Browsing by author "Paccagnella, A."
Now showing items 1-12 of 12
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A statistical approach to microdose induced degradation in FinFET devices
Griffoni, Alessio; Gerardin, S.; Roussel, Philippe; Degraeve, Robin; Meneghesso, G.; Paccagnella, A.; Simoen, Eddy; Claeys, Cor (2009) -
Depassivation of latent plasma damage in nMOSFETs
Cellere, G.; Pantisano, Luigi; Valentini, M. G.; Paccagnella, A. (2001) -
Different nature of process-induced and stress-induced defects in thin SiO2 layers
Cellere, G.; Valentini, M.G.; Pantisano, Luigi; Cheung, K.P.; Paccagnella, A. (2003) -
Dynamic-ron control via proton irradiation in AlGaN/GaN transistors
Tajalli, A.; Stockman, Arno; Meneghini, M.; Mouhoubi, S.; Banerjee, A.; Gerardin, S.; Bagatin, M.; Paccagnella, A.; Zanoni, E.; Tack, M.; Bakeroot, Benoit; Moens, P.; Meneghesso, G. (2018) -
Effects of heavy-ion strikes on fully depleted SOI MOSFETs with ultra-thin gate oxide and different strain-inducing techniques
Griffoni, A.; Gerardin, S.; Cester, A.; Paccagnella, A.; Simoen, Eddy; Claeys, Cor (2007) -
Electrical stresses on ultra-thin gate oxide SOI MOSFETs after irradiation
Cester, A.; Gerardin, S.; Paccagnella, A.; Simoen, Eddy; Claeys, Cor (2005) -
Heavy ion damage in ultra-thin gate oxide SOI MOSFETs
Cester, A.; Garardin, S.; Paccagnella, A.; Simoen, Eddy; Claeys, Cor; Candelori, A. (2005) -
Hot carrier degradation on n-channel SiO2/HfSiO MOSFETs: Effects on the devices performance and lifetime
Cimino, Salvatore; Pantisano, Luigi; Aoulaiche, Marc; Degraeve, Robin; Kwak, Dong Hwa; Crupi, Felice; Groeseneken, Guido; Paccagnella, A. (2005) -
Impact of radiation on the operation and reliability of deep submicron CMOS technologies
Claeys, Cor; Put, Sofie; Griffoni, Alessio; Cester, A.; Gerardin, S.; Meneghesso, G.; Paccagnella, A.; Simoen, Eddy (2010) -
Microdose and breakdown effects induced by heavy ions on sub 20-nm triple gate SOI FETs
Griffoni, Alessio; Gerardin, S.; Meneghesso, G.; Paccagnella, A.; Simoen, Eddy; Put, Sofie; Claeys, Cor (2008) -
Study of breakdown effects in silicon multiguard structures
Da Rold, Martina; Bacchetta, N.; Bisello, D.; Paccagnella, A.; Dalla Betta, G. F.; Verzellesi, G.; Militaru, O.; Wheadon, R.; Fuochi, P. G.; Bozzi, C.; Dell'Orso, R.; Messineo, A.; Tonelli, G.; Verdini, P. G. (1999) -
The impact of plasma-charging damage on the RF performance of deep-submicron MOSFET
Pantisano, Luigi; Cheung, K. P.; Roussel, Philippe; Paccagnella, A. (2002)