Browsing by author "Padovani, Andrea"
Now showing items 1-9 of 9
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A comprehensive understanding of the erase of TANOS memories through charge separation experiments and simulations
Padovani, Andrea; Arreghini, Antonio; Vandelli, Luca; Larcher, Luca; Van den Bosch, Geert; Pavan, Paolo; Van Houdt, Jan (2011) -
A sensitivity map-based approach to profile defects in MIM capacitors from I-V, C-V and G-V measurements
Padovani, Andrea; Kaczer, Ben; Pesic, Milan; Belmonte, Attilio; Popovici, Mihaela Ioana; Nyns, Laura; Linten, Dimitri; Afanasiev, Valeri; Shlyakhov, Ilya; Lee, Younggon; Park, Hokyung; Larcher, Luca (2019) -
Defect spectroscopy from electrical measurements: a simulation based technique
Larcher, Luca; Padovani, Andrea; Pramanik, Dipankar; Kaczer, Ben; Palumbo, Felix (2018) -
Device-to-Materials Pathway for Electron Traps Detection in Amorphous GeSe-Based Selectors
Slassi, Amine; Medondjio, Linda-Sheila; Padovani, Andrea; Tavanti, Francesco; He, Xu; Clima, Sergiu; Garbin, Daniele; Kaczer, Ben; Larcher, Luca; Ordejon, Pablo; Calzolari, Arrigo (2023) -
Evidences for vertical charge dipole formation in charge-trapping memories and its impact on reliability
Padovani, Andrea; Arreghini, Antonio; Vandelli, Luca; Larcher, Luca; Van den Bosch, Geert; Van Houdt, Jan (2012) -
Experimental assessment of electrons and holes in erase transient of TANOS and TANVaS memories
Suhane, Amit; Arreghini, Antonio; Van den Bosch, Geert; Vandelli, Luca; Padovani, Andrea; Breuil, Laurent; Larcher, Luca; De Meyer, Kristin; Van Houdt, Jan (2010) -
Role of defects in the reliability of HfO2/Si-based spacer dielectric stacks for local interconnects
Wu, Chen; Vaisman Chasin, Adrian; Padovani, Andrea; Lesniewska, Alicja; Demuynck, Steven; Croes, Kristof (2019) -
Role of holes and electrons during erase of TANOS memories: evidence for dipole formation and its impact on reliability
Vandelli, Luca; Arreghini, Antonio; Padovani, Andrea; Larcher, Luca; Van den Bosch, Geert; Della Marca, Vincenzo; Pavan, Paolo; Jurczak, Gosia; Van Houdt, Jan (2010) -
Understanding and variability of lateral charge migration in 3D CT-NAND flash with and without band-gap engineered barriers
Padovani, Andrea; Pesic, Milan; Anik Kumar, Mondol; Blomme, Pieter; Subirats, Alexandre; Vadakupudhu Palayam, Senthil; Baten, Zunaid; Larcher, Luca; Van den Bosch, Geert (2019)