Browsing by author "Franquet, Alexis"
Now showing items 1-20 of 242
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2D TMDC aging: a case study of monolayer WS2 and mitigation strategies
Wyndaele, Pieter-Jan; de Marneffe, Jean-Francois; Slaets, R.; Groven, Benjamin; Franquet, Alexis; Bruener, P.; Grehl, T.; De Gendt, Stefan (2024) -
3D analysis of intermetallic formation in blankets and micro-bumps
Spampinato, Valentina; Franquet, Alexis; Barnes, Jean-Paul (2019) -
3D analysis of intermetallic formation in blankets and micro-bumps.
Spampinato, Valentina; Franquet, Alexis; Barnes, Jean-Paul; Conard, Thierry (2019) -
A combined SPM/TOFSIMS tool to obtain real chemical 3D information
Spampinato, Valentina; Dialameh, Masoud; Fleischmann, Claudia; Franquet, Alexis; Conard, Thierry; Vandervorst, Wilfried (2017) -
A correlative ToF-SIMS/SPM methodology for probing 3D devices
Spampinato, Valentina; Dialameh, Masoud; Franquet, Alexis; Fleischmann, Claudia; Conard, Thierry; van der Heide, Paul; Vandervorst, Wilfried (2020) -
A flexible organic memory device with a clearly disclosed resistive switching mechanism
Casula, Giulia; Busby, Yan; Franquet, Alexis; Spampinato, Valentina; Houssiau, Laurent; Bonfiglio, Annalisa; Cosseddu, Piero (2019) -
A holistic approach of SIMS analysis for advanced semiconductor structures
Franquet, Alexis; Spampinato, Valentina; Pirkl, Alexander; Kayser, Sven; Moellers, Rudolf; Conard, Thierry; Vandervorst, Wilfried; van der Heide, Paul (2019) -
A methodology for mechanical stress and wafer warpage minimization during 3D NAND fabrication
Kruv, Anastasiia; Gonzalez, Mario; Okudur, Oguzhan Orkut; Spampinato, Valentina; Franquet, Alexis; Vadakupudhu Palayam, Senthil; Arreghini, Antonio; Van den Bosch, Geert; Rosmeulen, Maarten; De Wolf, Ingrid (2022) -
Actual 3D analysis of hybrid arrays with in-situ SPM in a combined TOF-SIMS/SPM tool
Spampinato, Valentina; Dialameh, Masoud; Fleischmann, Claudia; Franquet, Alexis; Vandervorst, Wilfried; van der Heide, Paul (2018) -
Advanced characterization of nanometer size structures by TOFSIMS
Franquet, Alexis (2019) -
Advanced semiconducting structure analysis with Self-Focusing SIMS and improved mass resolution in a Hybrid SIMS instrument
Franquet, Alexis; Spampinato, Valentina; Kayser, Sven; Havelund, Rasmus; Gilmore, Ian; Vandervorst, Wilfried; van der Heide, Paul (2018) -
Advanced semiconducting structure analysis with Self-Focusing SIMS and improved mass resolution in a Hybrid SIMS instrument
Franquet, Alexis; Spampinato, Valentina; Kayser, Sven; Vandervorst, Wilfried; van der Heide, Paul (2019) -
Advances in metrology for complex epitaxial systems embedded in small volums
Vandervorst, Wilfried; Kumar, Arul; Meersschaut, Johan; Franquet, Alexis; Douhard, Bastien; Delmotte, Joris; Conard, Thierry; Nuytten, Thomas; Hantschel, Thomas; Loo, Roger (2015-05) -
ALD on high mobility channels: engineering the proper gate stack passivation
Sioncke, Sonja; Lin, Hang Chun; Adelmann, Christoph; Brammertz, Guy; Delabie, Annelies; Conard, Thierry; Franquet, Alexis; Caymax, Matty; Meuris, Marc; Struyf, Herbert; De Gendt, Stefan; Heyns, Marc; Fleischmann, Claudia; Temst, K.; Vantomme, Andre; Muller, Matthias; Kolbe, Michael; Beckhoff, Burkhard; Schmeisser, Dieter; Tallarida, Massimo (2010) -
ALD strontium titanates and their characterization
Popovici, Mihaela Ioana; Van Elshocht, Sven; Tomida, Kazuyuki; Menou, Nicolas; Swerts, Johan; Pawlak, Malgorzata; Kaczer, Ben; Kim, Min-Soo; Brijs, Bert; Favia, Paola; Conard, Thierry; Franquet, Alexis; Moussa, Alain; Debusschere, Ingrid; Altimime, Laith; Kittl, Jorge (2010) -
Alternative high-k dielectrics for semiconductor applications
Van Elshocht, Sven; Adelmann, Christoph; Clima, Sergiu; Pourtois, Geoffrey; Conard, Thierry; Delabie, Annelies; Franquet, Alexis; Lehnen, Peer; Meersschaut, Johan; Menou, Nicolas; Popovici, Mihaela Ioana; Richard, Olivier; Schram, Tom; Wang, Xin Peng; Hardy, An; Dewulf, Daan; van Bael, M.K.; Blomberg, T.; Pieereux, D.; Swerts, J.; Maes, J.W.; Wouters, Dirk; De Gendt, Stefan; Kittl, Jorge (2008) -
Alternative high-k dielectrics for semiconductor applications
Van Elshocht, Sven; Adelmann, Christoph; Clima, Sergiu; Pourtois, Geoffrey; Conard, Thierry; Delabie, Annelies; Franquet, Alexis; Lehnen, Peer; Meersschaut, Johan; Menou, Nicolas; Popovici, Mihaela Ioana; Richard, Olivier; Schram, Tom; Wang, Xin Peng; Hardy, An; Dewulf, Daan; Van Bael, Marlies; Blomberg, T.; Pierreux, Dieter; Swerts, Johan; Maes, Jan; Wouters, Dirk; De Gendt, Stefan; Kittl, Jorge (2009) -
An alternative application of ToF-SIMS/in-situ AFM: controlled sample preparation for IC failure analysis
Franquet, Alexis; Spampinato, Valentina; Khaled, Ahmad; Conard, Thierry; Brand, Sebastian; Kogel, M; Wiesler, I; De Wolf, Ingrid (2019) -
Aqueous chemical solution deposition: a fast screening method for alternative high-k materials applied to Nd2O3 as a case study
Van Elshocht, Sven; Hardy, An; Witters, Thomas; Adelmann, Christoph; Caymax, Matty; Conard, Thierry; De Gendt, Stefan; Franquet, Alexis; Richard, Olivier; Van Bael, Marlies; Mullens, J.; Heyns, Marc (2007) -
Aqueous solution–gel preparation of ultrathin ZrO2 films for gate dielectric application
Hardy, An; Van Elshocht, Sven; Adelmann, Christoph; Conard, Thierry; Franquet, Alexis; Douheret, Olivier; Haeldermans, Ilse; D'Haen, Jan; De Gendt, Stefan; Caymax, Matty; Heyns, Marc; D'Olieslaeger, Marc; Van Bael, Marlies; Mullens, J. (2008)