Browsing by Author "Makarov, A."
Now showing 1 - 7 of 7
- Results Per Page
- Sort Options
Publication A drift-diffusion-based analytic description of the energy distribution function for hot-carrier degradation in decananometer NMOSFETs
Proceedings paper2016, 46th European Solid-State Device Research Conference - ESSDERC, 12/09/2016, p.428-431Publication Hot-carrier degradation in FinFETs: modeling, peculiarities, and impact of device topology
Proceedings paper2017, IEEE International Electron Devices Meeting - IEDM, 2/12/2017, p.310-313Publication Modeling the effect of random dopants on hot-carrier degradation in FinFETs
Proceedings paper2019, 2019 IEEE International Reliability Physics Symposium (IRPS), 31/03/2019, p.1-7Publication Physical Modeling the Impact of Self-Heating on Hot-Carrier Degradation in pNWFETs
Proceedings paper2020, IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA), JUL 20-23, 2020Publication Physics-based modeling of hot-carrier degradation in Ge NWFETs
Proceedings paper2019, International Conference on Solid-State Devices and Materials - SSDM, 2/09/2019, p.565-566Publication Simulation study: the effect of random dopants and random traps on hot-carrier degration in nFinFETs
Proceedings paper2020, International Conference on Solid-State Devices and Materials - SSDM, 2/09/2019, p.609-610Publication The impact of self-heating and its implications on hot-carrier degradation-A modeling study
Journal article2021, MICROELECTRONICS RELIABILITY, (122) 1