Browsing by Author "Stockman, Arno"

A physical-statistical approach to AlGaN/GaN HEMT reliability

Analytical model for the threshold voltage of p-(Al)GaN high-electron-mobility transistors

Comparison of copper electroplating, copper wet etching and linear sweep voltammetry as techniques to investigate the porosity of atomic layer deposited Al2O3

Differential variable base charge pumping (Delta-CP) for SiO2/SiC interface characterization

Dynamic-ron control via proton irradiation in AlGaN/GaN transistors

ESD-failure of E-mode GaN HEMTs: role of device geometry and charge trapping

Gate conduction mechanisms and lifetime modeling of p-gate AlGaN/GaN high-electron-mobility transistors

Impact of sidewall etching on the dynamic performance of GaN-on-Si E-mode transistors

On the origin of the leakage current in p-gate AlGaN/GaN HEMTs

Reliability assessment and lifetime modelling of p-GaN gate AlGaN/GaN high-electron-mobility transistors

Schottky Gate Induced Threshold Voltage Instabilities in p-GaN Gate AlGaN/GaN HEMTs

Temperature dependent substrate trapping in AlGaN/GaN power devices and the impact on dynamic ron

Threshold voltage instability mechanisms in p-GaN gate AlGaN/GaN HEMTs

μs-Range evaluation of threshold voltage instabilities of GaN-on-Si HEMTs with p-GaN gate