Browsing by author "Takeuchi, Shotaro"
Now showing items 1-20 of 55
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200mm Si/SiGe resonant interband tunneling diodes incorporating delta-doping layers grown by CVD
Park, Si-Young; Anisha, R.; Berger, Paul; Loo, Roger; Nguyen, Duy; Takeuchi, Shotaro; Caymax, Matty (2009) -
Assessment of Ge1-xSnx alloys for strained Ge CMOS devices
Takeuchi, Shotaro; Shimura, Yosuke; Nishimura, Tsuyoshi; Vincent, Benjamin; Eneman, Geert; Clarysse, Trudo; Demeulemeester, Jelle; Temst, Kristiaan; Vantomme, Andre; Dekoster, Johan; Caymax, Matty; Loo, Roger; Nakatsuka, Osamu; Sakai, A.; Zaima, Shigeaki (2010-10) -
Atomic layer doping of phosphorus and arsenic: experimental and atomistic modeling
Takeuchi, Shotaro; Yang, Lijun; Nguyen, Duy; Loo, Roger; Conard, Thierry; Pourtois, Geoffrey; Vandervorst, Wilfried; Caymax, Matty (2008) -
Characterization of GeSn materials for future Ge pMOSFETs source/drain stressors
Vincent, Benjamin; Shimura, Y.; Takeuchi, Shotaro; Nishimura, T.; Eneman, Geert; Firrincieli, Andrea; Demeulemeester, Jelle; Vantomme, Andre; Clarysse, Trudo; Nakatsuka, O.; Zaima, S.; Dekoster, Johan; Caymax, Matty; Loo, Roger (2011) -
Conformal doping of FINFET's: a fabrication and metrology challenge
Vandervorst, Wilfried; Eyben, Pierre; Mody, Jay; Jurczak, Gosia; Nguyen, Duy; Takeuchi, Shotaro; Leys, Frederik; Loo, Roger; Caymax, Matty; Everaert, Jean-Luc (2008) -
Conformal ultra shallow junctions by vapor phase doping with boron
Nguyen, Duy; Leys, Frederik; Takeuchi, Shotaro; Loo, Roger; Caymax, Matty; Eyben, Pierre; Vandervorst, Wilfried (2008-05) -
Defect control for Ge/Si and Ge1-xSnx/Ge/Si heterostructures
Sakai, Akira; Takeuchi, Shotaro; Nakatsuka, Osamu; Ogawa, Masaki; Zaima, Shigeaki (2007) -
Effect of atomic deuterium irradiation on initial growth of Sn and Ge1-xSnx on Ge(001) substrates
Shinoda, Tatsuya; Nakatsuka, Osamu; Shimura, Yosuke; Takeuchi, Shotaro; Zaima, Shigeaki (2012) -
Epitaxial Ge on standard STI patterned Si wafers: high quality virtual substrates for Ge pMOS and III/V nMOS
Loo, Roger; Wang, Gang; Souriau, Laurent; Lin, Vic; Takeuchi, Shotaro; Brammertz, Guy; Caymax, Matty (2009) -
Evaluation of DiMethylAminoGermaniumTriChloride as a novel carbon-dopant and germanium precursor for germanium and silicon germanium chemical vapor deposition
Leys, Frederik; Liu, Cong; Shi, Xiaoping; Lamare, B.; Takeuchi, Shotaro; Schaekers, Marc; Loo, Roger; Woelk, E.; Caymax, Matty (2008) -
Evaluation of DiMethylAminoGermaniumTriChloride as a novel carbon-dopant and germanium precursor for germanium and silicon germanium chemical vapor deposition
Leys, Frederik; Liu, Cong; Shi, Xiaoping; Lamare, B.; Takeuchi, Shotaro; Schaekers, Marc; Loo, Roger; Woelk, E.; Caymax, Matty (2008) -
Fabrication of high quality Ge virtual substrates by selective epitaxial growth in shallow trench isolated Si (001) trenches
Wang, Gang; Loo, Roger; Souriau, Laurent; Takeuchi, Shotaro; De Jaeger, Brice; Lee, W; Caymax, Matty; Lin, Vic; Vandervorst, Wilfried; Blanpain, Bart; Heyns, Marc (2009) -
Fabrication of high qualtiy Ge virtual substrates by selective epitaxial growth in shallow trench isolated Si (001) trenches
Wang, Gang; Loo, Roger; Takeuchi, Shotaro; Souriau, Laurent; Lin, Vic; Moussa, Alain; Bender, Hugo; De Jaeger, Brice; Ong, Patrick; Lee, Willie; Meuris, Marc; Caymax, Matty; Vandervorst, Wilfried; Blanpain, Bart; Heyns, Marc (2010) -
Fabrication of virtual Ge and Ge-rich SiGe substrates using selective or non-selective epitaxial growth
Loo, Roger; Wang, Gang; Souriau, Laurent; Hikavyy, Andriy; Takeuchi, Shotaro; Caymax, Matty (2009) -
Formation and characterization of Ni(Ge1-ySny)/Ge1-xSnx/Ge contacts
Nishimura, Tsuyoshi; Nakatsuka, Osamu; Shimura, Yosuke; Takeuchi, Shotaro; Vincent, Benjamin; Vantomme, Andre; Dekoster, Johan; Caymax, Matty; Loo, Roger; Zaima, Shigeaki (2010-09) -
Formation of Ni(Ge1-xSnx) layers with solid-phase reaction in Ni/Ge1-xSnx/Ge systems
Nishimura, Tsuyoshi; Nakatsuka, Osamu; Shimura, Yosuke; Takeuchi, Shotaro; Vincent, Benjamin; Vantomme, Andre; Dekoster, Johan; Caymax, Matty; Loo, Roger; Zaima, Shigeaki (2011) -
Formation of Ni(Ge1-ySny) layers with solid-phase reaction in Ni/Ge1-xSnx/Ge systems
Nishimura, Tsuyoshi; Shimura, Yosuke; Takeuchi, Shotaro; Vincent, Benjamin; Vantomme, Andre; Dekoster, Johan; Caymax, Matty; Loo, Roger; Nakatsuka, Osaku; Zaima, Shigeaki (2010) -
Formation of Ni(Ge1-ySny) layers with solid-phase reaction in Ni/Ge1-xSnx/Ge systems
Nishimura, Tsuyoshi; Shimura, Yosuke; Takeuchi, Shotaro; Vincent, Benjamin; Vantomme, Andre; Dekoster, Johan; Caymax, Matty; Loo, Roger; Nakatsuka, Osaku; Zaima, Shigeaki (2010) -
Ge1-xSnx stressors for strained-Ge CMOS
Takeuchi, Shotaro; Shimura, Yosuke; Nishimura, T.; Vincent, Benjamin; Eneman, Geert; Clarysse, Trudo; Demeulemeester, Jelle; Vantomme, Andre; Dekoster, Johan; Caymax, Matty; Loo, Roger; Sakai, A.; Nakatsuka, Osaku; Zaima, Shigeaki (2011) -
Ge1-xSnx stressors for strained-Ge CMOS
Takeuchi, Shotaro; Shimura, Yosuke; Nishimura, Tsuyoshi; Vincent, Benjamin; Eneman, Geert; Clarysse, Trudo; Demeulemeester, Jelle; Vantomme, Andre; Dekoster, Johan; Caymax, Matty; Loo, Roger; Nakatsuka, Osamu; Zaima, Shigeaki (2010)