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Browsing by Author "Martin Hoyas, Ana"

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    A novel approach to characterise a low-k dielectric polymer surface

    Martin Hoyas, Ana
    ;
    Schuhmacher, Jorg
    ;
    Le, Quoc Toan  
    ;
    Whelan, Caroline
    ;
    Schaekers, Marc  
    Proceedings paper
    2002, 2nd International Symposium on Polymers Surface Characterization, 11/11/2002
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    A novel approach to characterization of a low-k dielectric polymer surface

    Martin Hoyas, Ana
    ;
    Schuhmacher, Jorg
    ;
    Whelan, Caroline
    ;
    Baklanov, Mikhaïl
    ;
    Carbonell, Laure
    Oral presentation
    2002, Ph.D. Symposium
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    Alkaline cleaning of silicon wafers: additives for the prevention of metal contamination

    Martin Hoyas, Ana
    ;
    Baeyens, Martien
    ;
    Hub, W.
    ;
    Mertens, Paul  
    ;
    Kolbesen, B. O.
    Journal article
    1999, Microelectronic Engineering, (45) 2_3, p.197-208
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    Atomic layer deposited barriers for copper interconnects

    Schuhmacher, Jorg
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    Martin Hoyas, Ana
    ;
    Ernur, Didem  
    ;
    Tokei, Zsolt  
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    Travaly, Youssef
    Meeting abstract
    2004, AVS 51 International Symposium, 14/11/2004, p.TF-MoM1
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    Atomic layer deposition of barriers for interconnect

    Besling, Wim
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    Satta, Alessandra
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    Schuhmacher, Jörg
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    Abell, Thomas
    ;
    Sutcliffe, Victor
    Proceedings paper
    2002, Proceedings of the IEEE International Interconnect Technology Conference, 3/06/2002, p.288-291
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    Atomic-layer deposited barrier and seed layers for interconnects

    Schuhmacher, Jorg
    ;
    Martin Hoyas, Ana
    ;
    Satta, Alessandra
    ;
    Maex, Karen  
    Book chapter
    2005
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    Characterization of ALD diffusion barrier on low-k dielectric polymer by contact angle measurements

    Martin Hoyas, Ana
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    Schuhmacher, Jorg
    ;
    Celis, Jean-Pierre
    ;
    Maex, Karen  
    Oral presentation
    2002, New Trends in Applied Surface Science
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    Characterization of atomic layer deposited nanoscale structure on dense dielectric substrates by X-ray reflectivity

    Travaly, Youssef
    ;
    Schuhmacher, J.
    ;
    Martin Hoyas, Ana
    ;
    Abell, T.
    ;
    Sutcliffe, Vic
    ;
    Jonas, M.
    Journal article
    2005, Microelectronic Engineering, (82) 3_4, p.639-644
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    Characterization of the growth of atomic layer deposited WNxCy films on various substrates

    Martin Hoyas, Ana
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    Travaly, Youssef
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    Schuhmacher, Jorg
    ;
    Sajavaara, Timo
    ;
    Whelan, Caroline
    Oral presentation
    2005, AVS 2005
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    Effect of plasma treatments on a low-k dielectric polymer surface

    Martin Hoyas, Ana
    ;
    Schuhmacher, Jorg
    ;
    Whelan, Caroline
    ;
    Baklanov, Mikhaïl
    ;
    Carbonell, Laure
    Journal article
    2005, Journal of Vacuum Science Technology B, (23) 4, p.1551-1557
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    Growth and characterization of atomic layer deposited WC0.7N0.3 on polymer films

    Martin Hoyas, Ana
    ;
    Schuhmacher, Jorg
    ;
    Shamiryan, Denis
    ;
    Waeterloos, Joost
    ;
    Besling, W.
    Journal article
    2004, Journal of Applied Physics, (95) 1, p.381-388
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    Growth and characterization of atomic layer deposited WCxNy

    Martin Hoyas, Ana
    ;
    Travaly, Youssef
    ;
    Schuhmacher, Jorg
    ;
    Sajavaara, T.
    ;
    Whelan, Caroline
    Oral presentation
    2005, AVS 5th International Conference on Microelectronics and Interfaces (ICMI)
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    Implementation of atomic layer deposition in advanced semiconductor processes

    Schaekers, Marc  
    ;
    Van Ammel, Annemie  
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    Schuhmacher, Jorg
    ;
    Delabie, Annelies  
    ;
    Martin Hoyas, Ana
    Meeting abstract
    2005, Meeting Abstracts Electrochamical Society Fall Meeting, 16/10/2005, p.451
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    Interface characterization of nanoscale laminate structures on dense dielectric substrates by X-ray reflectivity

    Travaly, Youssef
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    Schuhmacher, Jorg
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    Martin Hoyas, Ana
    ;
    Van Hove, Marleen
    ;
    Maex, Karen  
    Journal article
    2005-04, Journal of Applied Physics, (97) 8, p.84316
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    Interface characterization of nanoscale laminate structures on dense dielectric substrates by x-ray reflectivity

    Travaly, Youssef
    ;
    Schuhmacher, Jorg
    ;
    Martin Hoyas, Ana
    ;
    Van Hove, Marleen
    ;
    Maex, Karen  
    Journal article
    2005-04, Virtual Journal of Nanoscale Science and Technology, (11) 16
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    Plasma sealing of a low-k dielectric polymer

    Martin Hoyas, Ana
    ;
    Schuhmacher, Jorg
    ;
    Whelan, Caroline
    ;
    Celis, Jean-Pierre
    ;
    Maex, Karen  
    Journal article
    2004, Microelectronic Engineering, (76) 1_4, p.32-37
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    Plasma treatments of a low-k dielectric polymer surface

    Martin Hoyas, Ana
    ;
    Schuhmacher, Jörg
    ;
    Whelan, Caroline
    ;
    Schaekers, Marc  
    ;
    Celis, Jean-Pierre
    Meeting abstract
    2003, International Scientific Meeting Belgian Physical Society, 27/05/2003, p.SS2
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    Thermal desorption spectrometry as a method of analysis for advanced interconnect materials

    Carbonell, Laure
    ;
    Martin Hoyas, Ana
    ;
    Whelan, Caroline
    ;
    Vereecke, Guy  
    Book chapter
    2005

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