Browsing by author "De Wolf, Peter"
Now showing items 21-40 of 56
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Lateral and Vertical Dopant Profiling in Semiconductors by Atomic Force Microscopy Using Conducting Tips
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Hellemans, L.; Snauwaerts, Jan (1994) -
Lateral and vertical dopant profiling in semiconductors by atomic force microscopy using conducting tips
De Wolf, Peter; Snauwaert, Johan; Hellemans, L.; Clarysse, Trudo; Vandervorst, Wilfried; D'Olieslaeger, Marc; Quaeyhaegens, D. (1995) -
Local potential measurements in silicon devices using atomic force microscopy with conductive tips
Trenkler, Thomas; De Wolf, Peter; Snauwaerts, Jan; Qamhieh, Z.; Vandervorst, Wilfried; Hellemans, L. (1995) -
Low weight spreading resistance profiling of ultra-shallow dopant profiles
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (1997) -
Low weight spreading resistance profiling of ultrashallow dopant profiles
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried; Hellemans, L. (1998) -
Minimizing the size of force-controlled point contacts on silicon for carrier profiling
Snauwaert, Johan; Blanc, N.; De Wolf, Peter; Vandervorst, Wilfried; Hellemans, L. (1996) -
Minimizing the Size of Force-Controlled Point-Contacts on Silicon for Carrier Profiling
Snauwaerts, Jan; Blanc, N.; De Wolf, Peter; Hellemans, L. (1995) -
Nanometer scale characterization of deep submicron devices
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Eyben, Pierre; Haegeman, Bart; Xu, Mingwei; Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert (1999) -
Nanopotentiometry - Local potential measurements in CMOS transistors using atomic force spectroscopy
Trenkler, Thomas; De Wolf, Peter; Vandervorst, Wilfried; Hellemans, L. (1997) -
Nanopotentiometry: data interpretation and quantification
Haegeman, Bart; Trenkler, Thomas; Eyben, Pierre; Vandervorst, Wilfried; De Wolf, Peter; Hellemans, L. (1999) -
Nanopotentiometry: Local potential measurements in complementary metal-oxide-semiconductor transistors using atomic force microscopy
Trenkler, Thomas; De Wolf, Peter; Vandervorst, Wilfried; Hellemans, L. (1998) -
Non-monotonic behaviour of the scanning capacitance microscope for large dynamic range samples
Stephenson, Robert; Verhulst, Anne; De Wolf, Peter; Caymax, Matty; Vandervorst, Wilfried (1999) -
Nonmonotonic behavior of the scanning capacitance microscope for large dynamic range samples
Stephenson, Robert; Verhulst, Anne; De Wolf, Peter; Caymax, Matty; Vandervorst, Wilfried (2000) -
On the determination of two-dimensional carrier distributions
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Hellemans, L.; Snauwaert, J.; Privitera, Vittorio; Raineri, Vito (1995) -
On the Determination of Two-Dimensional Carrier Distributions
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Privitera, Vittorio; Raineri, Vito; Hellemans, L.; Snauwaerts, Jan (1994) -
On the determination of two-dimensional carrier distributions
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Hellemans, L.; Snauwaert, J.; Privitera, Vittorio; Raineri, Vito (1995) -
One and two-dimensional carrier profiling in semiconductors by nano-SRP
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried; Snauwaert, J.; Hellemans, L. (1995) -
One- and two-dimensional carrier profiling in semiconductors by nanospreading resistance profiling
De Wolf, Peter; Clarysse, Trudo; Vandervorst, Wilfried; Snauwaert, J.; Hellemans, L. (1996) -
One- and two-dimensional dopant/carrier profiling for ULSI
Vandervorst, Wilfried; Clarysse, Trudo; De Wolf, Peter; Trenkler, Thomas; Hantschel, Thomas; Stephenson, Robert; Janssens, Tom (1998) -
Practicalities and limitations of scanning capacitance microscopy for routine IC characterisation
Stephenson, Robert; De Wolf, Peter; Trenkler, Thomas; Hantschel, Thomas; Clarysse, Trudo; Jansen, Philippe; Vandervorst, Wilfried (1999)