Browsing by Author "Larcher, Luca"

A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations

A sensitivity map-based approach to profile defects in MIM capacitors from I-V, C-V and G-V measurements

Defect spectroscopy from electrical measurements: a simulation based technique

Device-to-Materials Pathway for Electron Traps Detection in Amorphous GeSe-Based Selectors

Electron trapping in ferroelectric HfO2

Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliability

Experimental assessment of electrons and holes in erase transient of TANOS and TANVaS memories

Extraction of the defect distributions in DRAM capacitor using I–V and C–V sensitivity maps

Low leakage stoichiometric SrTiO3 dielectric for advanced metal-insulator-metal capacitors

Probing defects generation during stress in high- $j/metal gate FinFETs by random telegraph noise characterization

Role of holes and electrons during erase of TANOS memories: evidence for dipole formation and its impact on reliability

Scaling perspective and reliability of conductive filament formation in ultra-scaled HfO2 resistive random access memory

SrTiO3 for sub-20 nm DRAM technology nodes – characterization and modeling

SrTiOx for sub-20 nm DRAM technology nodes - characterization and modeling

Standards for the Characterization of Endurance in Resistive Switching Devices

Understanding and variability of lateral charge migration in 3D CT-NAND flash with and without band-gap engineered barriers