Browsing by Author "Wu, Lizhou"
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Publication Characterization and Fault Modeling of Intermediate State Defects in STT-MRAM
Proceedings paper2021, Design, Automation and Test in Europe Conference and Exhibition (DATE), FEB 01-05, 2021, p.1717-1722Publication Characterization, Modeling and Test of Synthetic Anti-Ferromagnet Flip Defect in STT-MRAMs
Proceedings paper2020, IEEE International Test Conference (ITC), NOV 03-05, 2020Publication Characterization, Modeling, and Test of Intermediate State Defects in STT-MRAMs
Journal article2022, IEEE TRANSACTIONS ON COMPUTERS, (71) 9, p.2219-2233Publication Defect and Fault Modeling Framework for STT-MRAM Testing
Journal article2021, IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING, (9) 2, p.707-723Publication Device-aware test: A new test approach towards DPPB
Proceedings paper2019-11, IEEE International Test Conference (ITC) 2019, 12/11/2019, p.1-10Publication Electrical modeling of STT-MRAM defects
Proceedings paper2018-11, IEEE International Test Conference - ITC, 28/10/2018, p.1-10Publication Impact of Magnetic Coupling and Density on STT-MRAM Performance
Proceedings paper2020, Design, Automation and Test in Europe Conference and Exhibition (DATE), MAR 09-13, 2020, p.1211-1216Publication MFA-MTJ Model: Magnetic-Field-Aware Compact Model of pMTJ for Robust STT-MRAM Design
Journal article2022-01-04, IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, (41) 11, p.4991-5004Publication Pinhole defect characterization and modeling for STT-MRAM testing
Proceedings paper2019-05, IEEE European Test Symposium (ETS) 2019, 27/05/2019, p.1-6Publication Special Session: STT-MRAMs: Technology, Design and Test
Proceedings paper2022-06-15, 40th IEEE VLSI Test Symposium (VTS), APR 25-27, 2022Publication Testing STT-MRAM: Manufacturing Defects, Fault Models, and Test Solutions
Proceedings paper2021, IEEE International Test Conference (ITC), OCT 10-15, 2021, p.143-152