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Browsing by Author "Rothschild, Aude"

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    45nm LSTP FET with FUSI gate on PVD-HfO2 with excellent drivability by advanced PDA treatment

    Mitsuhashi, Riichirou
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    Yamamoto, Kazuhiko
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    Hayashi, S.
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    Rothschild, Aude
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    Kubicek, Stefan  
    Journal article
    2005, Microelectronic Engineering, 80, p.7-10
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    A deep level transient spectroscopy comparison of the SiO2/Si and Al2O3/Si interface states

    Simoen, Eddy  
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    Rothschild, Aude
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    Vermang, Bart  
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    Poortmans, Jef  
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    Mertens, Robert  
    Meeting abstract
    2011, 220th ECS Fall Meeting, 9/10/2011, p.1989
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    A deep level transient spectroscopy comparison of the SiO2/Si and Al2O3/Si interface states

    Simoen, Eddy  
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    Rothschild, Aude
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    Vermang, Bart  
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    Poortmans, Jef  
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    Mertens, Robert  
    Proceedings paper
    2011, Photovoltaics for the 21st Century 7, 9/10/2011, p.37-44
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    Achieving 9ps unloaded ring oscillator delay in FuSI/HfSiON with 0.8 nm EOT

    Rothschild, Aude
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    Shi, Xiaoping
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    Everaert, Jean-Luc
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    Kerner, Christoph  
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    Chiarella, Thomas  
    Proceedings paper
    2007, Symposium on VLSI Technology. Digest of Technical Papers, 14/06/2007, p.198-199
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    Addressing key concerns for implementation of Ni FUSI into manufacturing for 45/32 nm CMOS

    Shickova, Adelina
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    Kauerauf, Thomas
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    Rothschild, Aude
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    Aoulaiche, Marc
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    Sahhaf, Sahar  
    Proceedings paper
    2007, Symposium on VLSI. Technology Digest of Technical Papers, 14/06/2007, p.158-159
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    Al2O3 surface passivation : electrical characterization using the Quantox tool

    Rothschild, Aude
    ;
    Nishibe, Nishibe
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    Cui, Jianli
    ;
    Zhu, Nanchang
    ;
    Debucquoy, Maarten  
    Proceedings paper
    2011, 37th IEEE Photovoltaic Specialists Conference - PVSC, 19/06/2011
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    ALD Al2O3 for industrial Si solar cells: advanced cleaning and in-depth characterization

    Vermang, Bart  
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    Rothschild, Aude
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    Loozen, Xavier
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    Bearda, Twan
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    Cornagliotti, Emanuele  
    Meeting abstract
    2010, 35th IEEE Photovoltaic Specialists Conference, 20/06/2010
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    ALD Al2O3 for surface passivation of silicon solar cells: impact of covering metal

    Loozen, Xavier
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    O'Sullivan, Barry  
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    Rothschild, Aude
    ;
    Vermang, Bart  
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    John, Joachim  
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    Poortmans, Jef  
    Proceedings paper
    2010, 10th International Conference on Atomic Layer Deposition, 20/06/2010, p.80
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    ALD-Al2O3 passivation for solar cells : high temperature stability

    Rothschild, Aude
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    Penaud, Julien
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    Jaffrennou, Périne
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    Wostyn, Kurt  
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    Vermang, Bart  
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    John, Joachim  
    Proceedings paper
    2011, 26th European Photovoltaic Solar Energy Conference - EU PVSEC, 5/09/2011, p.2273-2275
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    ALD-Al2O3 passivation for solar cells: charge investigation

    Rothschild, Aude
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    Vermang, Bart  
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    Loozen, Xavier
    ;
    O'Sullivan, Barry  
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    John, Joachim  
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    Poortmans, Jef  
    Proceedings paper
    2010, 25th European Photovoltaic Solar Energy Conference and Exhibition - EPVSEC, 6/09/2010, p.1382-1385
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    Atomic layer deposition of Al2O3 as rear surface passivation for p-type Si passivated emitter and rear cells: an overview

    Vermang, Bart  
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    Goverde, Hans
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    Cornagliotti, Emanuele  
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    Prajapati, Victor
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    Simoen, Eddy  
    Oral presentation
    2012, IEEE Photovoltaic Specialists Conference - PVSC
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    Atomic layer deposition of Al2O3 for industrial local Al back-surface field (BSF) solar cells

    Rothschild, Aude
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    Vermang, Bart  
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    Goverde, Hans
    Journal article
    2011, Photovoltaics International. The Technology Resource for PV Professionals, 13, p.92-101
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    Band edge work function metal gates using PEALD TaCN electrodes

    Maes, Jan  
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    Swerts, Johan  
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    Pierreux, Dieter  
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    Machkaoutsan, Vladimir  
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    Marcus, Steven
    Oral presentation
    2009, 9th International Conference on Atomic Layer Deposition - ALD
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    Blistering in ALD Al2O3 passivation layers as rear contacting for local Al BSF Si solar cells

    Vermang, Bart  
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    Goverde, Hans
    ;
    Uruena De Castro, Angel
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    Lorenz, Anne
    ;
    Cornagliotti, Emanuele  
    Journal article
    2012, Solar Energy Materials and Solar Cells, 101, p.204-209
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    Challenges in scaling of CMOS devices towards 65nm node

    Jurczak, Gosia  
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    Veloso, Anabela  
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    Rooyackers, Rita
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    Augendre, Emmanuel
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    Mertens, Sofie  
    Proceedings paper
    2003-06, Diagnostic and Yield, 23/06/2003
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    Characterization of high-throughput spatial ALD Al2O3 as surface passivation for industrial local Al BSF Si solar cells

    Vermang, Bart  
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    Goverde, Hans
    ;
    Rothschild, Aude
    ;
    John, Joachim  
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    Poortmans, Jef  
    ;
    Mertens, Robert  
    Proceedings paper
    2011, 26th European Photovoltaic Solar Energy Conference and Exhibition - EU PVSEC, 5/09/2011, p.2189-2190
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    Cost effective low Vt Ni-FUSI CMOS on SiON by means of Al implant (pMOS) and Yb+P implant (nMOS)

    Lauwers, Anne  
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    Veloso, Anabela  
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    Chang, Shou-Zen
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    Yu, HongYu
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    Hoffmann, Thomas Y.
    Journal article
    2008, IEEE Electron Device Letters, (29) 1, p.34-37
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    Current status and addressing the challenges of Hf-based gate stack toward 45nm-LSTP application

    Niwa, Masaaki
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    Mitsuhashi, Riichirou
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    Yamamoto, K.
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    Hayashi, S.
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    Harada, Yoshinao
    Proceedings paper
    2005-10, Extended Abstracts of the International Conference on Solid State Devices and Materials - SSDM, 13/09/2005, p.6-7
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    Effect of top dielectric morphology and gate material on the performance of nitride-based FLASH memory cells

    Cacciato, Antonio
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    Breuil, Laurent  
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    Van den Bosch, Geert  
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    Richard, Olivier  
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    Rothschild, Aude
    Proceedings paper
    2008, Materials Science and Technology for Nonvolatile Memories, 24/03/2008, p.1071-F02-08
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    Evolutionary process development towards next generation crystalline silicon solar cells: A semiconductor process toolbox application

    John, Joachim  
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    Prajapati, Victor
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    Vermang, Bart  
    ;
    Lorenz, Anne
    ;
    Allebe, Christophe
    Journal article
    2012, EPJ Photovoltaics, 3, p.35005
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