Browsing by Author "Van der Biest, O."
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Publication Antimony induced crystallization of amorphous silicon
Proceedings paper2005, Proceedings of the 20th European Photovoltaic Solar Energy Conference, 6/06/2005, p.1179-1181Publication Characterization of nano-laminate structure using grazing incidence XRD and ATR-FTIR
;Zhao, Chao; ; ; ;Cosnier, Vincent; Roebben, G.Proceedings paper2003, Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes, 27/04/2003, p.252-259Publication Crystallization and tetragonal-monoclinic transformation in ZrO2 and HfO2 dielectric thin films
Oral presentation2001, 7th European Ceramic Society; 9-13 September 2001; Brugge, Belgium.Publication Crystallization behaviour of ZrO2/Al2O3-based high-k gate stacks
Oral presentation2001, Symposium Q of the E-MRS Spring Meeting 2001: High-k Gate Dielectrics; June 5-8, 2001; Strasbourg, France.Publication Effect of Pb stoiciometry on switching behavior of sol-gel prepared PZT thin films
;Norga, Gerd ;Fè, Laura ;Wouters, Dirk ;Maes, J.Van der Biest, O.Oral presentation1999, MRS Fall Meeting Symposium Y: Ferroelectric Thin Films VIIIPublication In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction
Journal article2001, Microelectronics Reliability, (41) 7, p.995-998Publication In-situ high temperature study of ceramics and ceramic ultra-thin films using a X-ray diffractometer with a parabolic multilayer mirror
Oral presentation2001, 7th European Ceramic Society; 9-13 September 2001; Brugge, Belgium.Publication Influence of Pr doping and oxygen deficiency on the scattering behavior of YBa2Cu3 O7 thin films
;François, Isabel ;Jaekel, C. ;Kyas, G. ;Dierickx, D. ;Van der Biest, O.Heeres, Rob M.Journal article1996, Physical Review B, (53) 18, p.12502-12508Publication Localised Strain Characterization in Semiconductor Structures using Electron Diffraction Contrast Imaging
;Janssens, Koenraad ;Van der Biest, O. ;Vanhellemont, JanMaes, HermanProceedings paper1994, Joint Meeting of the Belgian and Dutch Societies for Electron Microscopy; December 1-2, 1994; Arnhem, The Netherlands., p.90-91Publication On the characterization of the strain field of lattice defects in silicon with nanometer resolution
;Janssens, Koenraad ;Van der Biest, O. ;Vanhellemont, JanMaes, HermanProceedings paper1994, Defect Recognition and Image Processing in Semiconductors and Devices; 6-10 Sept. 1993; Santander, Spain., p.22-24Publication Role of fluorite phase formation in the texture selection of sol-gel-prepared Pb(Zr1-x,Ti-x)O-3 films on Pt electrode layers
;Norga, Gerd ;Vasiliu, F. ;Fè, Laura ;Wouters, DirkVan der Biest, O.Journal article2003, Journal of Materials Research, (18) 5, p.1232-1238Publication Stabilization of amorphous structures in ALCVD high-k oxide layers
Oral presentation2001, IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference onPublication The role of TiO in the perovskite nucleation and (111) orientation selection in sol-gel PZT layers
;Vasiliu, F. ;Norga, G.J. ;Fe, L. ;Wouters, DirkVan der Biest, O.Journal article2003, Journal of Optoelectronics and Advanced Materials, (5) 3, p.777-785Publication Thermal stability of high k layers
Proceedings paper2003, Novel Materials and Processes for Advanced CMOS, 2/12/2002, p.9-14