Browsing by Author "Russ, Christian"

A compact model for the grounded-gate nMOS behaviour under CDM ESD stress

A compact model for the grounded-gate nMOS transistor behaviour under CDM ESD stress

A quantitative inquisition into ESD sensitivity to strain in nanoscale CMOS protection devices

Analysis of HBM ESD testers and specifications using a fourth order lumped element model

Characterization and optimization of sub-32nm FinFET devices for ESD applications

Design methodology for FinFET GG-NMOS ESD protecction devices

Design methodology of FinFET devices that meet IC-level HBM ESD targets

Electrical and thermal scaling trends for SOI FinFET ESD design

Electrical-based ESD characterization methodology for ultrathin body SOI MOSFETs

Electrothermal device simulation of a gg-nMOSt under HBM ESD conditions

ESD protection elements during HBM stress tests - further numerical and experimental results

ESD Protection Elements during HBM Stress Tests - Further Numerical and Experimental Results

ESD protection elements during HBM stress tests - further numerical and experimental results

ESD-aspects of FinFETs and other most advanced devices

Grounded-gate nMOS transistor behaviour under CDM ESD stress conditions

Influence of well profile and gate length on the ESD performance of a fully silicided 0.25 μm CMOS technology

Justifications for reducing HBM and MM ESD qualification test time

Methodology for design optimization of SOI FinFET grounded-gate NMOS devices

Next generation bulk FinFET devices and their benefits for ESD robustness

Next generation FinFET devices in bulk silicon technology and their benefits for ESD robustness