Browsing by Author "Reed, Robert"

Capacitance-frequency estimates of border-trap densities in multi-fin MOS capacitors

Charge collection mechanisms of Ge-channel bulk pMOSFETs

Effects of negative-bias-temperature-instability on low-frequency noise in SiGe p MOSFETs

Electrical effect of a single extended defect in MOSFETs: a simulation study

Gate bias and length dependences of total-ionizing-dose effects in InGaAs FinFETs on bulk Si

Geometry dependence of total dose effects in bulk FINFETs

Impacts of through-silicon vias on total-ionizing-dose effects and low-frequency noise in FinFETs

Low-frequency Noise and Defects in Copper and Ruthenium Resistors

On the assessment of electrically active defects in high-mobility materials and devices

Radiation effects in advanced multiple-gate and silicon-on-insulator transistors

Single event transient response of vertical and lateral waveguide-integrated germanium photodiodes

Single-event induced charge collection in Ge-channel pMos FinFETs

Total ionizing dose effects on strained Ge pMOS FinFETs on bulk Si

Total ionizing dose effects on ultra thin buried oxide floating body memories

X-Ray and proton radiation effects on 40 nm CMOS physically unclonable function devices