Browsing by author "Griffoni, Alessio"
Now showing items 1-20 of 46
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A statistical approach to microdose induced degradation in FinFET devices
Griffoni, Alessio; Gerardin, S.; Roussel, Philippe; Degraeve, Robin; Meneghesso, G.; Paccagnella, A.; Simoen, Eddy; Claeys, Cor (2009) -
Advanced ESD power clamp design for SOI FinFET CMOS technology
Thijs, Steven; Tremouilles, David; Linten, Dimitri; Mahadeva Iyer, Raju; Griffoni, Alessio; Groeseneken, Guido (2010) -
An insight into the effects induced by heavy-ion strikes in
Griffoni, Alessio; Thijs, Steven; Chen, Shih-Hung; Tazzoli, Augusto; Cordoni, Martina; Colombo, Paolo; Paccagnella, Alessandro; Linten, Dimitri; Groeseneken, Guido (2011) -
An insight into the parasitic capacitances of SOI and bulk FinFET devices
Griffoni, Alessio; Thijs, Steven; Linten, Dimitri; Scholz, Mirko; Groeseneken, Guido; Meneghesso, Gaudenzio (2009) -
Angular and strain dependence of heavy-ions induced degration in SOI FinFETs
Griffoni, Alessio; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Simoen, Eddy; Claeys, Cor (2010) -
Calibration of very fast TLP transients
Linten, Dimitri; Roussel, Philippe; Scholz, Mirko; Thijs, Steven; Griffoni, Alessio; Sawada, Masanori; Hasebe, Takumi; Groeseneken, Guido (2009-09) -
Calibration of very fast TLP transients
Linten, Dimitri; Roussel, Philippe; Scholz, Mirko; Thijs, Steven; Griffoni, Alessio; Sawada, M.; Hasebe, T.; Groeseneken, Guido (2009) -
CDM and HBM analysis of ESD protected 60 GHz power amplifier in 45 nm low-power digital CMOS
Thijs, Steven; Raczkowski, Kuba; Linten, Dimitri; Scholz, Mirko; Griffoni, Alessio; Groeseneken, Guido (2009) -
Challenges and solutions for ESD protection in advanced logic and RF CMOS technologies
Linten, Dimitri; Thijs, Steven; Raczkowski, Kuba; Griffoni, Alessio; Chen, Shih-Hung; Song, Ming-Hsiang; Nauwelaers, Bart; Groeseneken, Guido (2011) -
Characterization and optimization of sub-32nm FinFET devices for ESD applications
Thijs, Steven; Tremouilles, David; Russ, Christian; Griffoni, Alessio; Collaert, Nadine; Rooyackers, Rita; Linten, Dimitri; Scholz, Mirko; Duvvury, Charvaka; Gossner, Harald; Jurczak, Gosia; Groeseneken, Guido (2008) -
Charged device model (CDM) ESD challenges for laterally diffused nMOS (nLDMOS) silicon controlled rectifier (SCR) devices for high-voltage applications in standard low-voltage CMOS technology
Griffoni, Alessio; Chen, Shih-Hung; Thijs, Steven; Linten, Dimitri; Scholz, Mirko; Groeseneken, Guido (2010) -
Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays
Griffoni, Alessio; Silvestri, Marco; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Kaczer, Ben; de Potter de ten Broeck, Muriel; Verbeeck, Rita; Nackaerts, Axel (2008) -
Dose enhancement due to interconnects in deep-submicron MOSFETs exposed to X-rays
Griffoni, Alessio; Silvestri, Marco; Gerardin, Simone; Meneghesso, Gaudenzio; Paccagnella, Alessandro; Kaczer, Ben; de Potter de ten Broeck, Muriel; Verbeeck, Rita; Nackaerts, Axel (2009) -
Electrical and thermal scaling trends for SOI FinFET ESD design
Thijs, Steven; Tremouilles, David; Griffoni, Alessio; Russ, Christian; Linten, Dimitri; Scholz, Mirko; Collaert, Nadine; Rooyackers, Rita; Duvvury, Charvaka; Groeseneken, Guido (2009) -
Electrical-based ESD characterization methodology for ultrathin body SOI MOSFETs
Griffoni, Alessio; Thijs, Steven; Russ, Christian; Tremouilles, David; Linten, Dimitri; Scholz, Mirko; Simoen, Eddy; Claeys, Cor; Meneghesso, Gaudenzio; Groeseneken, Guido (2010) -
ESD-aspects of FinFETs and other most advanced devices
Russ, Christian; Gossner, Harald; Thijs, Steven; Griffoni, Alessio (2010) -
HBM ESD robustness of GaN-on-Si Schottky diodes
Chen, Shih-Hung; Griffoni, Alessio; Srivastava, Puneet; Linten, Dimitri; Thijs, Steven; Scholz, Mirko; Marcon, Denis; Gallerano, A.; Lafonteese, D.; Concannon, A.; Vashchenko, V.A.; Hopper, P.; Bychikhin, S.; Pogany, D.; Van Hove, Marleen; Decoutere, Stefaan; Groeseneken, Guido (2012) -
HBM ESD robustness of GaN-on-Si Schottky diodes
Chen, Shih-Hung; Griffoni, Alessio; Srivastava, Puneet; Linten, Dimitri; Thijs, Steven; Scholz, Mirko; Marcon, Denis; Gallerano, Antonio; Lafonteese, David; Concannon, Ann; Vashchenko, Vlad; Hopper, Peter; Bychikhin, Sergei; Pogany, Dionyz; Van Hove, Marleen; Decoutere, Stefaan; Groeseneken, Guido (2011) -
HBM ESD robustness of GaN-on-Si Schottky diodes for power applications
Chen, Shih-Hung; Griffoni, Alessio; Srivastava, Puneet; Linten, Dimitri; Thijs, Steven; Scholz, Mirko; Marcon, Denis; Vashchenko, Vladislav; Gallerano, Antonio; Lafonteese, David; Hopper, Peter; Van Hove, Marleen; Decoutere, Stefaan; Groeseneken, Guido (2011) -
HBM parameter extraction and transient safe operating area
Linten, Dimitri; Thijs, Steven; Griffoni, Alessio; Scholz, Mirko; Chen, Shih-Hung; Lafonteese, David; Vashchenko, Vladislav; Sawada, Masanori; Concannon, Ann; Hopper, Peter; Jansen, Philippe; Groeseneken, Guido (2010-10)