Browsing by author "Redzheb, Murad"
Now showing items 1-17 of 17
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Advanced ultralow-k organosilicate glasses: NEXAFS study
Konashuk, A.; Filatova, E.; Afanasiev, Valeri; Krishtab, Mikhail; Redzheb, Murad; Baklanov, Mikhaïl (2015) -
Area-selective deposition of low-k materials by means of the sol-gel method
Redzheb, Murad; Pasquali, Mattia; Armini, Silvia (2018) -
Characterization of advanced k1.9, 2.0 and 2.2 ultra-porous SiOC(H) films deposited by plasma-enhanced chemical vapor deposition
Redzheb, Murad; Armini, Silvia; Baklanov, Mikhaïl; Van der Voort, Pascalr (2014) -
Effect of the C-bridge length on the ultraviolet-resistance of oxycarbosilane low-k films
Redzheb, Murad; Prager, Lutz; Naumov, Sergej; Armini, Silvia; Voort, Pascal Van Der; Krishtab, Mikhail; Baklanov, Mikhaïl (2016) -
Gemini-templated PMO low-k films
Redzheb, Murad; Armini, Silvia; Okudur, Oguzhan Orkut; Vanstreels, Kris; Bernstorff, Sigrid; Voort, Pascal Van Der; Baklanov, Mikhaïl (2016) -
Impact of UV wavelength and curing time on the properties of spin-coated low-k films
Redzheb, Murad; Prager, Lutz; Krishtab, Mikhail; Armini, Silvia; Vanstreels, Kris; Franquet, Alexis; Van Der Voort, Pascal; Baklanov, Mikhaïl (2015) -
Influence of etch process sequence on damage formation in ultra low-k dielectrics
Redzheb, Murad; Souriau, Laurent; de Marneffe, Jean-Francois; Baklanov, Mikhaïl (2013) -
Laser anneal of oxycarbosilane low-k film
Redzheb, Murad; Armini, Silvia; Vanstreels, Kris; Meersschaut, Johan; Baklanov, Mikhail; Wang, Yun; Chen, Shaoyin; Le, Van; Awdshiew, Michael; Van der Voort, Pascal (2016) -
On the mechanical and electrical properties of self-assembly-based organosilicate porous films
Redzheb, Murad; Armini, Silvia; Berger, Tom; Jacobs, Mattias; Krishtab, Mikhail; Vanstreels, Kris; Bernstorff, Sigrid; Van Der Voort, Pascal (2017) -
Periodic mesoporous organosilica films with a tunable steady-state mesophase
Redzheb, Murad; Bernstorff, Sigrid; Sartori, Barbara; Van Der Voort, Pascal; Armini, Silvia (2017) -
Self-assembled monolayers assisted pore sealing of k 2.0 dielectrics
Armini, Silvia; Sun, Yiting; Loyo Prado, Jana; Baumans, Kim; De Cooman, Johan; Redzheb, Murad; Verdonck, Patrick; Swerts, Johan; Baklanov, Mikhaïl; Struyf, Herbert (2013) -
Stress induced densification of thin porous low-k films during nanoindentation
Okudur, Oguzhan Orkut; Redzheb, Murad; Vanstreels, Kris; Zahedmanesh, Houman; Gonzalez, Mario; De Wolf, Ingrid (2018) -
Template-dependent hydrophobicity in mesoporous organosilica films
Redzheb, Murad; Van der Voort, Pascal; Armini, Silvia (2018) -
Time-resolved GISAXS investigation of the self-assembly of spin-coated PMO films
Redzheb, Murad; Armini, Silvia; Bernstorff, Sigrid; Sartori, Barbara; Van der Voort, Pascal (2016) -
Tuning the properties of periodic mesoporous organosilica films for low-k application by Gemini surfactants
Redzheb, Murad; Okudur, Oguzhan Orkut; Bernstorff, Sigrid; Juraic, Krunoslav; Van der Voort, Pascal; Armini, Silvia (2018) -
UV cure of oxycarbosilane low-k films
Redzheb, Murad; Prager, Lutz; Krishtab, Mikhail; Armini, Silvia; Vanstreels, Kris; Franquet, Alexis; Van der Voort, Pascal; Baklanov, Mikhaïl (2016) -
Vacuum-ultraviolet-radiation damage of low-k dielectrics
Shohet, J. Leon; Kim, Sang-Heum; Nguyen, Ha; Xue, Panpan; Blatz, Joshua; Cheng, Haoyu; Lin, Yi-Hung; de Marneffe, Jean-Francois; Redzheb, Murad; Armini, Silvia; Chen, Cheng-chi; Wu, Yuting (2018)