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Browsing by Author "Shi, Yuanyuan"

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    Advanced Data Encryption using 2D Materials

    Wen, Chao
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    Li, Xuehua
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    Zanotti, Tommaso
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    Puglisi, Francesco Maria
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    Shi, Yuanyuan  
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    Saiz, Fernan
    Journal article
    2021, ADVANCED MATERIALS, (33) 27
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    ALD Encapsulation of CVD WS2 for Stable and High-Performance FET Devices

    Wu, Xiangyu  
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    Lin, Dennis  
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    Cott, Daire  
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    De Marneffe, Jean-Francois
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    Groven, Benjamin  
    Proceedings paper
    2021, 5th IEEE Electron Devices Technology and Manufacturing Conference (EDTM), APR 08-11, 2021
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    Chemical Vapor Deposition of a Single-Crystalline MoS2 Monolayer through Anisotropic 2D Crystal Growth on Stepped Sapphire Surface

    Kandybka, Iryna  
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    Groven, Benjamin  
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    Medina Silva, Henry  
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    Sergeant, Stefanie  
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    Nalin Mehta, Ankit  
    Journal article
    2024, ACS NANO, (18) 4, p.3173-3186
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    Conductivity Enhancement in Transition Metal Dichalcogenides: A Complex Water Intercalation and Desorption Mechanism

    Serron, Jill  
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    Minj, Albert  
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    Spampinato, Valentina  
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    Franquet, Alexis  
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    Rybalchenko, Yevhenii  
    Journal article
    2023-05-17, ACS APPLIED MATERIALS & INTERFACES, (15) 21, p.26175-26189
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    Correlated Intrinsic Electrical and Chemical Properties of Epitaxial WS2 via Combined C-AFM and ToF-SIMS Characterization

    Spampinato, Valentina  
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    Shi, Yuanyuan
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    Serron, Jill  
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    Minj, Albert  
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    Groven, Benjamin  
    Journal article
    2023, ADVANCED MATERIALS INTERFACES, (10) 7, p.Art. 2202016
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    Dual gate synthetic MoS2 MOSFETs with 4.56 mu F/cm(2) channel capacitance, 320 mu S/mu m Gm and 420 mu A/mu m Id at 1V Vd/100nm Lg

    Wu, Xiangyu  
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    Cott, Daire  
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    Lin, Zaoyang  
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    Shi, Yuanyuan  
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    Groven, Benjamin  
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    Morin, Pierre  
    Proceedings paper
    2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021
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    Engineering wafer-scale epitaxial two-dimensional materials for advanced high-performance nanoelectronics

    Shi, Yuanyuan  
    Meeting abstract
    2021, Graphene and 2DM online conference 2021, 20/04/2021
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    Engineering Wafer-Scale Epitaxial Two-Dimensional Materials through Sapphire Template Screening for Advanced High-Performance Nanoelectronics

    Shi, Yuanyuan  
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    Groven, Benjamin  
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    Serron, Jill  
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    Wu, Xiangyu  
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    Nalin Mehta, Ankit  
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    Minj, Albert  
    Journal article
    2021, ACS NANO, (15) 6, p.9482-9494
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    Extreme scaling enabled by MX2 transistors: variability challenges (invited)

    Smets, Quentin  
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    Arutchelvan, Goutham  
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    Schram, Tom  
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    Verreck, Devin  
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    Groven, Benjamin  
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    Cott, Daire  
    Proceedings paper
    2021, 26th Silicon Nanoelectronics Workshop, JUN 13, 2021, p.69-70
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    Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks

    Maldonado, D.
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    Roldan, J. B.
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    Roldan, A. M.
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    Jimenez-Molinos, F.
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    Hui, F.
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    Jing, Xu
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    Wen, C.
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    Lanza, M.
    Proceedings paper
    2020, IEEE International Reliability Physics Symposium (IRPS), APR 28-MAY 30, 2020
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    Minimizing the Interface-Driven Losses in Inverted Perovskite Solar Cells and Modules

    Zhang, Xin
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    Qiu, Weiming  
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    Apergi, Sofia
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    Singh, Shivam
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    Marchezi, Paulo
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    Song, Wenya  
    Journal article
    2023, ACS ENERGY LETTERS, (8) 6, p.2532-2542
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    Reversible dielectric breakdown in h-BN stacks: a statistical study of the switching voltages

    Roldan, J. B.
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    Maldonado, D.
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    Jimenez-Molinos, F.
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    Acal, C.
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    Ruiz-Castro, J. E.
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    Aguilera, A. M.
    Proceedings paper
    2020, IEEE International Reliability Physics Symposium (IRPS), APR 28-MAY 30, 2020
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    Sources of variability in scaled MoS2 FETs

    Smets, Quentin  
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    Verreck, Devin  
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    Shi, Yuanyuan  
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    Arutchelvan, Goutham  
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    Groven, Benjamin  
    Proceedings paper
    2020, IEEE International Electron Devices Meeting (IEDM), DEC 12-18, 2020
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    Superior electrostatic control in uniform monolayer MoS2 scaled transistors via in-situ surface smoothening

    Shi, Yuanyuan  
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    Groven, Benjamin  
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    Smets, Quentin  
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    Sutar, Surajit  
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    Banerjee, Sreetama  
    Proceedings paper
    2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021
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    Temperature of Conductive Nanofilaments in Hexagonal Boron Nitride Based Memristors Showing Threshold Resistive Switching

    Lanza, Mario
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    Palumbo, Felix
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    Shi, Yuanyuan  
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    Aguirre, Fernando
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    Boyeras, Santiago
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    Yuan, Bin
    Journal article
    2022, ADVANCED ELECTRONIC MATERIALS, (8) 8, p.2100580
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    The sapphire surface structure and its impact on MOCVD grown wafer-scale MoS2 uniformity and MOSFET variability

    Shi, Yuanyuan  
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    Groven, Benjamin  
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    Serron, Jill  
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    Han, Han  
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    Banerjee, Sreetama  
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    Wu, Xiangyu  
    Oral presentation
    2019, IEEE International Electron Devices Meeting
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    Time series modeling of the cycle-to-cycle variability in h-BN based memristors

    Roldan, J. B.
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    Maldonado, D.
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    Alonso, F. J.
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    Roldan, A. M.
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    Hui, F.
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    Jimenez-Molinos, F.
    Proceedings paper
    2021, IEEE International Reliability Physics Symposium (IRPS), MAR 21-24, 2021
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    Top-Gate Stack Engineering Featuring a High-κ Gadolinium Aluminate Interfacial Layer for Field-Effect Transistors Based on Two-Dimensional Transition-Metal Dichalcogenides

    Lin, Zaoyang  
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    Wu, Xiangyu  
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    Cott, Daire  
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    Shi, Yuanyuan  
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    Medina Silva, Henry  
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    Sergeant, Stefanie  
    Journal article
    2024, ACS APPLIED ELECTRONIC MATERIALS, (6) 6, p.4213-4222

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