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Browsing by Author "Van der Biest, O."

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    Antimony induced crystallization of amorphous silicon

    Wang, Y.
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    Van der Biest, O.
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    Gordon, Ivan  
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    Van Gestel, Dries
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    Beaucarne, Guy
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    Poortmans, Jef  
    Proceedings paper
    2005, Proceedings of the 20th European Photovoltaic Solar Energy Conference, 6/06/2005, p.1179-1181
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    Characterization of nano-laminate structure using grazing incidence XRD and ATR-FTIR

    Zhao, Chao
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    De Gendt, Stefan  
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    Caymax, Matty  
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    Heyns, Marc  
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    Cosnier, Vincent
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    Maes, Jan  
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    Roebben, G.
    Proceedings paper
    2003, Analytical and Diagnostic Techniques for Semiconductor Materials, Devices, and Processes, 27/04/2003, p.252-259
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    Crystallization and tetragonal-monoclinic transformation in ZrO2 and HfO2 dielectric thin films

    Zhao, Chao
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    Roebben, G.
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    Heyns, Marc  
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    Van der Biest, O.
    Oral presentation
    2001, 7th European Ceramic Society; 9-13 September 2001; Brugge, Belgium.
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    Crystallization behaviour of ZrO2/Al2O3-based high-k gate stacks

    Zhao, Chao
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    Richard, Olivier  
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    Bender, Hugo  
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    Houssa, Michel  
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    Carter, Richard
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    De Gendt, Stefan  
    Oral presentation
    2001, Symposium Q of the E-MRS Spring Meeting 2001: High-k Gate Dielectrics; June 5-8, 2001; Strasbourg, France.
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    Effect of Pb stoiciometry on switching behavior of sol-gel prepared PZT thin films

    Norga, Gerd
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    Fè, Laura
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    Wouters, Dirk
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    Maes, J.
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    Van der Biest, O.
    Oral presentation
    1999, MRS Fall Meeting Symposium Y: Ferroelectric Thin Films VIII
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    In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction

    Zhao, Chao
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    Roebben, G.
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    Bender, Hugo  
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    Young, Edward
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    Haukka, S.
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    Houssa, Michel  
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    Naili, Mohamed
    Journal article
    2001, Microelectronics Reliability, (41) 7, p.995-998
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    In-situ high temperature study of ceramics and ceramic ultra-thin films using a X-ray diffractometer with a parabolic multilayer mirror

    Roebben, G.
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    Zhao, Chao
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    Duan, R. G.
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    Vleugels, J.
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    Heyns, Marc  
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    Van der Biest, O.
    Oral presentation
    2001, 7th European Ceramic Society; 9-13 September 2001; Brugge, Belgium.
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    Influence of Pr doping and oxygen deficiency on the scattering behavior of YBa2Cu3 O7 thin films

    François, Isabel
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    Jaekel, C.
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    Kyas, G.
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    Dierickx, D.
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    Van der Biest, O.
    ;
    Heeres, Rob M.
    Journal article
    1996, Physical Review B, (53) 18, p.12502-12508
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    Localised Strain Characterization in Semiconductor Structures using Electron Diffraction Contrast Imaging

    Janssens, Koenraad
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    Van der Biest, O.
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    Vanhellemont, Jan
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    Maes, Herman
    Proceedings paper
    1994, Joint Meeting of the Belgian and Dutch Societies for Electron Microscopy; December 1-2, 1994; Arnhem, The Netherlands., p.90-91
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    On the characterization of the strain field of lattice defects in silicon with nanometer resolution

    Janssens, Koenraad
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    Van der Biest, O.
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    Vanhellemont, Jan
    ;
    Maes, Herman
    Proceedings paper
    1994, Defect Recognition and Image Processing in Semiconductors and Devices; 6-10 Sept. 1993; Santander, Spain., p.22-24
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    Role of fluorite phase formation in the texture selection of sol-gel-prepared Pb(Zr1-x,Ti-x)O-3 films on Pt electrode layers

    Norga, Gerd
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    Vasiliu, F.
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    Fè, Laura
    ;
    Wouters, Dirk
    ;
    Van der Biest, O.
    Journal article
    2003, Journal of Materials Research, (18) 5, p.1232-1238
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    Stabilization of amorphous structures in ALCVD high-k oxide layers

    Zhao, Chao
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    Richard, Olivier  
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    Bender, Hugo  
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    Young, Edward
    ;
    Carter, Richard
    ;
    Tsai, Wilman
    Oral presentation
    2001, IUVSTA 15th International Vacuum Congress (IVC-15), AVS 48th International Symposium (AVS-48), 11th International Conference on
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    The role of TiO in the perovskite nucleation and (111) orientation selection in sol-gel PZT layers

    Vasiliu, F.
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    Norga, G.J.
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    Fe, L.
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    Wouters, Dirk
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    Van der Biest, O.
    Journal article
    2003, Journal of Optoelectronics and Advanced Materials, (5) 3, p.777-785
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    Thermal stability of high k layers

    Zhao, Chao
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    Cosnier, V.
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    Chen, P.J.
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    Richard, Olivier  
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    Roebben, G.
    ;
    Maes, Jan  
    ;
    Van Elshocht, Sven  
    Proceedings paper
    2003, Novel Materials and Processes for Advanced CMOS, 2/12/2002, p.9-14

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