Browsing by author "Dixit, Abhisek"
Now showing items 1-20 of 34
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25% drive current improvement for p-type Multiple Gate FET (MuGFET) devices by the introduction of recessed Si0.8Ge0.2 in the source and drain regions
Verheyen, Peter; Collaert, Nadine; Rooyackers, Rita; Loo, Roger; Shamiryan, Denis; De Keersgieter, An; Eneman, Geert; Leys, Frederik; Dixit, Abhisek; Goodwin, Michael; Yim, Yong Sik; Caymax, Matty; De Meyer, Kristin; Absil, Philippe; Jurczak, Gosia; Biesemans, Serge (2005) -
A 0.314mm2 6T-SRAM cell built with tall triple-gate devices for 45nm node applications using 0.75NA 193nm lithography
Nackaerts, Axel; Ercken, Monique; Demuynck, Steven; Lauwers, Anne; Baerts, Christina; Bender, Hugo; Boullart, Werner; Collaert, Nadine; Degroote, Bart; Delvaux, Christie; de Marneffe, Jean-Francois; Dixit, Abhisek; De Meyer, Kristin; Hendrickx, Eric; Heylen, Nancy; Jaenen, Patrick; Laidler, David; Locorotondo, Sabrina; Maenhoudt, Mireille; Moelants, Myriam; Pollentier, Ivan; Ronse, Kurt; Rooyackers, Rita; Van Aelst, Joke; Vandenberghe, Geert; Vandervorst, Wilfried; Vandeweyer, Tom; Vanhaelemeersch, Serge; Van Hove, Marleen; Van Olmen, Jan; Verhaegen, Staf; Versluijs, Janko; Vrancken, Christa; Wiaux, Vincent; Jurczak, Gosia; Biesemans, Serge (2004-12) -
A functional 41-stage ring oscillator using scaled FinFET devices with 25nm gate lengths and 10nm Fin widths applicable for the 45nm CMOS node
Collaert, Nadine; Dixit, Abhisek; Goodwin, Michael; Kottantharayil, Anil; Rooyackers, Rita; Degroote, Bart; Leunissen, Peter; Veloso, Anabela; Jonckheere, Rik; De Meyer, Kristin; Jurczak, Gosia; Biesemans, Serge (2004-08) -
A low-power multi-gate FET CMOS technology with 13.9ps inverter delay, large-scale integrated high performance digital circuits and SRAM
von Arnim, Klaus; Augendre, Emmanuel; Pacha, C.; Schulz, Thomas; San, Kemal Tamer; Bauer, F.; Nackaerts, Axel; Rooyackers, Rita; Vandeweyer, Tom; Degroote, Bart; Collaert, Nadine; Dixit, Abhisek; Singanamalla, Raghunath; Xiong, W.; Marshall, A.; Cleavelin, C.R.; Schrüfer, K.; Jurczak, Gosia (2007) -
Accurate fin patterning in emerging devices for 32nm and beyond
Snoeckx, Koen; Rooyackers, Rita; Jurczak, Gosia; Dixit, Abhisek (2007-07) -
Analysis of the parasitic S/D resistance in multiple-gate FETs
Dixit, Abhisek; Kottantharayil, Anil; Collaert, Nadine; Goodwin, Michael; Jurczak, Gosia; De Meyer, Kristin (2005) -
Characterization and modeling of hot carrier degradation in N-channel gate-all-around nanowire FETs
Gupta, Charu; Gupta, Anshul; Tuli, Shikhar; Bury, Erik; Parvais, Bertrand; Dixit, Abhisek (2020) -
Characterization and modeling of N-channel bulk FinFETs from DC to high frequency
Singh, Ramendra; Pragya, Kushwaha; Ghosh, Sudip; Parvais, Bertrand; Chauhan, Yogesh S.; Dixit, Abhisek (2017) -
CMP-less integration of fully Ni-silicided metal gates in FinFETs by simultaneous silicidation of the source, drain, and the gate using a novel dual hard mask approach
Kottantharayil, Anil; Verheyen, Peter; Collaert, Nadine; Dixit, Abhisek; Kaczer, Ben; Snow, Jim; Vos, Rita; Locorotondo, Sabrina; Degroote, Bart; Shi, Xiaoping; Rooyackers, Rita; Mannaert, Geert; Brus, Stephan; Yim, Yong Sik; Lauwers, Anne; Goodwin, Michael; Kittl, Jorge; Van Dal, Mark; Richard, Olivier; Veloso, Anabela; Kubicek, Stefan; Beckx, Stephan; Boullart, Werner; De Meyer, Kristin; Absil, Philippe; Jurczak, Gosia; Biesemans, Serge (2005) -
Cryogenic temperature DC-IV measurements and compact modeling of n-channel bulk FinFETs with 3-4 nm wide fins and 20 nm gate length for quantum computing applications
Gupta, Sumreti; Rathi, Aarti; Parvais, Bertrand; Dixit, Abhisek (2021) -
Doubling or quadrupling MuGFET Fin integration scheme with higher pattern fidelity, lower CD variation and higher layout efficiency
Rooyackers, Rita; Augendre, Emmanuel; Degroote, Bart; Collaert, Nadine; Nackaerts, Axel; Dixit, Abhisek; Vandeweyer, Tom; Pawlak, Bartek; Ercken, Monique; Kunnen, Eddy; Dilliway, Gabriela; Leys, Frederik; Loo, Roger; Jurczak, Gosia; Biesemans, Serge (2007) -
FEOL CMOS process- and device-parasitics in SOI-MuGFETs
Dixit, Abhisek (2007-09) -
FinFET analogue characterization from DC to 110 GHz
Lederer, Dimitri; Kilchytska, V.; Rudenko, T.; Collaert, Nadine; Flandre, D.; Dixit, Abhisek; De Meyer, Kristin; Raskin, J.P. (2005) -
Geometry dependence of low frequency noise in n- and p- channel MuGFETs
Subramanian, Vaidy; Mercha, Abdelkarim; Dixit, Abhisek; Kottantharayil, Anil; Jurczak, Gosia; De Meyer, Kristin; Decoutere, Stefaan; Groeseneken, Guido (2005) -
GIDL (gate-induced drain leakage) and parasitic Schottky barrier leakage elimination in aggressively scaled HfO2/TiN FiNFET devices
Hoffmann, Thomas Y.; Doornbos, Gerben; Ferain, Isabelle; Collaert, Nadine; Zimmerman, Paul; Goodwin, Michael; Rooyackers, Rita; Kottantharayil, Anil; Yim, Yong Sik; Dixit, Abhisek; De Meyer, Kristin; Jurczak, Gosia; Biesemans, Serge (2005) -
Impact of LER and random dopant fluctuations on FinFET matching performance
Baravelli, Emanuele; Jurczak, Gosia; Speciale, N.; De Meyer, Kristin; Dixit, Abhisek (2008) -
Impact of line-edge roughness on FinFET matching performance
Baravelli, Emanuele; Dixit, Abhisek; Rooyackers, Rita; Jurczak, Gosia; Speciale, Nicolo; De Meyer, Kristin (2007) -
Integration challenges for multi-gate devices
Collaert, Nadine; Brus, Stephan; De Keersgieter, An; Dixit, Abhisek; Ferain, Isabelle; Goodwin, Michael; Kottantharayil, Anil; Rooyackers, Rita; Verheyen, Peter; Yim, Yong Sik; Zimmerman, Paul; Beckx, Stephan; Degroote, Bart; Demand, Marc; Kim, Myeong-Cheol; Kunnen, Eddy; Locorotondo, Sabrina; Mannaert, Geert; Neuilly, Francois; Shamiryan, Denis; Baerts, Christina; Ercken, Monique; Laidler, David; Leys, Frederik; Loo, Roger; Lisoni, Judit; Snow, Jim; Vos, Rita; Boullart, Werner; Pollentier, Ivan; De Gendt, Stefan; De Meyer, Kristin; Jurczak, Gosia; Biesemans, Serge (2005) -
Integration of tall triple-gate devices with inserted TaxNy gate in a 0.274μm² 6T-SRAM cell and advanced CMOS logic circuits
Witters, Liesbeth; Collaert, Nadine; Nackaerts, Axel; Demand, Marc; Demuynck, Steven; Delvaux, Christie; Lauwers, Anne; Baerts, Christina; Beckx, Stephan; Boullart, Werner; Brus, Stephan; Degroote, Bart; de Marneffe, Jean-Francois; Dixit, Abhisek; De Meyer, Kristin; Ercken, Monique; Goodwin, Michael; Hendrickx, Eric; Heylen, Nancy; Jaenen, Patrick; Laidler, David; Leray, Philippe; Locorotondo, Sabrina; Maenhoudt, Mireille; Moelants, Myriam; Pollentier, Ivan; Ronse, Kurt; Rooyackers, Rita; Van Aelst, Joke; Vandenberghe, Geert; Vandeweyer, Tom; Vanhaelemeersch, Serge; Van Hove, Marleen; Van Olmen, Jan; Verhaegen, Staf; Versluijs, Janko; Vrancken, Christa; Wiaux, Vincent; Willems, Patrick; Wouters, Johan M. D.; Jurczak, Gosia; Biesemans, Serge (2005) -
Measurement and analysis of parasitic capacitance in FinFETs with high-k dielectrics and metal-gate stack
Dixit, Abhisek; Bandhyopadhyay, Anirban; Collaert, Nadine; De Meyer, Kristin; Jurczak, Gosia (2009)