Browsing by Author "Martin Hoyas, Ana"
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Publication A novel approach to characterise a low-k dielectric polymer surface
Proceedings paper2002, 2nd International Symposium on Polymers Surface Characterization, 11/11/2002Publication A novel approach to characterization of a low-k dielectric polymer surface
;Martin Hoyas, Ana ;Schuhmacher, Jorg ;Whelan, Caroline ;Baklanov, MikhaïlCarbonell, LaureOral presentation2002, Ph.D. SymposiumPublication Alkaline cleaning of silicon wafers: additives for the prevention of metal contamination
Journal article1999, Microelectronic Engineering, (45) 2_3, p.197-208Publication Atomic layer deposited barriers for copper interconnects
Meeting abstract2004, AVS 51 International Symposium, 14/11/2004, p.TF-MoM1Publication Atomic layer deposition of barriers for interconnect
;Besling, Wim ;Satta, Alessandra ;Schuhmacher, Jörg ;Abell, ThomasSutcliffe, VictorProceedings paper2002, Proceedings of the IEEE International Interconnect Technology Conference, 3/06/2002, p.288-291Publication Characterization of ALD diffusion barrier on low-k dielectric polymer by contact angle measurements
Oral presentation2002, New Trends in Applied Surface SciencePublication Characterization of atomic layer deposited nanoscale structure on dense dielectric substrates by X-ray reflectivity
;Travaly, Youssef ;Schuhmacher, J. ;Martin Hoyas, Ana ;Abell, T. ;Sutcliffe, VicJonas, M.Journal article2005, Microelectronic Engineering, (82) 3_4, p.639-644Publication Characterization of the growth of atomic layer deposited WNxCy films on various substrates
;Martin Hoyas, Ana ;Travaly, Youssef ;Schuhmacher, Jorg ;Sajavaara, TimoWhelan, CarolineOral presentation2005, AVS 2005Publication Effect of plasma treatments on a low-k dielectric polymer surface
;Martin Hoyas, Ana ;Schuhmacher, Jorg ;Whelan, Caroline ;Baklanov, MikhaïlCarbonell, LaureJournal article2005, Journal of Vacuum Science Technology B, (23) 4, p.1551-1557Publication Growth and characterization of atomic layer deposited WC0.7N0.3 on polymer films
;Martin Hoyas, Ana ;Schuhmacher, Jorg ;Shamiryan, Denis ;Waeterloos, JoostBesling, W.Journal article2004, Journal of Applied Physics, (95) 1, p.381-388Publication Growth and characterization of atomic layer deposited WCxNy
;Martin Hoyas, Ana ;Travaly, Youssef ;Schuhmacher, Jorg ;Sajavaara, T.Whelan, CarolineOral presentation2005, AVS 5th International Conference on Microelectronics and Interfaces (ICMI)Publication Implementation of atomic layer deposition in advanced semiconductor processes
Meeting abstract2005, Meeting Abstracts Electrochamical Society Fall Meeting, 16/10/2005, p.451Publication Interface characterization of nanoscale laminate structures on dense dielectric substrates by X-ray reflectivity
Journal article2005-04, Journal of Applied Physics, (97) 8, p.84316Publication Interface characterization of nanoscale laminate structures on dense dielectric substrates by x-ray reflectivity
Journal article2005-04, Virtual Journal of Nanoscale Science and Technology, (11) 16Publication Plasma sealing of a low-k dielectric polymer
Journal article2004, Microelectronic Engineering, (76) 1_4, p.32-37Publication Plasma treatments of a low-k dielectric polymer surface
Meeting abstract2003, International Scientific Meeting Belgian Physical Society, 27/05/2003, p.SS2