Browsing by Author "Shi, Yuanyuan"
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Publication Advanced Data Encryption using 2D Materials
Journal article2021, ADVANCED MATERIALS, (33) 27Publication ALD Encapsulation of CVD WS2 for Stable and High-Performance FET Devices
Proceedings paper2021, 5th IEEE Electron Devices Technology and Manufacturing Conference (EDTM), APR 08-11, 2021Publication Chemical Vapor Deposition of a Single-Crystalline MoS2 Monolayer through Anisotropic 2D Crystal Growth on Stepped Sapphire Surface
Journal article2024, ACS NANO, (18) 4, p.3173-3186Publication Conductivity Enhancement in Transition Metal Dichalcogenides: A Complex Water Intercalation and Desorption Mechanism
Journal article2023-05-17, ACS APPLIED MATERIALS & INTERFACES, (15) 21, p.26175-26189Publication Correlated Intrinsic Electrical and Chemical Properties of Epitaxial WS2 via Combined C-AFM and ToF-SIMS Characterization
Journal article2023, ADVANCED MATERIALS INTERFACES, (10) 7, p.Art. 2202016Publication Dual gate synthetic MoS2 MOSFETs with 4.56 mu F/cm(2) channel capacitance, 320 mu S/mu m Gm and 420 mu A/mu m Id at 1V Vd/100nm Lg
Proceedings paper2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021Publication Engineering Wafer-Scale Epitaxial Two-Dimensional Materials through Sapphire Template Screening for Advanced High-Performance Nanoelectronics
Journal article2021, ACS NANO, (15) 6, p.9482-9494Publication Extreme scaling enabled by MX2 transistors: variability challenges (invited)
; ; ; ; ; Proceedings paper2021, 26th Silicon Nanoelectronics Workshop, JUN 13, 2021, p.69-70Publication Influence of the magnetic field on dielectric breakdown in memristors based on h-BN stacks
;Maldonado, D. ;Roldan, J. B. ;Roldan, A. M. ;Jimenez-Molinos, F. ;Hui, F. ;Jing, Xu ;Wen, C.Lanza, M.Proceedings paper2020, IEEE International Reliability Physics Symposium (IRPS), APR 28-MAY 30, 2020Publication Minimizing the Interface-Driven Losses in Inverted Perovskite Solar Cells and Modules
Journal article2023, ACS ENERGY LETTERS, (8) 6, p.2532-2542Publication Reversible dielectric breakdown in h-BN stacks: a statistical study of the switching voltages
;Roldan, J. B. ;Maldonado, D. ;Jimenez-Molinos, F. ;Acal, C. ;Ruiz-Castro, J. E.Aguilera, A. M.Proceedings paper2020, IEEE International Reliability Physics Symposium (IRPS), APR 28-MAY 30, 2020Publication Sources of variability in scaled MoS2 FETs
Proceedings paper2020, IEEE International Electron Devices Meeting (IEDM), DEC 12-18, 2020Publication Superior electrostatic control in uniform monolayer MoS2 scaled transistors via in-situ surface smoothening
Proceedings paper2021, IEEE International Electron Devices Meeting (IEDM), DEC 11-16, 2021Publication Temperature of Conductive Nanofilaments in Hexagonal Boron Nitride Based Memristors Showing Threshold Resistive Switching
Journal article2022, ADVANCED ELECTRONIC MATERIALS, (8) 8, p.2100580Publication The sapphire surface structure and its impact on MOCVD grown wafer-scale MoS2 uniformity and MOSFET variability
Oral presentation2019, IEEE International Electron Devices MeetingPublication Time series modeling of the cycle-to-cycle variability in h-BN based memristors
;Roldan, J. B. ;Maldonado, D. ;Alonso, F. J. ;Roldan, A. M. ;Hui, F.Jimenez-Molinos, F.Proceedings paper2021, IEEE International Reliability Physics Symposium (IRPS), MAR 21-24, 2021Publication Top-Gate Stack Engineering Featuring a High-κ Gadolinium Aluminate Interfacial Layer for Field-Effect Transistors Based on Two-Dimensional Transition-Metal Dichalcogenides
Journal article2024, ACS APPLIED ELECTRONIC MATERIALS, (6) 6, p.4213-4222