Browsing by author "Dupas, Luc"

Electrical assessment of gate oxide punchthrough in advanced polysilicon high density plasma etch.

Van den Bosch, Geert; Beckx, Stephan; Dupas, Luc; Vanhaelemeersch, Serge; Deferm, Ludo (1999)

Evaluation of TSV and micro-bump probing for wide I/O testing

Smith, Ken; Hanaway, Peter; Jolley, Mike; Gleason, Reed; Strid, Eric; Daenen, Tom; Dupas, Luc; Knuts, Bruno; Marinissen, Erik Jan; Van Dievel, Marc (2011-09)

Impact of processing parameters on leakage current and defect behavior of n+p silicon junction diodes

Gramenova, Emilia; Jansen, Philippe; Simoen, Eddy; Vanhellemont, Jan; Dupas, Luc; Deferm, Ludo (1997)

Impact of processing parameters on leakage current and defect behavior of n+p silicon junction diodes

Gramenova, Emilia; Jansen, Philippe; Simoen, Eddy; Vanhellemont, Jan; Dupas, Luc; Deferm, Ludo (1999)

New optimization strategy combining response surface model and Levenberg-Marquardt methods for various optimization purposes

Huizing, H. G. A.; Cartuyvels, Rudi; Dupas, Luc; Crans, W. (1995)

On the cost-effectiveness of KGD testing for TSV-based 3D-SICs

Marinissen, Erik Jan; Beyne, Eric; Dupas, Luc; Velenis, Dimitrios (2009-10)

Optimization of an industrial silicon solar cell processing sequence using design of experiments

De Clercq, Koen; Dupas, Luc; Szlufcik, Jozef; Frisson, Louis; Nijs, Johan; Mertens, Robert (1995)

Pushing today's technology to its limits with LMS OPTIMUS

Cartuyvels, Rudi; Dupas, Luc; Tzannetakis, N. (1996)

Supervia Process Integration and Reliability Compared to Stacked Vias Using Barrierless Ruthenium

Vega Gonzalez, Victor; Puliyalil, Harinarayanan; Versluijs, Janko; Lesniewska, Alicja; Varela Pedreira, Olalla; Baert, Rogier; Paolillo, Sara; Decoster, Stefan; Schleicher, Filip; Montero Alvarez, Daniel; Bekaert, Joost; Kesters, Els; Le, Quoc Toan; Lorant, Christophe; Teugels, Lieve; Heylen, Nancy; Jourdan, Nicolas; El-Mekki, Zaid; van der Veen, Marleen; Ciofi, Ivan; Briggs, Basoene; Heijlen, Jeroen; Dupas, Luc; De Wachter, Bart; Vancoille, Eric; Webers, Tomas; Vats, Hemant; Rynders, Luc; Cupak, Miroslav; Lee, Jae Uk; Drissi, Youssef; Halipre, Luc; Charley, Anne-Laure; Verdonck, Patrick; Witters, Thomas; Van Gompel, Sander; Kimura, Yosuke; Demonie, Ingrid; Lazzarino, Frederic; Ercken, Monique; Kim, Ryan Ryoung han; Trivkovic, Darko; Croes, Kristof; Leray, Philippe; Jaysankar, Manoj; Wilson, Chris; Murdoch, Gayle; Tokei, Zsolt (2020)

The application of manufacturing science techniques to a silicon solar cell process based on screen printing

De Clercq, Koen; Frisson, Louis; Szlufcik, Jozef; Dupas, Luc; Nijs, Johan; Mertens, Robert (1996)

Three-layer BEOL process integration with supervia and self-aligned-block options for the 3nm node

Vega Gonzalez, Victor; Wilson, Chris; Briggs, Basoene; Decoster, Stefan; Versluijs, Janko; Lesniewska, Alicja; Paolillo, Sara; Baert, Rogier; Puliyalil, Harinarayanan; Bekaert, Joost; Kesters, Els; Le, Quoc Toan; Lorant, Christophe; Varela Pedreira, Olalla; Teugels, Lieve; Heylen, Nancy; El-Mekki, Zaid; van der Veen, Marleen; Webers, Tomas; Vats, Hemant; Rynders, Luc; Cupak, Miroslav; Lee, Jae Uk; Drissi, Youssef; Halipre, Luc; Charley, Anne-Laure; Verdonck, Patrick; Witters, Thomas; Van Gompel, Sander; Kimura, Yosuke; Jourdan, Nicolas; Ciofi, Ivan; Gupta, Anshul; Contino, Antonino; Boccardi, Guillaume; Lariviere, Stephane; Dupas, Luc; De Wachter, Bart; Vancoille, Eric; Lazzarino, Frederic; Ercken, Monique; Debacker, Peter; Kim, Ryan Ryoung han; Trivkovic, Darko; Croes, Kristof; Leray, Philippe; Dillemans, Leander; Chen, Yi-Fan; Tokei, Zsolt (2019)