Browsing by author "Shickova, Adelina"
Now showing items 1-16 of 16
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Achieving 9ps unloaded ring oscillator delay in FuSI/HfSiON with 0.8 nm EOT
Rothschild, Aude; Shi, Xiaoping; Everaert, Jean-Luc; Kerner, Christoph; Chiarella, Thomas; Hoffmann, Thomas; Vrancken, Christa; Shickova, Adelina; Yoshinao, H.; Mitsuhashi, Riichirou; Niwa, Masaaki; Lauwers, Anne; Veloso, Anabela; Kittl, Jorge; Absil, Philippe; Biesemans, Serge (2007) -
Addressing key concerns for implementation of Ni FUSI into manufacturing for 45/32 nm CMOS
Shickova, Adelina; Kauerauf, Thomas; Rothschild, Aude; Aoulaiche, Marc; Sahhaf, Sahar; Kaczer, Ben; Veloso, Anabela; Torregiani, Cristina; Pantisano, Luigi; Lauwers, Anne; Zahid, Mohammed; Rost, Tim; Tigelaar, H.; Pas, M.; Fretwell, J.; McCormack, J.; Hoffmann, Thomas; Kerner, Christoph; Chiarella, Thomas; Brus, Stephan; Harada, Yoshinao; Niwa, Masaaki; Kaushik, Vidya; Maes, Herman; Absil, Philippe; Groeseneken, Guido; Biesemans, Serge; Kittl, Jorge (2007) -
Comparison of interconnection network parameters for reconfigurable systems
Shickova, Adelina; Marescaux, Théodore; Verkest, Diederik; Catthoor, Francky; Vernalde, Serge; Lauwereins, Rudy (2003) -
Design style case study for computer nodes of a heterogeneous NoC platform
Lambrechts, Andy; Vander Aa, Tom; Jayapala, Murali; Leroy, Anthony; Talavera, Guillermo; Shickova, Adelina; Barat, Francisco; Mei, Bingfeng; Catthoor, Francky; Verkest, Diederik; Deconinck, Geert; Corporaal, Henk; Robert, Frederic; Carrabina Bordoll, Jordi (2004-12) -
Dielectric quality and reliability of FUSI/HfSiON devices with process induced strain
Shickova, Adelina; Kaczer, Ben; Simoen, Eddy; Verheyen, Peter; Eneman, Geert; Jurczak, Gosia; Absil, Philippe; Maes, Herman; Groeseneken, Guido (2007) -
NBTI reliability of Ni FUSI/HfSiON gates: effect of silicide phase
Shickova, Adelina; Kaczer, Ben; Veloso, Anabela; Aoulaiche, Marc; Houssa, Michel; Maes, Herman; Groeseneken, Guido; Kittl, Jorge (2007) -
Negligible effect of process-induced strain on intrinsic NBTI behavior
Shickova, Adelina; Kaczer, Ben; Verheyen, Peter; Eneman, Geert; San Andres Serrano, Enrique; Jurczak, Gosia; Absil, Philippe; Maes, Herman; Groeseneken, Guido (2007) -
Novel, effective and cost-efficient method of introducing fluorine into metal/Hf-based gate stack in MuGFET and planar SOI devices with significant BTI improvement
Shickova, Adelina; Collaert, Nadine; Zimmerman, Paul; Demand, Marc; Simoen, Eddy; Pourtois, Geoffrey; De Keersgieter, An; Trojman, Lionel; Ferain, Isabelle; Leys, Frederik; Boullart, Werner; Franquet, Alexis; Kaczer, Ben; Jurczak, Gosia; Maes, Herman; Groeseneken, Guido (2007) -
On the 1/f noise in pMOSFETs with embedded SiGe source/drain
Simoen, Eddy; Verheyen, Peter; Shickova, Adelina; Hikavyy, Andriy; Loo, Roger; Claeys, Cor; Machkaoutsan, Vladimir; Tomasini, P.; Thomas, S.G. (2007) -
On the low-frequency noise of pMOSFETs with embedded SiGe source/drain and fully silicided metal gate
Simoen, Eddy; Verheyen, Peter; Shickova, Adelina; Loo, Roger; Claeys, Cor (2007) -
Reliability issues in MuGFET nanodevices
Groeseneken, Guido; Crupi, Felice; Shickova, Adelina; Thijs, Steven; Linten, Dimitri; Kaczer, Ben; Collaert, Nadine; Jurczak, Gosia (2008) -
Reliability of strained-Si devices with post-oxide-deposition strain introduction
Shickova, Adelina; Verheyen, Peter; Eneman, Geert; Degraeve, Robin; Simoen, Eddy; Favia, Paola; Klenov, Dmitri; San Andres, Enrico; Kaczer, Ben; Jurczak, Gosia; Absil, Philippe; Maes, Herman; Groeseneken, Guido (2008) -
Spatial division multiplexing: a novel approach for guaranteed throughput on NoCs
Leroy, Anthony; Marchal, Pol; Shickova, Adelina; Catthoor, Francky; Verkest, Diederik; Robert, Frederic (2005) -
The role of nitrogen in HfSiON defect passivation
O'Connor, Robert; Aoulaiche, Marc; Pantisano, Luigi; Shickova, Adelina; Degraeve, Robin; Kaczer, Ben; Groeseneken, Guido (2009-04) -
Trapping in 1nm EOT high-k / MG
Zahid, Mohammed; Pantisano, Luigi; Degraeve, Robin; Aoulaiche, Marc; Trojman, Lionel; Ferain, Isabelle; san andres, e; Shickova, Adelina; O'Connor, Robert; Groeseneken, Guido; Heyns, Marc; De Gendt, Stefan (2008)