Browsing by author "Lekens, Geert"
Now showing items 1-10 of 10
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Accelerated ageing with in situ electrical testing: a powerful tool for the building-in approach to quality and reliability in electronics
De Schepper, Luc; De Ceuninck, Ward; Lekens, Geert; Stals, Lambert; Vanhecke, Bruno; Roggen, Jean; Beyne, Eric; Tielemans, Luc (1994) -
Advantage of in-situ over ex-situ techniques as reliability tool: aging kinetics of IMEC's MCM-D discrete passives devices
Soussan, Philippe; Lekens, Geert; Dreesen, R.; De Ceuninck, Ward; Beyne, Eric (2003) -
Dynamics of electromigration induced void-hillock growth and precipitation/dissolution of addition elements studied by in-situ electron microscopy resistance measurements
D'Haen, Jan; Cosemans, P.; Manca, Jean; Lekens, Geert; Martens, T.; De Ceuninck, Ward; D'Olieslaeger, Marc; De Schepper, Luc; Maex, Karen (1999) -
Failure mechanisms and qualification testing of passive components
Post, H.A.; Letullier, P.; Briolat, T.; Humke, R.; Schuhmann, R.; Saarinen, K.; Werner, W.; Ousten, Y.; Lekens, Geert; Dehbi, A.; Wondrak, W. (2005) -
In situ synchrotron based x-ray fluorescence and scattering measurements during atomic layer deposition : Initial growth of HfO2 on Si and Ge substrates
Devloo-Casier, K.; Dendooven, J.; Ludwig, K.F.; Lekens, Geert; D'Haen, Jan; Detavernier, C. (2011) -
Lifetime modeling of intrinsic gate oxide breakdown at high temperature
Moonen, R.; Vanmeerbeek, P.; Lekens, Geert; De Ceuninck, Ward; Moens, P.; Boutsen, J. (2007) -
Moisture induced failures in flip chip on flex interconnections using anisotropic conductive adhesives
Caers, J.F.J.M.; Zhao, X.J.; Lekens, Geert; Dreesen, R.; Croes, K.; Wong, E.H. (2003) -
Study of time-dependent dielectric breakdown on gate oxide capacitors at high temperature
Moonen, R.; Vanmeerbeek, P.; Lekens, Geert; De Ceuninck, Ward; Moens, P.; Boutsen, J. (2007) -
The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurements
Witvrouw, Ann; Maex, Karen; De Ceuninck, Ward; Lekens, Geert; D'Haen, Jan; De Schepper, Luc (1998) -
The dependence of stress induced voiding on line width studied by conventional and high resolution resistance measurements
Witvrouw, Ann; Maex, Karen; De Ceuninck, Ward; Lekens, Geert; D'Haen, Jan; De Schepper, Luc (1998)