Browsing by author "Kimura, K."
Now showing items 1-17 of 17
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Advanced characterization of high-K materials: a nuclear approach
Brijs, Bert; Huyghebaert, Cedric; Nauwelaerts, Sophie; Caymax, Matty; Vandervorst, Wilfried; Nakajima, K.; Kimura, K.; Bergmaier, A.; Dollinger, G.; Lennard, W. N.; Terwagne, G.; Vantomme, Andre (2002) -
Advanced RBS analysis of thin films in micro-electronics
Brijs, Bert; Deleu, Jeroen; Huygebaert, C.; Nauwelaerts, Sophie; Vandervorst, Wilfried; Kimura, K. (2000) -
Advanced RBS analysis of thin films in micro-electronics
Brijs, Bert; Deleu, Jeroen; Huyghebaert, Cedric; Nauwelaerts, Sophie; Nakajima, K.; Kimura, K.; Vandervorst, Wilfried (2001) -
Characterization of ultra thin layers by Rutherford backscattering spectrometry
Brijs, Bert; Deleu, Jeroen; Conard, Thierry; Li, H.; Loo, Roger; Caymax, Matty; Nakajima, K.; Kimura, K.; Vandervorst, Wilfried (1999) -
Characterization of ultra thin oxynitrides, a general approach
Brijs, Bert; Deleu, Jeroen; Conard, Thierry; De Witte, Hilde; Vandervorst, Wilfried; Nakajima, K.; Kimura, K.; Genchev, I.; Bergmaier, A.; Goergens, I.; Neumaier, P.; Dollinger, G.; Dobeli, M. (1999) -
Characterization of ultra thin oxynitrides: a general approach
Brijs, Bert; Deleu, Jeroen; Conard, Thierry; De Witte, Hilde; Vandervorst, Wilfried; Nakajima, K.; Kimura, K.; Genchev, I.; Bermaier, A.; Goergens, L.; Neumaier, P.; Dollinger, G.; Döbeli, M. (2000) -
Cluster effect on projected range of 30 keV C60+ in silicon
Morita, Y.; Nakajima, K.; Suzuki, M.; Saitoh, Y.; Vandervorst, Wilfried; Kimura, K. (2011) -
Comparative growth kinetics of SiGe in a commercial reduced pressure chemical vapour deposition EPI reactor and anomalies during growth of thin Si layers on SiGe
Caymax, Matty; Loo, Roger; Brijs, Bert; Vandervorst, Wilfried; Howard, Dave; Kimura, K.; Nakajima, K. (1998) -
Errors in near-surface and interfacial profiling of boron and arsenic
Vandervorst, Wilfried; Janssens, Tom; Brijs, Bert; Conard, Thierry; Huyghebaert, Cedric; Fruhauf, J.; Bergmaier, A.; Dollinger, G.; Buyuklimanli, T.; Vanden Berg, J.A.; Kimura, K. (2004-06) -
Errors in near-surface and interfacial profiling of boron and arsenic
Vandervorst, Wilfried; Janssens, Tom; Brijs, Bert; Conard, Thierry; Huyghebaert, Cedric; Frühauf, J.; Bergmaier, A.; Dollinger, G.; Buyuklimanli, T.; Vandenberg, J.A.; Kimura, K. (2004-05) -
EXLE-SIMS: dramatically enhanced accuracy for dose loss metrology
Vandervorst, Wilfried; Vos, Rita; Salima, A.J.; Merkulov, A.; Nakajima, K.; Kimura, K. (2008) -
New ways for the mediation of the charge transfer mechanism in P3HT:PCBM bulk heterojunction solar cells by the use of graphene and its derivates
Robaeys, P.; Bourgeois, E.; Kimura, K.; Haenen, Ken; Loh, K.P.; Manca, Jean; Nesladek, Milos (2012) -
Quantification and depth profiling of a ZrO2 (2nm)/A1203 (1nm) layer with NRA, RBS, HRBS, HERD
Brijs, Bert; Huyghebaert, Cedric; Nauwelaerts, Sophie; Caymax, Matty; Vandervorst, Wilfried; Nakajima, K.; Kimura, K.; Bergmaier, A.; Dollinger, G.; Lennard, W. N.; Terwagne, G.; Vantomme, Andre (2001) -
Quantitative analysis of thin dielectrica with ultra high resolution ERD, MEIS and RBS
Vandervorst, Wilfried; Conard, Thierry; Giangrandi, Simone; Brijs, Bert; Bergmaier, A.; Kimura, K.; van den Berg, J.A.; Werner, M. (2007) -
Recent developments in nuclear methods in support of semiconductor characterization
Brijs, Bert; Bender, Hugo; Huyghebaert, Cedric; Janssens, Tom; Vandervorst, Wilfried; Nakajima, K.; Kimura, K.; Bergmaier, A.; Dollinger, G.; van den Berg, J.A. (2003) -
The analysis of a thin SiO2/SixN1-x/SiO2 stack, a comparative study of low energy ERD with XPS, low energy SIMS, HRBS, HR-ERD
Brijs, Bert; Giangrandi, Simone; Arstila, K.; Bergmaier, A.; Kimura, K.; Conard, Thierry; Vandervorst, Wilfried; Vantomme, Andre (2005) -
The analysis of ultra-thin films with HRBS-30
Brijs, Bert; Kimura, K.; Bender, Hugo; Vandervorst, Wilfried (2009)