Browsing by Author "Tallarico, Andrea"

Field- and current-driven degradation of GaN-based power HEMTs with p-GaN gate: dependence on Mg-doping level

Gate reliability of p-GaN HEMT with gate metal retraction

Improving Time-Dependent Gate Breakdown of GaN HEMTs with p-type Gate

Investigation of the p-GaN gate breakdown in forward-biased GaN-based power HEMTs

PBTI in GaN-HEMT's with p-type gate: role of the aluminum content on DVtH and underlying degradation mechanisms

Role of the AlGaN barrier on the long-term gate reliability of power HEMTs

Statistical analysis of the impact of anode recess on the electrical characteristics of AlGaN/GaN Schottky diodes with gated edge termination

Understanding the degradation sources under ON-state stress in AlGaN/GaN-on-Si SBD: Investigation of the anode-cathode apacing length dependence