Browsing by Author "Rodriguez, R."

Aging mechanisms in strained Si/high-k based pMOS transistors. Implications in CMOS circuits

Channel hot-carrier degradation on strained MOSFETs with embedded SiGe or SiC source/drain

Characterization and SPICE modeling of the CHC related time-dependent variability in strained and unstrained pMOSFETs

CHC degradation of strained devices based on SiON and high-k gate dielectric materials

NBTI related time-dependent variability of mobility and threshold voltage in pMOSFETs and their impact on circuit performance

Processing dependences of channel hot-carrier degradation on strained-S- p-channel metal-oxide semiconductor field-effect transistors

Resistive switching-like behaviour of the dielectric breakdown in ultra-thin Hf based gate stacks in mosfets

SPICE modelling of hot-carrier degradation in Si1-xGex S/D and HfSiON based pMOS transistors