Browsing by author "Lin, Rong"
Now showing items 1-14 of 14
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Advanced carrier depth profiling on Si and Ge with M4PP
Clarysse, Trudo; Eyben, Pierre; Parmentier, Brigitte; Van Daele, Benny; Satta, Alessandra; Vandervorst, Wilfried; Lin, Rong; Petersen, Dirch; Folmer Nielsen, Peter (2007) -
Advanced carrier depth profiling on Si and Ge with micro four-point probe
Clarysse, Trudo; Eyben, Pierre; Parmentier, Brigitte; Van Daele, Benny; Satta, Alessandra; Vandervorst, Wilfried; Lin, Rong; Petersen, Dirch H.; Folmer Nielsen, Peter (2008) -
Electrical characterization of InGaAs ultra-shallow junctions
Petersen, Dirch H.; Hansen, Ole; Boggild, Peter; Lin, Rong; Nielsen, Peter F.; Lin, Dennis; Adelmann, Christoph; Alian, AliReza; Merckling, Clement; Penaud, Julien; Brammertz, Guy; Goossens, Jozefien; Vandervorst, Wilfried; Clarysse, Trudo (2009) -
Electrical characterization of InGaAs ultra-shallow junctions
Petersen, Dirch H.; Hansen, Ole; Bĝggild, Peter; Lin, Rong; Nielsen, Peter F.; Lin, Dennis; Adelmann, Christoph; Alian, AliReza; Merckling, Clement; Penaud, Julien; Brammertz, Guy; Goossens, Jozefien; Vandervorst, Wilfried; Clarysse, Trudo (2010) -
High precision micro-scale Hall effect characterization method using in-line micro four-point probes
Petersen, Dirch; Hansen, Olaf; Clarysse, Trudo; Goossens, Jozefien; Rosseel, Erik; Vandervorst, Wilfried; Lin, Rong; Nielsen, Peter (2008) -
High precision micro-scale Hall effect characterization method using in-line micro four-point probes
Petersen, Dirch; Hansen, Ole; Lin, Rong; Nielsen, P.F.; Clarysse, Trudo; Goossens, Jozefien; Rosseel, Erik; Vandervorst, Wilfried (2008) -
Impact of multiple sub-melt laser scans on the activation and diffusion of shallow Boron junctions
Rosseel, Erik; Vandervorst, Wilfried; Clarysse, Trudo; Goossens, Jozefien; Moussa, Alain; Lin, Rong; Petersen, Dirch; Nielsen, Peter; Hansen, Otto; Bennett, Nick; Cowern, Nick (2008) -
Micro probe carrier profiling of ultra-shallow structures in germanium
Clarysse, Trudo; Moussa, Alain; Parmentier, Brigitte; Eyben, Pierre; Douhard, Bastien; Vandervorst, Wilfried; Nielsen, Peter; Lin, Rong; Petersen, Dirch; Wang, Fei; Hansen, Ole (2010) -
On the analysis of the activation mechanisms of sub-melt laser anneals
Clarysse, Trudo; Bogdanowicz, Janusz; Goossens, Jozefien; Moussa, Alain; Rosseel, Erik; Vandervorst, Wilfried; Petersen, Dirch; Lin, Rong; Nielsen, P.F.; Hansen, Ole; Merklin, G.; Bennett, N.S.; Cowern, N.E.B. (2008) -
Photo-voltage versus micro-probe sheet resistance measurements on ultra-shallow structures
Clarysse, Trudo; Moussa, Alain; Parmentier, Brigitte; Bogdanowicz, Janusz; Cornagliotti, Emanuele; Vandervorst, Wilfried; Bender, Hugo; Pfeffer, Markus; Schellenberger, Martin; Nielsen, Peter; Thorsteinsson, Sune; Lin, Rong; Petersen, Dirch (2009) -
Photovoltage versus microprobe sheet resistance measurements on ultrashallow structures
Clarysse, Trudo; Moussa, Alain; Parmentier, Brigitte; Bogdanowicz, Janusz; Vandervorst, Wilfried; Bender, Hugo; Pfeffer, Markus; Schellenberger, Martin; Nielsen, Peter; Thorsteinsson, Sune; Lin, Rong; Petersen, Dirch (2010) -
Review of electrical characterization of ultra-shallow junctions with micro four-point probes
Petersen, Dirch H.; Hansen, Ole; Hansen, Torben M.; Boggild, Peter; Lin, Rong; Kjaer, Daniel; Nielsen, Peter F.; Clarysse, Trudo; Vandervorst, Wilfried; Rosseel, Erik; Bennett, Nick S.; Cowern, Nick E.B. (2009) -
Review of electrical characterization of ultra-shallow junctions with micro four-point probes
Petersen, Dirch; Hansen, Ole; Hansen, Torben; Boggild, Peter; Lin, Rong; Kjaer, Daniel; Nielsen, Peter F.; Clarysse, Trudo; Vandervorst, Wilfried; Rosseel, Erik; Bennett, Nick; Cowern, Nick (2010) -
Study of submelt laser induced junction nonuniformities using Therma-Probe
Rosseel, Erik; Bogdanowicz, Janusz; Clarysse, Trudo; Vandervorst, Wilfried; Ortolland, Claude; Hoffmann, Thomas Y.; Salnik, Alex; Nicolaides, Lena; Han, Sang-Hyun; Petersen, Dirch; Lin, Rong; Hansen, Ole (2010)