Browsing by Author "Li, Kan"

3-D Full-Band Monte Carlo Simulation of Hot-Electron Energy Distributions in Gate-All-Around Si Nanowire MOSFETs

Impacts of Through-Silicon Vias on Total-Ionizing-Dose Effects and Low-Frequency Noise in FinFETs

Impacts of through-silicon vias on total-ionizing-dose effects and low-frequency noise in FinFETs

Low-Frequency Noise and Border Traps in Irradiated nMOS and pMOS Bulk Si FinFETs With SiO2/HfO2 Gate Dielectrics

Negative Bias-Temperature Instabilities and Low-Frequency Noise in Ge FinFETs

Negative-Bias-Stress and Total-Ionizing-Dose Effects in Deeply Scaled Ge-GAA Nanowire pFETs

Single-event induced charge collection in Ge-channel pMos FinFETs

Single-Event-Induced Charge Collection in Ge-Channel pMOS FinFETs

Total-Ionizing-Dose Effects in IGZO Thin-Film Transistors