Browsing by Author "Mukherjee, Kalparupa"
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Publication Analysis of threshold voltage instabilities in semi-vertical GaN-on-Si FETs
Journal article2020, Applied Physics Express, (13) 2, p.24004Publication Challenges and Perspectives for Vertical GaN-on-Si Trench MOS Reliability: From Leakage Current Analysis to Gate Stack Optimization
Journal article review2021, MATERIALS, (14) 9, p.2316Publication Demonstration of Bilayer Gate Insulator for Improved Reliability in GaN-on-Si Vertical Transistors
Publication Modeling of gate capacitance of GaN-based trench-gate vertical metal-oxide-semiconductor devices
; ; ; Journal article2020, Applied Physics Express, (13) 2, p.24006Publication Root cause analysis of gate shorts in semi-vertical GaN MOSFET devices
Publication Threshold voltage variations in semi-vertical GaN-on-Si FETs: A comprehensive study
Meeting abstract2019, 13th International Conference on Nitride Semiconductors 2019 (ICNS-13), 7/07/2019Publication Understanding the Leakage Mechanisms and Breakdown Limits of Vertical GaN-on-Si p(+)n(-)n Diodes: The Road to Reliable Vertical MOSFETs
Journal article2021, MICROMACHINES, (12) 4, p.445Publication Use of bilayer gate insulator in GaN-on-Si vertical trench MOSFETs: Impact on performance and reliability
Journal article2020, Materials, (13) 21, p.4740Publication Vertical GaN devices: Process and reliability
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