Browsing by author "Dachs, Charles"
Now showing items 1-14 of 14
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45nm nMOSFET with metal gate on thin SiON driving 1150μA/μm and off-state of 10nA/μm
Henson, Kirklen; Lander, Rob; Demand, Marc; Dachs, Charles; Kaczer, Ben; Deweerd, Wim; Schram, Tom; Tokei, Zsolt; Hooker, Jacob; Cubaynes, Florence; Beckx, Stephan; Boullart, Werner; Coenegrachts, Bart; Vertommen, Johan; Richard, Olivier; Bender, Hugo; Vandervorst, Wilfried; Kaiser, M.; Everaert, Jean-Luc; Jurczak, Gosia; Biesemans, Serge (2004) -
A manufacturable 25nm planar MOSFET technology
Ponomarev, Youri; Loo, Josine; Dachs, Charles; Cubaynes, Florence; Verheijen, M. A.; Kaiser, M.; van Berkum, J. G. M.; Kubicek, Stefan; Bolk, J.; Rovers, Madelon (2001) -
A practical baseline process for advanced CMOS devices research
Ponomarev, Youri; Loo, Josine; Rittersma, Chris; Lander, Rob; Hooker, Jacob; Doornbos, Gerben; Surdeanu, Radu; Cubaynes, Florence; Dachs, Charles; Kubicek, Stefan; Henson, Kirklen; Lindsay, Richard (2003) -
CMOS device optimisation for mixed-signal technologies
Stolk, Peter; Tuinhout, Hans; Duffy, Ray; Augendre, Emmanuel; Bellefroid, L. P.; Bolt, M. J. B.; Croon, Jeroen; Dachs, Charles; Huisman, F. R. J.; Moonen, A. J.; Ponomarev, Youri; Roes, R. F. M.; Da Rold, Martina; Seevinck, E.; Sreerambhatla, K. N.; Surdeanu, Radu; Velghe, Rudolf; Vertregt, M.; Webster, M. N.; van Winkelhoff, N. K. J.; Zegers-Van Duijnhoven, A. T. A. (2001) -
CMOS integration results for the 90nm technology node
Jurczak, Gosia; Augendre, Emmanuel; Van Bavel, Mieke; Dachs, Charles (2003) -
CMOS scaling beyond the 90 nm CMOS technology node: shallow junction and integration challenges
Dachs, Charles; Surdeanu, Radu; Pawlak, Bartek; Doornbos, Gerben; Duffy, R.; Heringa, Anco; Ponomarev, Youri; Venezia, Vincent; Van Dal, Mark; Stolk, P.; Lindsay, Richard; Henson, Kirklen; Dieu, B.; Geenen, Luc; Hoflijk, Ilse; Richard, Olivier; Clarysse, Trudo; Brijs, Bert; Vandervorst, Wilfried; Pagès, Xavier (2003) -
Gate dielectrics for high performance and low power CMOS SoC applications
Cubaynes, Florence; Dachs, Charles; Detcheverry, Celine; Zegers, A.; Venezia, Vincent; Schmitz, Jurriaan; Stolk, Peter; Jurczak, Gosia; Henson, Kirklen; Degraeve, Robin; Rothschild, Aude; Conard, Thierry; Pétry, Jasmine; Da Rold, Martina; Schaekers, Marc; Badenes, Gonçal; Date, L.; Pique, D.; Al-Shareef, H.; Murto, R. (2002) -
Laser annealing for ultra-shallow junction formation in advanced CMOS
Surdeanu, Radu; Ponomarev, Youri; Cerutti, R.; Pawlak, Bartek; Nanver, L.K.; Hoflijk, Ilse; Stolk, Peter; Dachs, Charles; Verheijen, M.A.; Kaiser, M.; Hopstaken, M.J.P.; van Berkum, J.G.M.; Roozeboom, F.; Lindsay, Richard (2002) -
Pre-amorphization and co-implantation suitability for advanced PMOS devices integration
Surdeanu, Radu; Pawlak, Bartek; Lindsay, Richard; Van Dal, Mark; Doornbos, Gerben; Dachs, Charles; Ponomarev, Youri; Loo, Josine; Henson, Kirklen; Verheijen, M.; Kaiser, M.; Pagès, Xavier; Jurczak, Gosia; Stolk, Peter (2003) -
RPN oxynitride gate dielectrics for 90nm low power CMOS applications
Veloso, Anabela; Jurczak, Gosia; Cubaynes, Florence; Rooyackers, Rita; Mertens, Sofie; Rothschild, Aude; Schaekers, Marc; Al-Shareef, H.; Murto, R.; Dachs, Charles; Badenes, Gonçal (2002) -
Shallow junctions for sub-100 nm CMOS technology
Meyssen, Veerle; Stolk, Peter; van Zijl, Jeroen; van Berkum, Jurgen; van de Wijgert, Willem; Lindsay, Richard; Dachs, Charles; Mannino, Giovanni; Cowern, Nick (2001) -
Triple junctions for reduced impact of offset spacer variation on CMOS device parameters
Jurczak, Gosia; Rooyackers, Rita; De Keersgieter, An; Kunnen, Eddy; Henson, Kirklen; Richard, Olivier; Dachs, Charles (2004-09) -
Ultra-thin oxynitride gate dielectrics by pulsed-RF DPN for 65 nm general purpose CMOS applications
Veloso, Anabela; Cubaynes, Florence; Rothschild, Aude; Mertens, Sofie; Degraeve, Robin; O'Connor, Robert; Olsen, Chris; Date, Lucien; Schaekers, Marc; Dachs, Charles; Jurczak, Gosia (2003) -
Ultrashallow junctions for advanced CMOS technology
Stolk, Peter; Meyssen, Veerle; Lindsay, Richard; Dachs, Charles; Mannino, Giovanni; Cowern, Nick (2001)