Browsing by author "Van den bosch, G."
Now showing items 1-10 of 10
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Accurate and robust noise-based trigger algorithm for soft breakdown detection in ultra thin oxides
Roussel, Philippe; Degraeve, Robin; Van den bosch, G.; Kaczer, Ben; Groeseneken, Guido (2001) -
Accurate and robust noise-based trigger algorithm for soft breakdown detection in ultrathin gate dielectrics
Roussel, Philippe; Degraeve, Robin; Van den bosch, G.; Kaczer, Ben; Groeseneken, Guido (2001) -
Analysis and optimisation of the hot-carrier degradation performance of 0.35μm fully overlapped LDD devices
Bellens, Rudi; Habas, Predrag; Groeseneken, Guido; Maes, Herman; Mieville, Jean-Paul; Van den bosch, G.; Deferm, Ludo (1995) -
Characterization of hot-carrier aging of a 0.35µm fully overlapped-LDD CMOS technology
Habas, Predrag; Bellens, Rudi; Groeseneken, Guido; Van den bosch, G.; Deferm, Ludo (1995) -
Hot carrier degradation and time-dependent dielectric breakdown in oxides
Groeseneken, Guido; Degraeve, Robin; Nigam, Tanya; Van den bosch, G.; Maes, Herman (1999) -
Impact of plasma density and pattern aspect ratio on plasma damage in deep submicron CMOS technologies
Creusen, Martin; Van den bosch, G.; van der Groen, Sonja; Groeseneken, Guido; Ackaert, J.; De Backer, E. (1999) -
Optimisation of a pre-metal-dielectric with a contact etch stop layer for 0.18μm and 0.13μm technologies
De Jaeger, Brice; Van den bosch, G.; Van Hove, Marleen; Debusschere, Ingrid; Schaekers, Marc; Badenes, Gonçal (2000) -
Oxide and Interface Degradation Resulting from Substrate Hot-Hole Injection at 295K and 77K
Van den bosch, G.; Groeseneken, Guido; Maes, Herman; Klein, R.; Saks, N. S. (1994) -
Plasma charging damage issues in copper single and dual damascene, oxide and low-k dielectric interconnects
Van den bosch, G.; De Jaeger, Brice; Tokei, Zsolt; Groeseneken, Guido (2001) -
Study of the hot-carrier degradation performance of 0.35 μm fully overlapped LDD devices
Bellens, Rudi; Habas, Predrag; Groeseneken, Guido; Maes, Herman; Mieville, Jean-Paul; Van den bosch, G. (1995)