, Peter  
    Proceedings paper
    2019, International Conference on Computer Design - ICCD, 17/11/2019, p.1-9
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    A deep level transient spectroscopy study of hole traps in GexSe1-x-based layers for ovonic threshold switching selectors

    Hsu, Brent  
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    Simoen, Eddy  
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    Lin, Dennis  
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    Stesmans, Andre  
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    Goux, Ludovic  
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    Delhougne, Romain  
    Journal article
    2020, ECS Journal of Solid State Science and Technology, (9) 4, p.044006-1-044006-7
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    A deep level transient spectroscopy study of hole traps in GexSe1-x-based layers for ovonic threshold switching selectors

    Hsu, Brent  
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    Simoen, Eddy  
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    Lin, Dennis  
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    Stesmans, Andre  
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    Goux, Ludovic  
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    Delhougne, Romain  
    Proceedings paper
    2019, Semiconductors, Dielectrics, and Metals for Nanoelectronics 17, 13/10/2019, p.45-55
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    A HydroDynamic Model for Trap-Assisted Tunneling Conduction in Ovonic Devices

    Buscemi, F.
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    Piccinini, E.
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    Vandelli, L.
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    Nardi, F.
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    Padovani, A.
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    Kaczer, Ben  
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    Garbin, Daniele  
    Journal article
    2023, IEEE TRANSACTIONS ON ELECTRON DEVICES, (70) 4, p.1808-1814
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    A New Surface Potential and Physics Based Compact Model for a-IGZO TFTs at Multinanoscale for High Retention and Low-Power DRAM Application

    Guo, Jingrui
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    Han, Kaizhen
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    Subhechha, Subhali  
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    Duan, Xinlv
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    Chen, Qian
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    Geng, Di
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    Huang, Shijie
    Proceedings paper
    2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021
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    A novel PEALD tunnel dielectric for three-dimensional non-volatile charge-trapping technology

    Cacciato, Antonio
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    Breuil, Laurent  
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    Dekkers, Harold  
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    Zahid, Mohammed
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    Kar, Gouri Sankar  
    Proceedings paper
    2010, IEEE Semiconductor Interface Specialists Conference - SISC, 2/12/2010
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    A novel PEALD tunnel dielectric for three-dimensional non-volatile charge-trapping technology

    Cacciato, Antonio
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    Breuil, Laurent  
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    Dekkers, Harold  
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    Zahid, Mohammed
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    Kar, Gouri Sankar  
    Journal article
    2011, Electrochemical and Solid-State Letters, (14) 7, p.271-273
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    A smaller, faster and more energy-efficient complementary STT-MRAM cell uses three transistors and a ground grid: more is actually less

    Appeltans, Raf  
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    Raghavan, Praveen
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    Kar, Gouri Sankar  
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    Furnemont, Arnaud  
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    Van der Perre, Liesbet
    Journal article
    2017, IEEE Transactions on Very Large Scale Integration (VLSI) Systems, (25) 4, p.1204-1214
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    A Systematic Assessment of W-Doped CoFeB Single Free Layers for Low Power STT-MRAM Applications

    Rao, Siddharth  
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    Couet, Sebastien  
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    Van Beek, Simon  
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    Kundu, Shreya  
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    Houshmand Sharifi, Shamin  
    Journal article
    2021, ELECTRONICS, (10) 19, p.2384
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    Advanced characterization of 2D materials using SEM image processing and machine learning

    Saib, Mohamed  
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    Moussa, Alain  
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    Beggiato, Matteo  
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    Groven, Benjamin  
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    Medina Silva, Henry  
    Proceedings paper
    2024, Conference on Metrology, Inspection, and Process Control XXXVIII, FEB 26-29, 2024, p.129550X
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    All-Electrical Control of Scaled Spin Logic Devices Based on Domain Wall Motion

    Raymenants, Eline  
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    Wan, Danny  
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    Couet, Sebastien  
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    Souriau, Laurent  
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    Thiam, Arame  
    Journal article
    2021, IEEE TRANSACTIONS ON ELECTRON DEVICES, (68) 4, p.2116-2122
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    Analysis of complementary RRAM switching

    Wouters, Dirk
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    Zhang, Leqi
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    Fantini, Andrea  
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    Degraeve, Robin  
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    Goux, Ludovic  
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    Chen, Yangyin  
    Journal article
    2012, IEEE Electron Device Letters, (33) 8, p.1186-1188
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    Annealing stability of magnetic tunnel junctions no dual MgO free layers and Co/Ni based synthetic antiferromagnetic reference system

    Devolder, Thibaut
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    Couet, Sebastien  
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    Swerts, Johan  
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    Liu, Enlong
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    Lin, Tsann
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    Mertens, Sofie  
    Journal article
    2017, Journal of Applied Physics, (121) 11, p.113904
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    Asymmetry and switching phenomenology in TiN(Al2O3)\HfO2\Hf systems

    Goux, Ludovic  
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    Fantini, Andrea  
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    Govoreanu, Bogdan  
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    Kar, Gouri Sankar  
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    Clima, Sergiu  
    Journal article
    2012-08, ECS Solid State Letters, (1) 4, p.P63-P65
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    Atomistic investigation of the electronic structure, thermal properties and conduction defects in Ge-rich GexSe1-x materials for selector applications

    Clima, Sergiu  
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    Govoreanu, Bogdan  
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    Opsomer, Karl  
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    Velea, Alin
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    Avasarala, Naga Sruti
    Proceedings paper
    2017, IEEE International Electron Devices Meeting - IEDM, 2/12/2017, p.79-82
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    Back-hopping in spin transfer torque switching of perpendicularly magnetized tunnel junctions

    Devolder, Thibaut
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    Bultynck, Olivier  
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    Bouquin, Paul  
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    Nguyen, Van Dai  
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    Rao, Siddharth  
    Journal article
    2020, Physical Review B, (102) 18, p.184406
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