Browsing by author "Miranda Corbalan, Miguel"
Now showing items 21-40 of 64
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Holistic PathFinding: process to architecture - challenges for integrated fabless manufacturers
Corleto, Jose; Radojcic, Riko; Nowak, Matt; Dierickx, Bart; Miranda Corbalan, Miguel; Chua, Lew (2007) -
IMEC's emerging memory technology research roadmap
Badaroglu, Mustafa; Collaert, Nadine; Goux, Ludovic; Debucquoy, Maarten; Kam, Benjamin; Miranda Corbalan, Miguel (2010) -
Impact of EUV lithography line edge roughness on 16 nm memory generation
Vaglio Pret, Alessandro; Poliakov, Pavel; Bianchi, Davide; Gronheid, Roel; Blomme, Pieter; Miranda Corbalan, Miguel; Van Houdt, Jan; Dehaene, Wim (2011) -
Impact of Fin height variations on SRAM yield
Dobrovolny, Petr; Zuber, Paul; Miranda Corbalan, Miguel; Garcia Bardon, Marie; Chiarella, Thomas; Buchegger, Peter; Mercha, Abdelkarim; Verkest, Diederik; Steegen, An; Horiguchi, Naoto (2012-04) -
Impact of line edge roughness on cell-to-cell coupling variability in NAND flash arrays
Poliakov, Pavel; Blomme, Pieter; Miranda Corbalan, Miguel; Anchlia, Ankur; Dobrovolny, Petr; Brusamarello, Lucas; Stucchi, Michele; Van Houdt, Jan; Dehaene, Wim (2010-03) -
Impact of random soft oxide breakdown on SRAM energy/delay drift
Wang, Hua; Miranda Corbalan, Miguel; Catthoor, Francky; Dehaene, Wim (2007) -
Induced variability of cell-to-cell interference by line edge roughness in nand flash arrays
Poliakov, Pavel; Blomme, Pieter; Vaglio Pret, Alessandro; Miranda Corbalan, Miguel; Gronheid, Roel; Verkest, Diederik; Van Houdt, Jan; Dehaene, Wim (2012) -
Linking EUV lithography line edge roughness and 16 nm NAND memory performance
Vaglio Pret, Alessandro; Poliakov, Pavel; Gronheid, Roel; Blomme, Pieter; Miranda Corbalan, Miguel; Dehaene, Wim; Verkest, Diederik; Van Houdt, Jan; Bianchi, Davide (2012) -
Logic scaling assessment in 20nm and beyond under electrical and litho constraints
Badaroglu, Mustafa; Garcia Bardon, Marie; Dobrovolny, Petr; Zuber, Paul; Miranda Corbalan, Miguel (2012) -
Memory wide statistical analysis for robust SRAM design – Part I: what and why
Zuber, Paul; Dobrovolny, Petr; Miranda Corbalan, Miguel (2010) -
New tools and methods in robust SRAM design
Zuber, Paul; Miranda Corbalan, Miguel; Dobrovolny, Petr (2011) -
Postponing SoC death
AbdelHamid, Ahmed; Anchlia, Ankur; Dierickx, Bart; Miranda Corbalan, Miguel; Zuber, Paul (2008) -
Propagating variability from technology to system level
Dierickx, Bart; Miranda Corbalan, Miguel; Dobrovolny, Petr; Kutscherauer, Florian; Papanikolaou, Antonis; Marchal, Pol (2007) -
Reliability and variability aware system on a chip design strategy
Dierickx, Bart; Miranda Corbalan, Miguel (2008) -
Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
Papanikolaou, Antonis; Wang, Hua; Miranda Corbalan, Miguel; Catthoor, Francky (2007-07) -
Reliability issues in deep deep sub-micron technologies: time-dependent variability and its impact on embedded system design
Papanikolaou, Antonis; Wang, Hua; Miranda Corbalan, Miguel; Catthoor, Francky; Dehaene, Wim (2008) -
Roughness analysis for (EUV) optical lithography
Vaglio Pret, Alessandro; Poliakov, Pavel; Bianche, Davide; Gronheid, Roel; Blomme, Pieter; Miranda Corbalan, Miguel; Van Houdt, Jan; Dehaene, Wim (2010) -
Self-adaptive systems to drive out the nano-scale devil
Marchal, Pol; Munaga, Satya; Papanikolaou, Antonis; Dierickx, Bart; Miranda Corbalan, Miguel; Catthoor, Francky (2007) -
Self-healing circuits for sub-45nm technologies
AbdelHamid, Ahmed; Anchlia, Ankur; Miranda Corbalan, Miguel; Dierickx, Bart; Kuijk, Maarten (2010) -
Spacer-defined EUV lithography reducing variability of 12nm NAND Flash memories
Poliakov, Pavel; Blomme, Pieter; Vaglio Pret, Alessandro; Miranda Corbalan, Miguel; Gronheid, Roel; Wiaux, Vincent; Versluijs, Janko; Verkest, Diederik; Van Houdt, Jan; Dehaene, Wim (2012)