Browsing by Author "Martin-Martinez, Javier"

A conductive AFM nanoscale analysis of NBTI and channel hot-carriers degradation in MOSFETs

An equivalent circuit model for the recovery component of BTI

Challenges and solutions to the defect-centric modeling and circuit simulation of time-dependent variability

Channel hot-carriers degradation in MOSFETs: A conductive AFM study at the nanoscale

Channel-hot-carrier degradation of strained MOSFETs: a device level and nanoscale combined approach

Circuit design-oriented stochastic piecewise modeling of the postbreakdown gate current in MOSFETs: application to ring oscilators

Circuit-design oriented modelling of the recovery BTI component and post-BD gate currents

NBTI from the perspective of defect states with widely distributed time scales

Negative bias temperature instability in devices with millisecond annealed ultra-shallow junctions

Probabilistic defect occupancy model for NBTI

Statistical threshold voltage shifts caused by BTI and HCI at nominal and accelerated conditions

Stochastic piecewise modeling of post-BD gate current oriented to circuit design

Ubiquitous relaxation in BTI stressing - new evaluation and insights