Browsing by author "Tang, Baojun"
Now showing items 1-20 of 22
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Abnormal VTH/VFB shift caused by as-grown mobile charges in Al2O3 and its impacts on Flash memory cell operations
Tang, Baojun; Zhang, Weidong; Zhang, Jianfu; Van den Bosch, Geert; Govoreanu, Bogdan; Van Houdt, Jan (2011) -
As-grown donor-like traps in low-k dielectrics and their impact on intrinsic TDDB reliability
Tang, Baojun; Croes, Kristof; Barbarin, Yohan; Wang, Yunqi; Degraeve, Robin; Li, Yunlong; Toledano Luque, Maria; Kauerauf, Thomas; Boemmels, Juergen; Tokei, Zsolt; De Wolf, Ingrid (2014) -
Characterizing grain size and defect energy distribution in vertical SONOS poly-Si channels by means of a resistive network model
Degraeve, Robin; Toledano Luque, Maria; Arreghini, Antonio; Tang, Baojun; Capogreco, Elena; Lisoni, Judit; Roussel, Philippe; Kaczer, Ben; Van den Bosch, Geert; Groeseneken, Guido; Van Houdt, Jan (2013) -
Constant voltage electromigration for advanced BEOL copper interconnects
Tang, Baojun; Croes, Kristof; Jourdain, Anne; Boemmels, Juergen; Tokei, Zsolt; De Wolf, Ingrid; Wilcox, Eric; McMullen, Timothy (2015) -
Cu wire resistance improvement using Mn-based self-formed barriers
Siew, Yong Kong; Jourdan, Nicolas; Ciofi, Ivan; Croes, Kristof; Wilson, Chris; Tang, Baojun; Demuynck, Steven; Ai, Huang; Cellier, Daniel; Cockburn, Andrew; Boemmels, Juergen; Tokei, Zsolt (2014) -
Defects characterization of hybrid floating gate/ inter-gate dielectric interface in flash memory
Zahid, Mohammed; Degraeve, Robin; Tang, Baojun; Lisoni, Judit; Van den Bosch, Geert; Van Houdt, Jan; Breuil, Laurent; Blomme, Pieter; Arreghini, Antonio (2014) -
Direct etched Cu characterization for advanced interconnects
Wen, Liang Gong; Yamashita, Fumiko; Tang, Baojun; Croes, Kristof; Tahara, Shigeru; Shimoda, Keiichi; Maeshiro, Takeru; Nishimura, Eiichi; Lazzarino, Frederic; Ciofi, Ivan; Boemmels, Juergen; Tokei, Zsolt (2015) -
Evaluation and solutions for P/E window instability induced by electron trapping in high-k inter-gate dielectrics of flash memory cells
Tang, Baojun; Zhang, Weidong; Degraeve, Robin; Breuil, Laurent; Blomme, Pieter; Zhang, Jianfu; Ji, Zhigang; Zahid, Mohammed; Toledano Luque, Maria; Van den Bosch, Geert; Van Houdt, Jan (2014) -
Experimental evidence toward understanding charge pumping signals in 3-D devices with Poly-Si channel
Tang, Baojun; Zhang, Weidong; Toledano Luque, Maria; Zhang, Jianfu; Degraeve, Robin; Ji, Zhigang; Arreghini, Antonio; Van den Bosch, Geert; Van Houdt, Jan (2014) -
Experimental validation of electromigration by low frequency noise measurement for advanced interconnects application
Tang, Baojun; Croes, Kristof; Simoen, Eddy; Beyne, Sofie; Adelmann, Christoph; Tokei, Zsolt (2015) -
Novel bi-layer poly-silicon channel vertical flash cell for ultrahigh density 3D sonos nand technology
Kar, Gouri Sankar; Van den Bosch, Geert; Cacciato, Antonio; Blomme, Pieter; Arreghini, Antonio; Breuil, Laurent; De Keersgieter, An; Paraschiv, Vasile; Vrancken, Christa; Douhard, Bastien; Richard, Olivier; Debusschere, Ingrid; Van Houdt, Jan; Van Aerde, Steven; Tang, Baojun (2011) -
Optimization of gate stack parameters towards 3D-SONOS application
Breuil, Laurent; Van den Bosch, Geert; Cacciato, Antonio; Date, Lucien; Kar, Gouri Sankar; Tang, Baojun; Arreghini, Antonio; Debusschere, Ingrid; Van Houdt, Jan (2011) -
Optimization of inter-gate-dielectrics in hybrid float gate devices to reduce window instability during memory operations
Tang, Baojun; Zhang, Weidong; Breuil, Laurent; Robinson, Colin; Wang, Yunqi; Toledano Luque, Maria; Van den Bosch, Geert; Zhang, Jianfu; Van Houdt, Jan (2014) -
Read and pass disturbance in the programmed states of floating gate Flash memory cells with high- $j inter-poly gate dielectric stacks
Tang, Baojun; Robinson, Colin; Zhang, Weidong; Zhang, Fujian; Degraeve, Robin; Blomme, Pieter; Toledano Luque, Maria; Van den Bosch, Geert; Govoreanu, Bogdan; Van Houdt, Jan (2013-07) -
Spectroscopic study of polysilicon traps by means of fast capacitance transients
Toledano Luque, Maria; Tang, Baojun; Degraeve, Robin; Kaczer, Ben; Simoen, Eddy; Van Houdt, Jan; Groeseneken, Guido (2012) -
Spectroscopic study of polysilicon traps by means of fast capacitance transients
Toledano Luque, Maria; Tang, Baojun; Degraeve, Robin; Kaczer, Ben; Simoen, Eddy; Van Houdt, Jan; Groeseneken, Guido (2013) -
Statistical characterization of current paths in narrow poly-si channels
Degraeve, Robin; Toledano Luque, Maria; Suhane, Amit; Van den Bosch, Geert; Arreghini, Antonio; Tang, Baojun; Kaczer, Ben; Roussel, Philippe; Kar, Gouri Sankar; Van Houdt, Jan; Groeseneken, Guido (2011) -
Statistical characterization of vertical poly-Si channel using charge pumping technique for 3D flash memory optimization
Tang, Baojun; Toledano Luque, Maria; Zhang, W.D.; Van den Bosch, Geert; Degraeve, Robin; Zhang, J.F.; Van Houdt, Jan (2013) -
Statistical characterization of vertical poly-Si channel using charge pumping technique for 3D flash memory optimization
Tang, Baojun; Toledano Luque, Maria; Zhang, W.D.; Van den Bosch, Geert; Degraeve, Robin; Zhang, J.F.; Van Houdt, Jan (2013) -
Statistical spectroscopy of switching traps in deeply scaled vertical poly-Si channel for 3D memories
Toledano Luque, Maria; Degraeve, Robin; Roussel, Philippe; Luong, Vu; Tang, Baojun; Lisoni, Judit; Tan, Chi Lim; Arreghini, Antonio; Van den Bosch, Geert; Groeseneken, Guido; Van Houdt, Jan (2013)