Browsing by Author "Pace, C."

1/f Noise in drain and gate current of MOSFETs with high-k gate stacks

A model for MOS gate stack quality evaluation based on the gate current 1/f noise

Analytical model for the 1/f noise in the tunneling current through metal-oxide-semiconductor structures

Characterization of interface and oxide traps in Ge pMOSFETs based on DCIV technique

Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks

Matching performance of FinFET devices with fin widths down to 10nm

Modeling the gate current 1/f noise and its application to advanced CMOS devices

On the dc and noise properties of the gate current in epitaxial Ge p-channel metal oxide semiconductor field effect transistors with TiN/TaN/HfO2/SiO2 gate stack

Positive bias temperature instability in nMOSFETs with ultra-thin Hf-silicate gate dielectrics

The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks

The role of the interfaces in the 1/f noise of MOSFETs with high-k gate stacks

Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs