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Browsing by Author "Snow, Jim"

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    Advanced wafer surface cleaning technology

    Mertens, Paul  
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    Vos, Rita  
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    Vereecke, Guy  
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    Arnauts, Sophia  
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    Bearda, Twan
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    De Waele, Rita
    Oral presentation
    2004, SEMICON Korea 2004 STS, S5: Contamination-free Manufacturing Seminar
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    All wet photoresist strip by solvent aerosol spray

    Wada, Masayuki
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    Sano, Ken-Ichi
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    Snow, Jim
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    Vos, Rita  
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    Leunissen, Peter
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    Mertens, Paul  
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    Eitoku, A
    Oral presentation
    2008, 9th International Symposium on Ultra Clean Processing of Semiconductor Surfaces - UCPSS
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    Application of porous low-k dielectrics and copper in microelectronics

    Le, Quoc Toan  
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    Baklanov, Mikhaïl
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    Claeys, Cor
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    Snow, Jim
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    Vanhaelemeersch, Serge  
    Oral presentation
    2005, Seminar on Micro-Nanotechnology
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    Application of single-wafer wet cleaning prior to epitaxial SiGe process

    Sano, Ken-Ichi
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    Wada, Masayuki
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    Leys, Frederik
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    Loo, Roger  
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    Hikavyy, Andriy  
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    Mertens, Paul  
    Journal article
    2009, Solid State Phenomena, 145-146, p.173-176
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    Cleaning of metal gate stacks for the sub 90nm technology node

    Kraus, Harald
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    Vermeyen, Kenneth
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    Snow, Jim
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    Fyen, Wim
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    Mertens, Paul  
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    Kovacs, Frederic
    Meeting abstract
    2003, 204th Meeting of the Electrochemical Society: 8th Int. Symp. on CLeaning Technology in Semiconductor Device Manufacturing, 12/10/2003
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    Cleaning of metal gate stacks for the sub 90nm technology node

    Snow, Jim
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    Kraus, Harald
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    Vermeyen, Kenneth
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    Fyen, Wim
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    Mertens, Paul  
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    Kovacs, Frederic
    Proceedings paper
    2004, Cleaning Technology in Semiconductor Device Manufacturing VIII. Proceedings of the International Symposium, 12/10/2003, p.393-399
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    Cleaning of nanoparticles in semiconductor manufacturing

    Vereecke, Guy  
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    Arnauts, Sophia  
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    Doumen, Geert  
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    Eitoku, Atsuro
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    Fransaer, J.
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    Fyen, Wim
    Oral presentation
    2004, BePCIS Seminar on Selected Topics in Nanotechnology
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    CMP-less integration of fully Ni-silicided metal gates in FinFETs by simultaneous silicidation of the source, drain, and the gate using a novel dual hard mask approach

    Kottantharayil, Anil
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    Verheyen, Peter  
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    Collaert, Nadine  
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    Dixit, Abhisek
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    Kaczer, Ben  
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    Snow, Jim
    Proceedings paper
    2005, Symposium on VLSI Technology. Digest of Technical Papers, 14/06/2005, p.198-199
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    Demonstration of recessed SiGe S/D and inserted metal gate on HfO2 for high performance pFETs

    Verheyen, Peter  
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    Eneman, Geert  
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    Rooyackers, Rita
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    Loo, Roger  
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    Eeckhout, Lieve
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    Rondas, Dirk  
    Proceedings paper
    2005-12, Technical Digest International Electron Devices Meeting (IEDM), 5/12/2005, p.907-910
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    Drying of hydrophobic surfaces - one of the keys for future technologies

    Kraus, Harald
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    Snow, Jim
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    Mertens, Paul  
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    Holsteyns, Frank  
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    Kenis, Karine  
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    Kovacs, F.
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    Fichtl, S.
    Meeting abstract
    2004, Advanced Semiconductor Manufacturing Conference - ASMC, 4/05/2004
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    Etching and cleaning of HfO2 deposited on Si

    Snow, Jim
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    Kraus, Harald
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    Van Doorne, Patrick
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    Mertens, Paul  
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    Kovacs, Fredi
    Proceedings paper
    2002-11, The 1st International Surface Cleaning Workshop, 11/11/2002
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    Etching of HfO2, deposited on LPCVD Si3N4, and cleaning of Hf residues

    Kraus, Harald
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    Snow, Jim
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    Van Doorne, Patrick
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    Mertens, Paul  
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    Kovacs, F.
    Oral presentation
    2003, Twelfth International Symposium on Semiconductor Manufacturing - ISSM
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    Evaluation of megasonic cleaning for sub-90-nm technologies

    Vereecke, Guy  
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    Holsteyns, Frank  
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    Arnauts, Sophia  
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    Kenis, Karine  
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    Lux, Marcel  
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    Vos, Rita  
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    Snow, Jim
    Oral presentation
    2004, 7th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS
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    Evaluation of megasonic cleaning for sub-90-nm technologies

    Vereecke, Guy  
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    Holsteyns, Frank  
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    Arnauts, Sophia  
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    Beckx, Stephan  
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    Jaenen, Patrick  
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    Kenis, Karine  
    Proceedings paper
    2005, Ultra Clean Processing of Silicon Surfaces VII: Proceedings of the 7th International Symposium, 20/09/2004, p.141-146
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    Germanium deep-submicron p-FET and n-FET devices, fabricated on germanium-on-insulator substrates

    Meuris, Marc  
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    De Jaeger, Brice  
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    Van Steenbergen, Jan  
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    Bonzom, Renaud
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    Caymax, Matty  
    Book chapter
    2007
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    Impact of galvanic corrosion on metal gate stacks

    Wada, Masayuki
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    Garaud, Sylvain
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    Ferain, Isabelle
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    Collaert, Nadine  
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    Sano, Ken-Ichi
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    Snow, Jim
    Oral presentation
    2008, 9th International Symposium on Ultra Clean Processing of Semiconductor Surfaces - UCPSS
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    Influence of hardware and chemistry on the removal of nano-particles in a megasonic cleaning tank

    Vereecke, Guy  
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    Vos, Rita  
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    Holsteyns, Frank  
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    Schmidt, M.O.
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    Baeyens, Martien
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    Gomme, Steven
    Proceedings paper
    2003, Ultra Clean Processing of Silicon Surfaces 2002 - UCPSS, 16/09/2002, p.143-147
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    Influences of oxide loss on contamination removal

    Eitoku, Atsuro
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    Snow, Jim
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    Vos, Rita  
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    Kenis, Karine  
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    Mertens, Paul  
    Oral presentation
    2004, 7th International Symposium on Ultra Clean Processing of Silicon Surfaces - UCPSS
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    Influences of oxide loss on contamination removal

    Eitoku, Atsuro
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    Snow, Jim
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    Vos, Rita  
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    Kenis, Karine  
    ;
    Mertens, Paul  
    Proceedings paper
    2005, Ultra Clean Processing of Silicon Surfaces VII: Proceedings of the 7th International Symposium, 20/09/2004, p.177-180
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    Integration challenges for multi-gate devices

    Collaert, Nadine  
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    Brus, Stephan  
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    De Keersgieter, An  
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    Dixit, Abhisek
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    Ferain, Isabelle
    Proceedings paper
    2005, Proceedings International Conference on IC Design and Technology - ICICDT, 9/05/2005, p.187-194
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